• Title/Summary/Keyword: CMOS transistor

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CMOS neuron activation function (CMOS 뉴런의 활성화 함수)

  • Kang, Min-Jae;Kim, Ho-Chan;Song, Wang-Cheol;Lee, Sang-Joon
    • Journal of the Korean Institute of Intelligent Systems
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    • v.16 no.5
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    • pp.627-634
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    • 2006
  • We have proposed the methods how to control the slope of CMOS inverter's characteristic and how to shift it in y axis. We control the MOS transistor threshold voltage for these methods. By observing that two transistors are in saturation region at the center of the CMOS inverter's characteristic, we have presented how to make the characteristic for one pole neuron. The circuit level simulation is used for verifying the proposed method. PSpice(OrCAD Co.) is used for circuit level simulation.

CMOS Binary Image Sensor Using Double-Tail Comparator with High-Speed and Low-Power Consumption

  • Kwen, Hyeunwoo;Jang, Junyoung;Choi, Pyung;Shin, Jang-Kyoo
    • Journal of Sensor Science and Technology
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    • v.30 no.2
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    • pp.82-87
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    • 2021
  • In this paper, we propose a high-speed, low-power complementary metal-oxide semiconductor (CMOS) binary image sensor featuring a gate/body-tied (GBT) p-channel metal-oxide-semiconductor field-effect transistor (PMOSFET)-type photodetector based on a double-tail comparator. The GBT photodetector forms a structure in which the floating gate (n+ polysilicon) and body of the PMOSFET are tied, and amplifies the photocurrent generated by incident light. The double-tail comparator compares the output signal of a pixel against a reference voltage and returns a binary signal, and it exhibits improved power consumption and processing speed compared with those of a conventional two-stage comparator. The proposed sensor has the advantages of a high signal processing speed and low power consumption. The proposed CMOS binary image sensor was designed and fabricated using a standard 0.18 ㎛ CMOS process.

A High-Voltage Compliant Neural Stimulation IC for Implant Devices Using Standard CMOS Process (체내 이식 기기용 표준 CMOS 고전압 신경 자극 집적 회로)

  • Abdi, Alfian;Cha, Hyouk-Kyu
    • Journal of the Institute of Electronics and Information Engineers
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    • v.52 no.5
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    • pp.58-65
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    • 2015
  • This paper presents the design of an implantable stimulation IC intended for neural prosthetic devices using $0.18-{\mu}m$ standard CMOS technology. The proposed single-channel biphasic current stimulator prototype is designed to deliver up to 1 mA of current to the tissue-equivalent $10-k{\Omega}$ load using 12.8-V supply voltage. To utilize only low-voltage standard CMOS transistors in the design, transistor stacking with dynamic gate biasing technique is used for reliable operation at high-voltage. In addition, active charge balancing circuit is used to maintain zero net charge at the stimulation site over the complete stimulation cycle. The area of the total stimulator IC consisting of DAC, current stimulation output driver, level-shifters, digital logic, and active charge balancer is $0.13mm^2$ and is suitable to be applied for multi-channel neural prosthetic devices.

Degradation of the SiGe hetero-junction bipolar transistor in SiGe BiCMOS process (실리콘-게르마늄 바이시모스 공정에서의 실리콘-게르마늄 이종접합 바이폴라 트랜지스터 열화 현상)

  • Kim Sang-Hoon;Lee Seung-Yun;Park Chan-Woo;Kang Jin-Young
    • Journal of the Korean Vacuum Society
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    • v.14 no.1
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    • pp.29-34
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    • 2005
  • The degradation of the SiGe hetero-junction bipolar transistor(HBT) properties in SiGe BiCMOS process was investigated in this paper. The SiGe HBT prepaired by SiGe BiCMOS process, unlike the conventional one, showed the degraded DC characteristics such as the decreased Early voltage, the decreased collector-emitter breakdown voltage, and the highly increased base leakage current. Also, the cutoff frequency(f/sub T/) and the maximum oscillation frequency(f/sub max/) representing the AC characteristics are reduced to below 50%. These deteriorations are originated from the change of the locations of emitter-base and collector-base junctions, which is induced by the variation of the doping profile of boron in the SiGe base due to the high-temperature source-drain annealing. In the result, the junctions pushed out of SiGe region caused the parastic barrier formation and the current gain decrease on the SiGe HBT device.

