• Title/Summary/Keyword: Analog to Digital Converter (ADC)

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2.5V $0.25{\mu}m$ CMOS Temperature Sensor with 4-Bit SA ADC

  • Kim, Moon-Gyu;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.10a
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    • pp.448-451
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    • 2011
  • SoC에서 칩 내부의 온도를 측정하기 위한 proportional-to-absolute-temperature (PTAT) 회로와 sensing 된 아날로그 신호를 디지털로 변환하기 위해 4-bit analog-to-digital converter (ADC)로 구성된 temperature sensor를 제안한다. CMOS 공정에서 vertical PNP 구조를 이용하여 PTAT 회로가 설계되었다. 온도변화에 둔감한 ADC를 구현하기 위해 아날로그 회로를 최소로 사용하는 successive approximation (SA) ADC가 이용되었다. 4-bit SA ADC는 capacitor DAC와 time-domain 비교기를 이용함으로 전력소모를 최소화하였다. 제안된 temperature sensor는 2.5V $0.25{\mu}m$ 1-poly 9-metal CMOS 공정을 이용하여 설계되었고, $50{\sim}150^{\circ}C$ 온도 범위에서 동작한다. Temperature sensor의 면적과 전력 소모는 각각 $130{\times}390\;um^2$과 868 uW이다.

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An 8-b 1GS/s Fractional Folding CMOS Analog-to-Digital Converter with an Arithmetic Digital Encoding Technique

  • Lee, Seongjoo;Lee, Jangwoo;Lee, Mun-Kyo;Nah, Sun-Phil;Song, Minkyu
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.5
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    • pp.473-481
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    • 2013
  • A fractional folding analog-to-digital converter (ADC) with a novel arithmetic digital encoding technique is discussed. In order to reduce the asymmetry errors of the boundary conditions for the conventional folding ADC, a structure using an odd number of folding blocks and fractional folding rate is proposed. To implement the fractional technique, a new arithmetic digital encoding technique composed of a memory and an adder is described. Further, the coding errors generated by device mismatching and other external factors are minimized, since an iterating offset self-calibration technique is adopted with a digital error correction logic. A prototype 8-bit 1GS/s ADC has been fabricated using an 1.2V 0.13 um 1-poly 6-metal CMOS process. The effective chip area is $2.1mm^2$(ADC core : $1.4mm^2$, calibration engine : $0.7mm^2$), and the power consumption is 88 mW. The measured SNDR is 46.22 dB at the conversion rate of 1 GS/s. Both values of INL and DNL are within 1 LSB.

FPGA implementation of A/D converter using stochastic logic (FPGA를 이용한 확률논리회로 A/D 컨버터의 구현)

  • 이정원;심덕선
    • Proceedings of the IEEK Conference
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    • 1998.06a
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    • pp.847-850
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    • 1998
  • One of the most difficult problem of designing VLSI is a mixed-circuit design, that is to design circuit containing both analog parts and digital parts. Digital to analog converter and analog to digital converter is a typical case. Especially it can be a serious problem when mixed circuit are put into a large digital circuit like microcontroller. However nowadays this problem is settled by separating analog circuit parts outside the IC. This technique is based on converting a digital signal into a pulse sequence. Then an analog signal is obtained by averaging this pulse sequence at the external low-pass filter. An anlog to digital converter is designed using a stochastic logic instead of a traditional PWM (pulse-width modulation) signal and ins implemente dusing FPGa. Stochastic pulse sequence can be made as a simple circuits and moreover can be mathematically processed by simple circuits -AND gates. The spectral property of stochastic pulse sequence method is better than that of PWM method. So it make easy to design a external low-pass filter. This technique has important advantages, especially the reduction of the ADC cost.

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Noise Automatic Gain Control to Stabilize Radar Performance (레이다 성능 안정화를 위한 잡음 AGC)

  • Kim, Kwan-Sung
    • Journal of the Korea Institute of Military Science and Technology
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    • v.10 no.4
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    • pp.132-137
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    • 2007
  • The dynamic range of the radar which uses digital signal processors is limited by ADC(Analog-to-Digital Converter). That parameter and ADC loss depend on the noise level of radar receiver. In order to stabilize the performance of radar systems, it is necessary to maintain the noise level constantly. This paper presents the noise AGC(Automatic Gain Control) concept that can keep the noise level constantly and proves that the concept is acceptable through the hardware test and evaluation.

A Low Power Current-Mode 12-bit ADC using 4-bit ADC in cascade structure (4비트 ADC 반복구조를 이용한 저전력 전류모드 12비트 ADC)

  • Park, So-Youn;Kim, Hyung-Min;Lee, Daniel-Juhun;Kim, Seong-Kweon
    • The Journal of the Korea institute of electronic communication sciences
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    • v.14 no.6
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    • pp.1145-1152
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    • 2019
  • In this paper, a low power current mode 12-bit ADC(: Analog to Digital Converter) is proposed to mix digital circuits and analog circuits with the advantages of low power consumption and high speed operation. The proposed 12 bit ADC is implemented by using 4-bit ADC in a cascade structure, so its power consumption can be reduced, and the chip area can be reduced by using a conversion current mirror circuit. The proposed 12-bit ADC is SK Hynix 350nm process, and post-layout simulation is performed using Cadence MMSIM. It operates at a supply voltage of 3.3V and the area of the proposed circuit is 318㎛ x 514㎛. In addition, the ADC shows the possibility of operating with low power consumption of 3.4mW average power consumption in this paper.

