• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1998년도 추계종합학술대회 논문집
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• pp.597-600
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• 1998

When a semiconductor(pMOSFET) sensor is exposed to ionizing radiation, electrons/holes are generated in its oxide layer. By the phenomenon of hole traps in oxide layer during their move, the characteristics of semiconductor is changed. This paper describes the output characteristic changes of two kind of pMOSFET(domestic, japan) after C0-60 ${\gamma}$-irradiation on them for their application as radiation accumulated dose monitoring sensors. We found the threshold voltage shifts (VT) of pMOSFETs in proportion to irradiated radiation dose and their linear properties. These results make us confirm that we will be able to develop good accumulated radiation dose monitoring sensors.

• 센서학회지
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• 제26권2호
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• pp.79-84
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• 2017

The drain current of the SB MOSFET was analytically modeled by an equation composed of thermionic emission and tunneling with consideration of the image force lowering. The depletion region electron concentration was used to model the channel electron concentration for the tunneling current. The Schottky barrier width is dependent on the channel electron concentration. The drain current is changed by the gate oxide thickness and Schottky barrier height, but it is hardly changed by the doping concentration. For a GaN SB MOSFET with ITO source and drain electrodes, the calculated threshold voltage was 3.5 V which was similar to the measured value of 3.75 V and the calculated drain current was 1.2 times higher than the measured.

• Journal of Power Electronics
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• 제12권6호
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• pp.954-959
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• 2012

A hybrid switch that uses a microelectromechanical system (MEMS) switch as a gate driver of a MOSFET is applied to an energy harvesting system. The power management circuit adopting the hybrid switch provides ultralow leakage, self-referencing, and high current handling capability. Measurements show that solar energy harvester circuit utilizing the MEMS-MOSFET hybrid switch accumulates energy and charges a battery or drive a resistive load without any constant power supply and reference voltage. The leakage current during energy accumulation is less than 10 pA. The power management circuit adopting the proposed hybrid switch is believed to be an ideal solution to self-powered wireless sensor nodes in smart grid systems.

• 센서학회지
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• 제8권2호
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• pp.95-101
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• 1999

반도체 센서(p-MOSFET)가 이온화 방사선에 노출되면 산화층내에 전자-정공이 생성되고, 이들 중에서 이동도가 낮은 정공은 이동중 산화층내에 트랩(trap)되어 센서의 출력 특성을 변화시킨다. 본 논문에서는 p-MOSFET를 방사선 누적선량 모니터링 센서로 활용하기 위해 국산 및 일산의 상용 p-MOSFET를 Co-60 $\gamma$선원을 갖춘 고준위 조사시설에서 조사한 후 출력특성의 변화를 분석하였다. 방사선 조사실험 결과 p-MOSFET는 조사된 누적 방사선량에 비례하여 문턱전압(threshold voltage, $V_T$)이 변화됨과 이 변화에는 선형적 특성을 지님을 알 수 있었다. 본 논문의 결과를 통하여 저가의 상용 p-MOSFET를 이용한 우수한 성능의 방사선 누적선량 모니터링 센서를 개발할 수 있음을 확인하였다.

• 한국전자통신학회논문지
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• 제11권7호
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• pp.665-670
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• 2016

본 논문에서는 IoT(Internet of Things) 시스템의 기본 구성이 되는 센서 네트워크에 사용될 수 있는 MOSFET(Metal Oxide Semiconductor Field Effect Transistor)의 Sub-threshold 동작을 이용하는 OP-AMP(Operational amplifier) 설계를 제안한다. MOSFET의 Sub-threshold 동작은 전원전압을 낮추는 효과로 회로 시스템을 초저전력으로 유도할 수 있는 특징이 있기 때문에 배터리를 사용하는 IoT의 센서 네트워크 시스템의 초저전력화에 매우 유용한 회로설계 기술이라고 할 수 있다. $0.35{\mu}m$ 공정을 이용한 시뮬레이션 결과, VDD를 0.6 V로 설계할 수 있었으며, OP-AMP 의 Open-loop Gain은 43 dB, 또한 설계한 OP-AMP의 소비전력은 $1.3{\mu}W$가 계산되었다. 또한, Active Layout 면적은 $64{\mu}m{\times}105{\mu}m$이다. 제안한 OP-AMP는 IoT의 저전력 센서 네트워크에 다양한 응용이 가능할 것으로 기대된다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 B
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• pp.789-792
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• 2003

