• 제목/요약/키워드: HEMTs

검색결과 95건 처리시간 0.03초

High-Frequency GaN HEMTs Based Point-of-Load Synchronous Buck Converter with Zero-Voltage Switching

  • Lee, Woongkul;Han, Di;Morris, Casey T.;Sarlioglu, Bulent
    • Journal of Power Electronics
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    • 제17권3호
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    • pp.601-609
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    • 2017
  • Gallium nitride (GaN) power switching devices are promising candidates for high switching frequency and high efficiency power conversion due to their fast switching, low on-state resistance, and high-temperature operation capability. In order to facilitate the use of these new devices better, it is required to investigate the device characteristics and performance in detail preferably by comparing with various conventional silicon (Si) devices. This paper presents a comprehensive study of GaN high electron mobility transistor (HEMT) based non-isolated point-of-load (POL) synchronous buck converter operating at 2.7 MHz with a high step-down ratio (24 V to 3.3 V). The characteristics and performance of GaN HEMT and three different Si devices are analytically investigated and the optimal operating point for GaN HEMT is discussed. Zero-voltage switching (ZVS) is implemented to minimize switching loss in high switching frequency operation. The prototype circuit and experimental data support the validity of analytical and simulation results.

이미지 센서 적용을 위한 In0.7Ga0.3As QW HEMT 소자의 extrinsic trans-conductance에 영향을 미치는 성분들의 포괄적 연구 (Comprehensive study of components affecting extrinsic transconductance in In0.7Ga0.3As quantum-well high-electron-mobility transistors for image sensor applications)

  • 윤승원;김대현
    • 센서학회지
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    • 제30권6호
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    • pp.441-445
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    • 2021
  • The components affecting the extrinsic transconductance (gm_ext) in In0.7Ga0.3As quantum-well (QW) high-electron-mobility transistors (HEMTs) on an InP substrate were investigated. First, comprehensive modeling, which only requires physical parameters, was used to explain both the intrinsic transconductance (gm_int) and the gm_ext of the devices. Two types of In0.7Ga0.3As QW HEMT were fabricated with gate lengths ranging from 10 ㎛ to sub-100 nm. These measured results were correlated with the modeling to describe the device behavior using analytical expressions. To study the effects of the components affecting gm_int, the proposed approach was extended to projection by changing the values of physical parameters, such as series resistances (RS and RD), apparent mobility (𝜇n_app), and saturation velocity (𝜈sat).

InAlAs/InGaAs/GaAs MHEMT 소자의 항복 특성에 관한 연구 (A Study on the Breakdown in MHEMTs with InAlAs/InGaAs Heterostructure Grown on the GaAs substrate)

  • 손명식
    • 대한전자공학회논문지SD
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    • 제48권11호
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    • pp.1-8
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    • 2011
  • 트랜지스터의 최대 출력 성능을 제한하는 요소 중 가장 중요한 하나가 항복 전압이다. GaAs 기판 위에 점진적으로 성장된 메타몰픽(Metamorphic) InAlAs/InGaAs HEMTs(MHEMT)는 InP 기판 위에 성정한 HEMT에 비해 비용 측면에서 특히 장점을 가지고 있다. 그러나 GaAs 나 InP 기반의 HEMT 소자들은 모두 우수한 마이크로파 및 밀리미터파 주파수 특성 및 이에 따른 저잡음 특성에 비해 낮은 항복전압으로 인해 파워 소자로서는 중간출력 정도의 소자로서만 사용 가능하다. 이러한 HEMT 소자의 항복 전압을 개선하기 위하여 본 논문에서는 InAlAs/$In_xGa_{1-x}As$/GaAs MHEMT 소자들의 항복 특성을 시뮬레이션하고 분석하였다. 2차원 소자 시뮬레이터의 hydrodynamic 전송 모델을 사용하여 $In_{0.52}Al_{0.48}As/In_{0.53}Ga_{0.47}As$ 이종접합 구조를 갖는 제작된 0.1-${\mu}m$ ${\Gamma}$-gate MHEMT 소자에 대하여 파라미터 보정 작업을 수행한 후 항복 특성에 영향을 주는 요소들을 분석하였다. 깊은 준위 트랩 효과를 고려한 충돌 이온화 및 게이트 전계를 분석하였고, 인듐(In) 몰 성분 변화에 따른 $In_xGa_{1-x}As$ 채널에서의 항복 특성 예측을 위한 충돌 이온화 계수를 경험적으로 제안 적용하였다.