Design of a High Performance 32$\times$32-bit Multiplier Based on Novel Compound Mode Logic and Sign Select Booth Encoder (새로운 복합모드로직과 사인선택 Booth 인코더를 이용한 고성능 32$\times$32-bit 곱셈기의 설계)

  • Kim, Jin-Hwa;Song, Min-Gyu
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.3
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    • pp.205-210
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    • 2001
  • In this paper, a novel compound mode logic based on the advantage of both CMOS logic and pass-transistor logic(PTL) is proposed. From the experimental results, the power-delay products of the compound mode logic is about 22% lower than that of the conventional CMOS logic, when we design a full adder. With the proposed logic, a high performance 32$\times$32-bit multiplier has been fabricated with 0.6um CMOS technology. It is composed of an improved sign select Booth encoder, an efficient data compressor based on the compound mode logic, and a 64-bit conditional sum adder with separated carry generation block. The Proposed 32$\times$32-bit multiplier is composed of 28,732 transistors with an active area of 1.59$\times$1.68 mm2 except for the testing circuits. From the measured results, the multiplication time of the 32$\times$32-bit multiplier is 9.8㎱ at a 3.3V power supply, and it consumes about 186㎽ at 100MHz.

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Design of A CMOS Composite Cell Analog Multiplier (CMOS 상보형 구조를 이용한 아날로그 멀티플라이어 설계)

  • Lee, Geun-Ho;Choe, Hyeon-Seung;Kim, Dong-Yong
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.37 no.2
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    • pp.43-49
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    • 2000
  • In this paper, the CMOS four-quadrant analog multipliers for low-voltage low-power applications ate presented. The circuit approach is based on the characteristic of the LV(Low-Voltage) composite transistor which is one of the useful analog building blocks. SPICE simulations are carried out to examine the performances of the designed multipliers. Simulation results are obtained by 0.6${\mu}{\textrm}{m}$ CMOS parameters with 2V power supply. The LV composite transistor can easily be extended to perform a four-quadrant multiplication. The multiplier has a linear input range up to $\pm$0.5V with a linearity error of less than 1%. The measured -3㏈ bandwidth is 290MHz and the power dissipation is 373㎼. The proposed multiplier is expected to be suitable for analog signal processing applications such as portable communication equipment, radio receivers, and hand-held movie cameras.

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A 2.4-GHz CMOS Power Amplifier with a Bypass Structure Using Cascode Driver Stage to Improve Efficiency (효율 개선을 위해 캐스코드 구동 증폭단을 활용한 바이패스 구조의 2.4-GHz CMOS 전력 증폭기)

  • Jang, Joseph;Yoo, Jinho;Lee, Milim;Park, Changkun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.23 no.8
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    • pp.966-974
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    • 2019
  • In this study, we propose a CMOS power amplifier (PA) using a bypass technique to enhance the efficiency in the low-power region. For the bypass structure, the common-gate (CG) transistor of the cascode structure of the driver stage is divided in two parallel branches. One of the CG transistors is designed to drive the power stage for high-power mode. The other CG transistor is designed to bypass the power stage for low-power mode. Owing to a turning-off of the power stage, the power consumption is decreased in low-power mode. The measured maximum output power is 20.35 dBm with a power added efficiency of 12.10%. At a measured output power of 11.52 dBm, the PAE is improved from 1.90% to 7.00% by bypassing the power stage. Based on the measurement results, we verified the functionality of the proposed bypass structure.

