• JSTS:Journal of Semiconductor Technology and Science
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• v.10 no.1
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• pp.1-10
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• 2010

This paper proposes a two-phase clocked adiabatic static CMOS logic (2PASCL) circuit that utilizes the principles of adiabatic switching and energy recovery. The low-power 2PASCL circuit uses two complementary split-level sinusoidal power supply clocks whose height is equal to $V_{dd}$. It can be directly derived from static CMOS circuits. By removing the diode from the charging path, higher output amplitude is achieved and the power consumption of the diode is eliminated. 2PASCL has switching activity that is lower than dynamic logic. We also design and simulate NOT, NAND, NOR, and XOR logic gates on the basis of the 2PASCL topology. From the simulation results, we find that 2PASCL 4-inverter chain logic can save up to 79% of dissipated energy as compared to that with a static CMOS logic at transition frequencies of 1 to 100 MHz. The results indicate that 2PASCL technology can be advantageously applied to low power digital devices operated at low frequencies, such as radio-frequency identifications (RFIDs), smart cards, and sensors.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.11
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• pp.140-148
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• 1993

High Integration ratio of CMOS circuits incredily increases the test cost during the design and fabrication processes because of the FET fault(Stuck-on faults and Stuck-off faults) which are due to the operational characteristics of CMOS circuits. This paper proposes a test generation algorithm for an arbitrarily large CMOS circuit, which can unify the test steps during the design and fabrication procedure and be applied to both static and dynaic circuits. This algorithm uses the logic equations set for the subroutines resulted from arbitrarily dividing the full circuit hierarchically or horizontally. Also it involves a driving procedure from output stage to input stage, in which to drive a test set corresponding to a subcircuit, only the subcircuits connected to that to be driven are used as the driving resource. With this algorithm the test cost for the large circuit such as VLSI can be reduced very much.

• Journal of IKEEE
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• v.2 no.1 s.2
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• pp.34-41
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• 1998

An integrated circuit for magnetic stripe storage system is implemented. All the analog and digital circuits are integrated in one chip. The analog block contains preamplifier, peak detecter, comparator and reference generater. And digital block includes reference window signal generater, up/down counter for F/2F signal measurement, bit-error detection logic, and control logic. Both the encoding and decoding functions for F/2F signal processing are provided. An AGC(automatic gain control) circuit which was included in conventional circuits is eliminated due to optimized circuit design. Misreading prevention circuits are also proposed by fixing up new reference bit when broken bits are detected. The prototype chip is implemented using $0.8{\mu}m$ N-well CMOS technology and operates from 3.3 V to 7.5 V of supply voltage. It occupies a die area of $3.04mm^2(1.6mm{\times}1.9mm)$ and dissipates 8 mW with a 5 V supply voltage.

• Journal of the Institute of Convergence Signal Processing
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• v.9 no.1
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• pp.54-61
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• 2008

This paper presents a new TIQ based CMOS flash 6-bit ADC to process digital signal in real time. In order to improve the conversion speed of ADC by designing new logic or layout of ADC circuits, a new design method is proposed in encoding logic circuits. The proposed encoding circuits convert analog input into digitally encoded double base number system(DBNS), which uses two bases unlike the normal binary representation scheme. The DBNS adopts binary and ternary radix to enhance digital arithmetic processing capability. In the DBNS, the addition and multiplication can be processed with just shift operations only. Finding near canonical representation is the most important work in general DBNS. But the main disadvantage of DBNS representation in ADC is the fan-in problem. Thus, an equal distribution algorithm is developed to solve the fan-in problem after assignment the prime numbers first. The conversion speed of simulation result was 1.6 GSPS, at 1.8V power with the Magna $0.18{\mu}m$ CMOS process, and the maximum power consumption was 38.71mW.

• Journal of the Institute of Convergence Signal Processing
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• v.12 no.2
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• pp.139-144
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• 2011

The modern digital logic technology does not yet satisfy the speed requirements of real-time DSP circuits due to synchronized operation of multiplication and accumulation. This operation degrades DSP performance. Therefore, the double-base number system (DBNS) has emerged in DSP system as an alternative methodology because of fast multiplication and hardware simplicity. In this paper, authors propose a novel multiplication architecture. One operand is an output of a flash analog-to-digital converter (ADC) in DBNS format, while the other operand is a coefficient in the IEEE standard floating-point number format. The DBNS digital output from ADC is produced through a new double base number encoder (DBNE). The multiplied output is in the format of the IEEE standard floating-point number (FPNS). The proposed circuits process multiplication and conversion together. Compared to a typical multiplier that uses the FPNS, the proposed multiplier also consumes 45% less gates, and 44% faster than the FPNS multiplier on Spartan-3 FPGA board. The design is verified with FIR filter applications.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.32B no.5
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• pp.661-670
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• 1995