35 ㎓ MMIC 2단 전력 증폭기 설계 (Design of MMIC 2 Stage Power amplifiers for 35 ㎓)

  • 이일형;채연식
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.637-640
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    • 1998
  • A 35 ㎓ GaAs MMIC power amplifier was designed using a monolithic technology with AlGaAs/InGaAs/GaAs power PM-HEMTs, rectangualr spiral inductors and Si3N4 MIM capacitors. The GaAs power MESFETs in the input and output stages have total gate widths of 120 um and 320 um, respectively. Total S21 gain of 10.82dB and S11 of -16.26 dB were obtained from the designed MMIC power amplifier at 35 ㎓. And the chip size of the MMIC amplifier was 1.4$\times$0.8 $\textrm{mm}^2$

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mm파 AlGaAs/InGaAs/GaAs Power PM-HEMT 제작 연구 (Fabrication of AlGaAs/InGaAs/GaAs Pseudomorphic HEMT's for mm waves.)

  • 이성대;허종곤이일형이진구
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.633-636
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    • 1998
  • In this study, power AlGaAs/InGaAs/GaAs PM-HEMT's for mm wave's were fabricated using Electron beam lithography and air-bridge techniques, and so on. DC and AC characteristics of the fabricated power PM-HEMTs were measured under the various bias conditions. For example, DC and RF characteristics such as S21 gain of 3.6 dB at 35 ㎓, current gain cut-off frequencies of 45 ㎓ and maximum oscillation frequencies of 100 ㎓ were carefully analyzed for design methodology of sub-mm wave power devices.

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X-band용 MMIC 전력증폭기의 설계 및 제작에 관한 연구 (Studies on the Design and Fabrication of MMIC Power Amplifier for X-band)

  • 이성대;이호준;이응호;윤용순;박현식;이진구
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1999년도 추계종합학술대회 논문집
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    • pp.159-162
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    • 1999
  • In this paper, we have designed and fabricated a MMIC power amplifier for X-band using AlGaAs/InGaAs/GaAs PM-HEMTs and passive devices such as Ti thin film resistors, rectangular spiral inductors and MIM capacitors. The fabricated MMIC power amplifier for X-band shows that S/ sub 21/ and S$_{11}$ are 14.804 ㏈ and -29.577 at 8.18 GHz, respectively. The chip size is 1.86$\times$1.29 $\textrm{mm}^2$.>.>.

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Design and Analysis of AlGaN/GaN MIS HEMTs with a Dual-metal-gate Structure

  • Jang, Young In;Lee, Sang Hyuk;Seo, Jae Hwa;Yoon, Young Jun;Kwon, Ra Hee;Cho, Min Su;Kim, Bo Gyeong;Yoo, Gwan Min;Lee, Jung-Hee;Kang, In Man
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제17권2호
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    • pp.223-229
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    • 2017
  • This paper analyzes the effect of a dual-metal-gate structure on the electrical characteristics of AlGaN/GaN metal-insulator-semiconductor high electron mobility transistors. These structures have two gate metals of different work function values (${\Phi}$), with the metal of higher ${\Phi}$ in the source-side gate, and the metal of lower ${\Phi}$ in the drain-side gate. As a result of the different ${\Phi}$ values of the gate metals in this structure, both the electric field and electron velocity in the channel become better distributed. For this reason, the transconductance, current collapse phenomenon, breakdown voltage, and radio frequency characteristics are improved. In this work, the devices were designed and analyzed using a 2D technology computer-aided design simulation tool.