pMOSFET having 10 ${\mu}um$ thickness Gd layer has been tested to be used as a slow neutron sensor. The total thermal neutron cross section for the Gd is 47,000 barns and the cross section value drops rapidly with increasing neutron energy. When slow neutrons are incident to the Gd layer, the conversion electrons are emitted by the neutron absorption process. The conversion electrons generate electron-hole pairs in the $SiO_2$ layer of the pMOSFET. The holes are easily trapped in Oxide and act as positive charge centers in the $SiO_2$ layer. Due to the induced positive charges, the threshold turn-on voltage of the pMOSFET is changed. We have found that the voltage change is proportional to the accumulated slow neutron dose, therefore the pMOSFET having a Gd nuclear reaction layer can be used for a slow neutron dosimeter. The Gd-pMOSFET were tested at HANARO neutron beam port and $^{60}CO$ irradiation facility to investigate slow neutron response and gamma response respectively. Also the pMOSFET without Gd layer were tested at same conditions to compare the characteristics to the Gd-pMOSFET. From the result, we have concluded that the Gd-pMOSFET is very sensitive to the slow neutron and can be used as a slow neutron dosimeter. It can also be used in a mixed radiation field by subtracting the voltage change value of a pMOSFET without Gd from the value of the Gd-pMOSFET.

• 센서학회지
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• 제31권1호
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• pp.1-5
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• 2022

In this paper, the photocurrent characteristics of gate/body-tied (GBT) metal-oxide semiconductor field-effect transistor (MOSFET)-type photodetector with high sensitivity in the 408 nm - 941 nm range are presented. High sensitivity is important for photodetectors, which are used in several scientific and industrial applications. Owing to its inherent amplifying characteristics, the GBT MOSFET-type photodetector exhibits high sensitivity. The presented GBT MOSFET-type photodetector was designed and fabricated via a standard 0.18 ㎛ complementary metal-oxide-semiconductor (CMOS) process, and its characteristics were analyzed. The photodetector was analyzed with respect to its width to length (W/L) ratio, bias voltage, and incident-light wavelength. It was confirmed experimentally that the presented GBT MOSFET-type photodetector has over 100 times higher sensitivity than a PN-junction photodiode with the same area in the 408 nm - 941 nm range.

• 센서학회지
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• 제31권1호
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• pp.12-15
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• 2022

In this study, we studied the effects of transfer gate on the photocurrent characteristics of gate/body-tied (GBT) metal-oxide semiconductor field-effect transistor (MOSFET)-type photodetector. The GBT MOSFET-type photodetector has high sensitivity owing to the amplifying characteristic of the photocurrent generated by light. The transfer gate controls the flow of photocurrent by controlling the barrier to holes, thereby varying the sensitivity of the photodetector. The presented GBT MOSFET-type photodetector using a built-in transfer gate was designed and fabricated via a 0.18-㎛ standard complementary metal-oxide-semiconductor (CMOS) process. Using a laser diode, the photocurrent was measured according to the wavelength of the incident light by adjusting the voltage of the transfer gate. Variable sensitivity of the presented GBT MOSFET-type photodetector was experimentally confirmed by adjusting the transfer gate voltage in the range of 405 nm to 980 nm.

• 센서학회지
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• 제9권3호
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• pp.213-223
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• 2000

원자력 관련시설이나 우주 공간, 방사선 치료 센터 등에서 발생되는 방사선량은 정확히 검출되어야 할 필요성이 있다. 본 논문에서는 상용 P채널 Power MOSFET(metal oxide field effect transistor)를 방사선 누적선량 모니터링 센서로 활용하기 위해 실시간 방사선량 검출 측정 시스템을 설계 제작하였고, 시스템의 성능을 분석하기 위하여 Co-60 $\gamma$선원을 갖춘 고준위 조사시설에서 조사한 후 출력특성의 변화를 분석하였다. 방사선 조사실험 결과 P채널 Power MOSFET은 조사된 누적 방사선량에 비례하여 문턱전압($V_T$)이 변화됨과 곡선 변화의 선형적 특성을 지님을 알 수 있었다. 이 선형 함수관계를 이용하여 저가의 상용 P채널 Power MOSFET를 사용한 방사선 총 누적선량을 모니터링하기 위한 센서로 사용할 수 있음을 확인하였다.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제50권1호
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• pp.17-22
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• 2001

The floating-gate MOSFETs were fabricated by employing 1.5 m n-well CMOS process and their optical-electrical properties were characterized for the application to CMOS image sensor system. Based on the simulation of energy band diagram and operating mechanism of parasitic BJT were proposed as solutions for the increase of photo-current value. In order to realize them, MOSFETs having multi-gate and channel structures were fabricated and 60% increase in photo-current was achieved through enlargement of depletion layer and parallel connection of parasitic BJTs by channel division.