This paper presents a fast massively parallel automatic test pattern generator for digital combinational logic circuits using neural networks. Automatic test pattern generation neural network(ATPGNN) evolves its state to a stable local minima by exchanging messages among neural network modules. In preprocessing phase, we calculate the essential assignments for the stuck-at faults in fault list by adopting dominator concept. It makes more neurons be fixed and the system speed up. Consequently. fast test pattern generation is achieved. Test patterns for stuck-open faults are generated through getting initialization patterns for the obtained stuck-at faults in the corresponding ATPGNN.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.1
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• pp.91-105
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• 2016

Carbon Nanotube Field-Effect Transistors (CNTFETs) have been studied as candidates for post Si CMOS owing to the better electrostatic control and high mobility. To enhance the immunity against short - channel effects (SCEs), the novel channel and gate engineered architectures have been proposed to improve CNTFETs performance. This work presents a comprehensive study of the influence of channel and gate engineering on the CNTFET switching, high frequency and circuit level performance of carbon nanotube field-effect transistors (CNTFETs). At device level, the effects of channel and gate engineering on the switching and high frequency characteristics for CNTFET have been theoretically investigated by using a quantum kinetic model. This model is based on two-dimensional non-equilibrium Green's functions (NEGF) solved self - consistently with Poisson's equations. It is revealed that hetero - material - gate and lightly doped drain and source CNTFET (HMG - LDDS - CNTFET) structure can significantly reduce leakage current, enhance control ability of the gate on channel, improve the switching speed, and is more suitable for use in low power, high frequency circuits. At circuit level, using the HSPICE with look - up table(LUT) based Verilog - A models, the impact of the channel and gate engineering on basic digital circuits (inverter, static random access memory cell) have been investigated systematically. The performance parameters of circuits have been calculated and the optimum metal gate workfunction combinations of ${\Phi}_{M1}/{\Phi}_{M2}$ have been concluded in terms of power consumption, average delay, stability, energy consumption and power - delay product (PDP). In addition, we discuss and compare the CNTFET-based circuit designs of various logic gates, including ternary and binary logic. Simulation results indicate that LDDS - HMG - CNTFET circuits with ternary logic gate design have significantly better performance in comparison with other structures.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.24 no.1
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• pp.28-34
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• 2010

The pulse width modulation(PWM) method has been generally used as conventional method controlling luminance of LED(light emitting diode). PWM method as analog method with a relation that duty ratio of LED be proportional to luminance has weak point that it is not compatible with digital method of communication etc. In this paper, a experiment is conducted which the luminance of RGB LED be controlled by digital method. For this, the LED digital control system is developed which consist of LED driving circuits and digital logic circuits. By controlling the number of pluses on RGB LED versus digital input, various lighting colors is implemented and digital codes are optimized in order that measured x, y chromaticity coordinates of lighting colors are comprised in the CIE chromaticity coordinates area of targeted lighting colors. The result of this study can be utilized usefully in research on implementing full color by using remote control of LED lamp with digital communication.

• Journal of Korea Society of Industrial Information Systems
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• v.18 no.5
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• pp.59-65
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• 2013

Conventional synchronous design circuits cannot only satisfy the timing requirement of the low voltage digital systems, but also they may generate wrong outputs under the influence of PVT variations and aging effects. Therefore, in this paper, a NCL (Null Convention Logic) design as an asynchronous design method has been proposed, where the NCL method doesn't require any timing analysis, and it has a very simple design methodology. Base on the NCL method, a new low power reliable ALU has been designed and implemented using MagnaChip-SKhynix 0.18um CMOS technology. The experimental results of the proposed NCL ALU have been compared to those of a conventional pipelined ALU in terms of power consumption and speed.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.11
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• pp.57-65
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• 2014

This paper presents a framework that is based on a reconfigurable macro-model of current-mode logic (CML) high-speed digital circuits enabling equation-based design optimization. The proposed macro-model is compatible with geometric programming, thereby enabling constraint-driven top-level power optimization. The proposed optimization framework is applied to a design of CML based serial-link transmitter with user-defined design specifications as an example of high speed digital circuits using 45nm and 90nm CMOS technology. The proposed optimization framework can derive a design with optimal power efficiency for given transistor technology nodes.