Variation of Threshold Voltage by Programming Voltage Change of a Flash Memory Device with Ge-MONOS (Ge-MONOS 구조를 가진 플레쉬 메모리 소자의 프로그래밍 전압에 따른 문턱 전압 관찰)
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- Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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- 2019.05a
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- pp.323-324
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- 2019