• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.12
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• pp.49-58
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• 1998

In this paper, we report new algorithms to select scan flip-flops for the no holding partial scan test method. The no holding partial scan test method is identical to the full scan test method except that some flip-flops are left unscanned. This test method does not hold scanned or unscanned flip-flops while shifting in test vectors, or applying them, or shifting out test results. The proposed algorithm allows a large number of flip-flops to be left unscanned while maintaining almost the complete full scan fault coverage.

• The Journal of the Korea Contents Association
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• v.5 no.1
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• pp.229-236
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• 2005

Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.5
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• pp.1-8
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• 2009

Since scan based testing is very efficient and widely used for testing large sequential circuits. However, since test patterns are serially injected through long scan chains, scan based testing requires very long test application time. Also, compared to the normal operations, scan shifting operations drastically increase power consumption. In order to solve these problems, this paper presents a new scan architecture for both test application time and test power reduction. The proposed scan architecture partitions scan chains into several segments and bypasses some segments which do not include any specified bit. Since bypassed segments are excluded from the scan shifting operation, the test application time and test power can be significantly reduced.

• Proceedings of the Korean Information Science Society Conference
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• 2005.11a
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• pp.835-837
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• 2005

이동기기들이 늘어가고 있는 추세에서 기기들의 구성품인 디지털 회로들의 테스트 시간과 전력소모는 성능에 상당한 영향을 미친다. 테스트 시간을 줄이는 방법은 병렬 코어 테스트 방법으로 줄일 수 있으나, 다양한 코어들이 동시에 테스트 되면 많은 전력 소모를 야기 시킨다. 스캔 구조를 기반으로 한 회로에서 전력 소모는 테스트 데이터의 불필요한 천이에 의해 많이 발tod한다. 그러므로 스캔 체인을 수정함으로 인해 입력 값과 출력 간의 천이를 줄일 수 있다. 제안하는 스캔 체인의 수정은 스캔 셀의 재배치와 특정한 회로의 추가로 이루어진다. 또한 회로의 추가는 그에 적합한 그룹화를 시킴으로써 최소의 수를 결정한다. 천이 주기를 해석하여 효과적인 알고리즘을 세움으로써 최적의 스캔 체인구조와 그룹을 구함으로써 전력 소모를 최소화할 수 있다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.12
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• pp.1045-1054
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• 2002

We present a new low power scan testing and test data compression mothod lot System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low Power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full - scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.690-692
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• 2012

This pape presents the efficient test data compression method considering test power dissipation in scan test of IP core. There are many researches about test data compression using scan slice selective encoding except power dissipation. We present the new algorithm that assigns the don't care value to be a minimal hamming distance between adjacent slices. Experimental results show that the power dissipation is reduced.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.14 no.4
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• pp.219-225
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• 2014

The New efficient Mux-based scan latch cell design and scan test of LOS/LOC modes are proposed for detection of delay faults in digital logic circuits. The proposed scan cell design can support LOS(Launch-off-Shift) and LOC(Launch-off-Capture) tests with high fault coverage and low scan power and it can alleviate the problem of the slow selector enable signal and hold signal by supporting the logic capable of switching at the operational clock speeds. Also, it efficiently controls the power dissipation of the scan cell design during scan testing. Functional operation and timing simulation waveform for proposed scan hold cell design shows improvement in at-speed test timing in both test modes.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.10
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• pp.39-44
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• 2008

Scan architecture is very effective design-for-testability technique that is widely used for high testability, however, it requires so much test time due to test vector shifting time. In this paper, an efficient scan test method is presented that is based on the Illinois scan architecture. The proposed method maximizes the common input effect via a scan chain selection scheme. Experimental results show the proposed method requires very short test time and small data volume by increasing the efficiency of common input effect.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1205-1208
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• 2003

본 논문에서는 분할된 스캔을 이용한 저전력 BIST 구조를 제안한다. 제안하는 BIST는 내부 스캔 패스를 회로의 구조적인 정보와 테스트 패턴 집합의 특성에 따라 4개의 스캔 패스로 분할하고 일부 스캔 패스에만 입력패턴이 인가되도록 설계하였다. 따라서 테스트 패턴 입력 시에 스캔 패스로의 쉬프트 동작 수를 줄임으로써 회로 내부의 전체 상태천이 수를 줄일 수 있다. 또한 4개로 분할되는 스캔패스의 길이를 고려하여 각 스캔 패스에 대해 1/4의 속도로 낮춰진 테스트 클럭을 인가함으로써 전체 회로의 전력 소모를 줄일 수 있도록 하였다. ISCAS89 벤치마크 회로에 대한 실험을 통하여 제안하는 BIST 구조가 기존 BIST 구조에 비해 최대 21%까지 전력소모를 줄일 수 있음을 확인하였다.

• Proceedings of the Korean Information Science Society Conference
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• 2001.10c
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• pp.7-9
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• 2001

ASIC 설계에서 gated clock으로 동작하는 clock을 입력으로 받는 회로들은 스캔 테스트를 수행하기에 용이하지 않다. 이러한 회로들에 대하여 스캔 테스트기법을 적용하기 위한 설계변경기술을 제안한다. 제안하는 설계변경기술은 비동기 회로를 동기 회로로 변환함으로써 스캔 기법을 적용할 수 있는 회로로 변환하게 된다. 이로써 테스트를 좀 더 용이하게 수행할 수 있을 뿐 아니라 결함 시험도를 높이게 되는 효과를 가져올 수 있다.