Comparator design using high speed Bipolar device (고속 Bipolar 소자를 이용한 comparator 설계)

  • Park Jin-Woo;Cho Jung-Ho;Gu Young Sea;An Chel
    • Proceedings of the IEEK Conference
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    • 2004.06b
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    • pp.351-354
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    • 2004
  • This thesis presents Bipolar transistor with SAVEN(Self-Aligned VErtical Nitride) structure as a high-speed device which is essential for high-speed system such as optical storage system or mobile communication system, and proposes 0.8${\mu}m$ BiCMOS Process which integrates LDD nMOS, LDD pMOS and SAVEN bipolar transistor into one-chip. The SPICE parameters of LDD nMOS, LDD pMOS and SAVEN Bipolar transistor are extracted, and comparator operating at 500MHz sampling frequency is designed with them. The small Parasitic capacitances of SAVEN bipolar transistor have a direct effect on decreasing recovery time and regeneration time, which is helpful to improve the speed of the comparator. Therefore the SAVEN bipolar transistor with high cutoff frequency is expected to be used in high-speed system.

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Analysis of the Gate Bias Effects of the Cascode Structure for Class-E CMOS Power Amplifier (CMOS Class-E 전력증폭기의 Cascode 구조에 대한 게이트바이어스 효과 분석)

  • Seo, Donghwan
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.28 no.6
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    • pp.435-443
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    • 2017
  • In this study, we analyzed the effects of the common-gate transistor bias of a switching mode CMOS power amplifier. Although the most earier works occured on the transistor sizes of the cascode structure, we showed that the gate bias of the common-gate transistor also influences the overall efficiency of the power amplifier. To investigate the effect of the gate bias, we analyzed the DC power consumption according to the gate bias and hence the efficiency of the power amplifier. From the analyzed results, the optimized gate bias for the maximum efficiency is lower than the supply voltage of the power amplifier. We also found that an excessively low gate bias may degrade the output power and efficiency owing to the effects of the on-resistance of the cascode structure. To verify the analyzed results, we designed a 1.9 GHz switching mode power amplifier using $0.18{\mu}m$ RF CMOS technology. As predicted in the analysis, the maximum efficiency is obtained at 2.5 V, while the supply voltage of power amplifier is 3.3 V. The measured maximum efficiency is 31.5 % with an output power of 29.1 dBm. From the measureed results, we successfully verified the analysis.

Wide Dynamic Range CMOS Image Sensor with Adjustable Sensitivity Using Cascode MOSFET and Inverter

  • Seong, Donghyun;Choi, Byoung-Soo;Kim, Sang-Hwan;Lee, Jimin;Shin, Jang-Kyoo
    • Journal of Sensor Science and Technology
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    • v.27 no.3
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    • pp.160-164
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    • 2018
  • In this paper, a wide dynamic range complementary metal-oxide-semiconductor (CMOS) image sensor with the adjustable sensitivity by using cascode metal-oxide-semiconductor field-effect transistor (MOSFET) and inverter is proposed. The characteristics of the CMOS image sensor were analyzed through experimental results. The proposed active pixel sensor consists of eight transistors operated under various light intensity conditions. The cascode MOSFET is operated as the constant current source. The current generated from the cascode MOSFET varies with the light intensity. The proposed CMOS image sensor has wide dynamic range under the high illumination owing to logarithmic response to the light intensity. In the proposed active pixel sensor, a CMOS inverter is added. The role of the CMOS inverter is to determine either the conventional mode or the wide dynamic range mode. The cascode MOSFET let the current flow the current if the CMOS inverter is turned on. The number of pixels is $140(H){\times}180(V)$ and the CMOS image sensor architecture is composed of a pixel array, multiplexer (MUX), shift registers, and biasing circuits. The sensor was fabricated using $0.35{\mu}m$ 2-poly 4-metal CMOS standard process.