References
- P. Hautojarvi and C. Corbel, in: A. Dupasquier, A. P. Mills Jr. (Eds.), Positron Spectroscopy of Solids, IOS Press, Ohmsha, Amsterdam, 1995. p. 491.
- J. P. Schaffer, A. Rohatgi, A. B. DeWarld, R. L. Frost, and S. K. Pang, J. Elec. Mat. 18, 737 (1989). https://doi.org/10.1007/BF02657527
- A. P. Druzhkov, R. N. Yeshchenko, S. M. Klotsman, A. N. Martem'Yanov, and G. G. Taluts, Phys. Met. Metall. 66, 117 (1988).
- J. L. Lee and J. T. Waber, Meta. Trans. 21a, 2037 (1990).
- J. G. Shin, C. Y. Lee, S. H. Bae, J. H. Kim, and J. H. Kwon, Kor. J. Mater. Res. 18, 427 (2008). https://doi.org/10.3740/MRSK.2008.18.8.427
- B. Mantl and W. Triftshauser, Appl. Phys. 5, 177 (1974). https://doi.org/10.1007/BF00928232
- C. Y. Lee, W. N. Kang, Y. Nagai, K. Inoue, and M. Hasegawa, J. Kor. Vacuum Soc. 17, 160 (2008). https://doi.org/10.5757/JKVS.2008.17.2.160
- J. H. Kim, Y. Nagai, and C. Y. Lee, J. Kor. Vacuum Soc. 18, 447 (2009). https://doi.org/10.5757/JKVS.2009.18.6.447
- K. G. Lynn, J. R. MacDonald, R. A. Boie, L. C. Feldman, J. D. Gabbe, and M. F. Robbins, Phy. Rev. Lett. 38, 241 (1977). https://doi.org/10.1103/PhysRevLett.38.241
- K. G. Lynn, J. E. Dickman, W. L. Brown, and M. F. Robbins, Phy. Rev. B 20, 3566 (1978).
- S. Ishibashi, A. Yamaguchi, Y. Suzuki, M. Doyama, H. Kumamura, and K. Togano, Jpn. J. Appl. Phys. 26, L688 (1987). https://doi.org/10.1143/JJAP.26.L688
- M. Chakrabarti, A. SarKar, D. Sanyal, G. P. Karwasz, and A. Zecca, Phys. Lett. A 321, 376 (2004). https://doi.org/10.1016/j.physleta.2003.11.062
- N. N. Mikhailov, I. V. Voronova, O. A. Lavrova, E. V. Melnikov, and M. N. Smirnova, JETP Lett. 19, 271 (1974).
- N. L. Saini, M. Filippi, H. Oyanagi, H. Ihara, A. Iyo, and A. Bianconi, Phys. Rev. B 68, 104507 (2003). https://doi.org/10.1103/PhysRevB.68.104507
- M. Fujinami, T. Sawada, and T. Akahane, Rad. Phys. Chem. 68, 631 (2003). https://doi.org/10.1016/S0969-806X(03)00252-4
- T. Onitsuka, M. Takenaka, H. Abe, E. Kuramoto, H. Ohkubo, Y. Nagai, and M. Hasegawa, Mater. Sci. Forum 445-446, 168 (2004). https://doi.org/10.4028/www.scientific.net/MSF.445-446.168
- J. H. Kim, Y. S. Lee, E. S. Chung, C. Y. Lee, and G. H. Lee, Phys. & High Tech. 11(3), 41 (2002).
- E. C. von Stetten, S. Berko, X. S. Li, R. R. Lee, J. Brynestad, D. Singh, H. Krakauer, W. E. Pickett and R. E. Cohen, Phys. Rev. Lett. 60, 2198 (1988). https://doi.org/10.1103/PhysRevLett.60.2198
- N. L. Saini,, A. Bianconi, and H. Oyanagi, J. Phys. Soc. Jpn. 70, 2092 (2001). https://doi.org/10.1143/JPSJ.70.2092
- R. M. Nieminen, J. Laakkonen, P. Hautojarvi, and A. Vehanen, Phys. Rev. B 19, 1397 (1979). https://doi.org/10.1103/PhysRevB.19.1397
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