A Threshold-voltage Sensing Circuit using Single-ended SAR ADC for AMOLED Pixel (단일 입력 SAR ADC를 이용한 AMOLED 픽셀 문턱 전압 감지 회로)

  • Son, Jisu;Jang, Young-Chan
    • Journal of IKEEE
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    • v.24 no.3
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    • pp.719-726
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    • 2020
  • A threshold-voltage sensing circuit is proposed to compensate for pixel aging in active matrix organic light-emitting diodes. The proposed threshold-voltage sensing circuit consists of sample-hold (S/H) circuits and a single-ended successive approximation register (SAR) analog-to-digital converter (ADC) with a resolution of 10 bits. To remove a scale down converter of each S/H circuit and a voltage gain amplifier with a signl-to-differentail converter, the middle reference voltage calibration and input range calibration for the single-ended SAR ADC are performed in the capacitor digital-to-analog converter and reference driver. The proposed threshold-voltage sensing circuit is designed by using a 180-nm CMOS process with a supply voltage of 1.8 V. The ENOB and power consimption of the single-ended SAR ADC are 9.425 bit and 2.83 mW, respectively.

Low-Power CMOS image sensor with multi-column-parallel SAR ADC

  • Hyun, Jang-Su;Kim, Hyeon-June
    • Journal of Sensor Science and Technology
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    • v.30 no.4
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    • pp.223-228
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    • 2021
  • This work presents a low-power CMOS image sensor (CIS) with a multi-column-parallel (MCP) readout structure while focusing on improving its performance compared to previous works. A delta readout scheme that utilizes the image characteristics is optimized for the MCP readout structure. By simply alternating the MCP readout direction for each row selection, additional memory for the row-to-row delta readout is not required, resulting in a reduced area of occupation compared to the previous work. In addition, the bias current of a pre-amplifier in a successive approximate register (SAR) analog-to-digital converter (ADC) changes according to the operating period to improve the power efficiency. The prototype CIS chip was fabricated using a 0.18-㎛ CMOS process. A 160 × 120 pixel array with 4.4 ㎛ pitch was implemented with a 10-bit SAR ADC. The prototype CIS demonstrated a frame rate of 120 fps with a total power consumption of 1.92 mW.

Design of a Charge-Redistribution ADC Using Bit Extension (비트 확장을 이용한 전하재분배 방식 ADC의 설계)

  • Kim, Kyu-Chull;Doh, Hyung-Wook
    • Journal of IKEEE
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    • v.9 no.1 s.16
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    • pp.65-71
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    • 2005
  • Physical signals generated in the real world are transformed into electrical signals through sensors and fed into electronic circuits. The electrical signals input to electronic circuits are in analog form, thus they must be converted to digital signals using an ADC(Analog-Digital Converter) for digital processing. Signal processing circuits and ADCs that are to be integrated on a single chip together with silicon micro sensors should be designed to have less silicon area and less power consumption. This paper proposed a charge redistribution ADC which reduces silicon area considerably. The proposed method achieves 8 bit conversion by performing 4-bit conversion twice. It reduced the area of capacitor array, which takes most of the ADC area, by 1/16 when compared to a conventional method. Though it uses twice the number of clocks as a conventional method, it would be appropriate to be integrated with a silicon pressure sensor on a single chip since it does not demand high conversion rate.

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A 10-bit 40-Msample/s Folding & Interpolating A/D Converter with two-step Architecture (투스텝 구조를 가진 10비트 40Msample/s 폴딩&인터폴레이팅 아날로그-디지털 변환기)

  • 김수환;성준제;김태형;김석기;임신일
    • Proceedings of the IEEK Conference
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    • 1999.11a
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    • pp.255-258
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    • 1999
  • This paper describes a 40-Msample/s 10-bit CMOS folding and interpolating analog-to-digital converter (ADC). A new 2-step architecture is proposed. The proposed architecture is composed of a coarse ADC bloch for the 6bits of MSBs and a fine ADC block for the remaining 4bits. The amplified folding analog signals in the coarse ADC are selectively chosen for the fine ADC. In the fine ADC, the bubble errors of the comparators are corrected by using the BGM(binary-gray-mixed) code[1] and extra two comparators are used to correct underflow and overflow errors. The proposed ADC was simulated using CMOS 0.25${\mu}{\textrm}{m}$ parameters and occupies 1.0mm$\times$1.0mm. The power consumption is 48㎽ at 40MS/s with 2.5-V power supply. The INL is under $\pm$2.0LSB and the DNL. is under $\pm$1.0LSB by Matlab simulations.

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Design of a programmable current-mode folding/interpolation CMOS A/D converter (프로그래머블 전류모드 폴딩 . 인터폴레이션 CMOS A/D 변환기 설계)

  • 김형훈
    • Proceedings of the IEEK Conference
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    • 2001.06b
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    • pp.45-48
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    • 2001
  • An programmable current-mode folding and interpolation analog to digital converter (ADC) with programmable interpolator is proposed in this paper. A programmable interpolator is employed not only to vary the resolution of data converter, but also to decrease a power dissipation within the ADC. Because of varying the number of interpolation circuits, resolution is vary from 6 to 10bit. The designed ADC fabricated by a 0.6${\mu}{\textrm}{m}$ n-well CMOS double metal/single poly process. The experimental result shows the power dissipation from 26 to 87mW with a power supply of 3.3V.

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