MHEMT 소자의 DC/RF 특성에 대한 시뮬레이션 연구 (Simulation Study on the DC/RF Characteristics of MHEMTs)

  • 손명식
    • 한국진공학회지
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    • 제20권5호
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    • pp.345-355
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    • 2011
  • GaAs나 InP 기반의 high electron mobility transistor (HEMT) 소자들은 우수한 마이크로파 및 밀리미터파 주파수 특성 및 이에 따른 우수한 저잡음 특성을 가지고 있다. GaAs 기판 위에 점진적으로 성장된 메타몰픽(Metamorphic) HEMTs (MHEMTs)는 InP 기판 위에 성정한 HEMT에 비해 비용 측면에서 커다란 장점을 가지고 있다. 본 논문에서는 이러한 MHEMT의 DC/RF 소신호 특성을 예측하기 위하여 InAlAs/InGaAs/GaAs MHEMT 소자들의 DC/RF 소신호 주파수 특성을 시뮬레이션하였다. 2차원 소자 시뮬레이터의 hydrodynamic 전송 모델을 사용하여 $In_{0.52}Al_{0.48}As/In_{0.53}Ga_{0.47}As$ 이종접합 구조를 갖는 제작된 0.1-${\mu}m$ ${\Gamma}$-게이트 MHEMT 소자에 대하여 파라미터 보정 작업을 수행한 후, MHEMT 소자들에 대해 DC 특성 및 RF 소신호 주파수 특성을 시뮬레이션하고 실험 데이터와 비교 분석하였다. 또한, 게이트 리세스 구조에 따른 MHEMT 소자들의 DC/RF 특성을 시뮬레이션하고 비교 분석하였다.

Metamorphic HEMT를 이용한 우수한 성능의 94 GHz MMIC 저잡음 증폭기 (High-performance 94 GHz MMIC Low Noise Amplifier using Metamorphic HEMTs)

  • 김성찬;안단;이진구
    • 대한전자공학회논문지SD
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    • 제45권8호
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    • pp.48-53
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    • 2008
  • 본 논문에서는 100 nm InGaAs/InAlAs/GaAs metamorphic HEMT (high electron mobility transistor)를 이용하여 94 GHz 대역 응용에 적용 가능한 MMIC (millimeter-wave monolithic integrated circuit) 저잡음 증폭기를 구현하였다. 94 GHz MMIC 저잡음 증폭기 구현을 위하여 제작된 $100nm\times60{\mu}m$ MHEMT의 측정결과, 655 mA/mm의 드레인 전류 밀도, 720 mS/mm의 최대전달컨덕턴스를 얻었으며, RF 특성으로 전류이득차단주파수는 195 GHz, 최대공진주파수는 305 GHz의 양호한 성능을 나타내었다. 구축된 MHEMT와 CPW 라이브러리를 이용하여 구현된 MMIC 저잡음 증폭기의 측정결과, 94 GHz에서 $S_{21}$ 이득은 14.8 dB, 잡음지수는 4.6 dB의 우수한 특성을 얻었다. 전체 칩의 크기는 $1.8mm\times1.48mm$이다.

Progress in Novel Oxides for Gate Dielectrics and Surface Passivation of GaN/AlGaN Heterostructure Field Effect Transistors

  • Abernathy, C.R.;Gila, B.P.;Onstine, A.H.;Pearton, S.J.;Kim, Ji-Hyun;Luo, B.;Mehandru, R.;Ren, F.;Gillespie, J.K.;Fitch, R.C.;Seweel, J.;Dettmer, R.;Via, G.D.;Crespo, A.;Jenkins, T.J.;Irokawa, Y.
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제3권1호
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    • pp.13-20
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    • 2003
  • Both MgO and $Sc_2O_3$ are shown to provide low interface state densities (in the $10^{11}{\;}eV^{-1}{\;}cm{\;}^{-2}$ range)on n-and p-GaN, making them useful for gate dielectrics for metal-oxide semiconductor(MOS) devices and also as surface passivation layers to mitigate current collapse in GaN/AlGaN high electron mobility transistors(HEMTs).Clear evidence of inversion has been demonstrated in gate-controlled MOS p-GaN diodes using both types of oxide. Charge pumping measurements on diodes undergoing a high temperature implant activation anneal show a total surface state density of $~3{\;}{\times}{\;}10^{12}{\;}cm^{-2}$. On HEMT structures, both oxides provide effective passivation of surface states and these devices show improved output power. The MgO/GaN structures are also found to be quite radiation-resistant, making them attractive for satellite and terrestrial communication systems requiring a high tolerance to high energy(40MeV) protons.