Recently, an extended warranty of a system following the expiration of the basic warranty is becoming increasingly popular to the user. In this respect, we suggest a replacement model following the expiration of extended warranty with minimal repair warranty from the user's point of view in this paper. Under extended warranty, the failed system is minimally repaired by the manufacturer at no cost to the user during the original extended warranty period. As a criterion of the optimality, we utilize the expected cost rate per unit time during the life cycle from the user's perspective and suggest the optimal replacement period after extended warranty. Finally, a few numerical examples are given for illustrative purpose.

Accelerated degradation tests (ADTs) measuring failure-related degradation characteristic at the accelerated condition are widely used to assess the reliability of highly reliable products. Often, however, little degradation could be observed even in single-stress ADTs due to the high reliability of test unit, and as a result poor estimate of the reliability may be obtained. ADTs with multiple stress variables can be employed to overcome such difficulties. In this paper, optimal ADT plans with two stress variables are developed assuming that the degradation characteristic follows Weibull distribution by determining the stress levels, the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.

The solder is any of various fusible alloys, usually tin and lead, used to join metallic parts that provide the contact between the chip package and the printed circuit board. Solder plays an important role of electrical signals to communicate between the two components. In this study, two kinds of Ag-free solder as sample is made to conduct the thermal shock test and the high humidity temperature test. Low resistance is measured to estimate crack size of solder, using daisy chain. The low speed shear test is also performed to analyze strength of solder. The appropriate degradation model is estimated using the result data. Depending on the composition of solder, lifetime estimation is conducted by adopted degradation model. The lifetime estimated two kinds of Ag-free solder is compared with expected lifetime of Sn-Ag-Cu solder. The result is that both Ag-free composition are more reliable than Sn-Ag-Cu solder.

In this paper, we studied the correlation between the activation energy($E_a$) of the raw materials and the structural characteristics of the White LED PKGs. The samples used in the study were composed of low power LED 3type and high power LED 5type. To calculate the activation energy($E_a$) of the White LED PKGs conducted three conditions of high temperature operation test based on the Arrhenius model. The number of samples used in the experiment is 10, respectively. The $T_j$ of Conditions and target specifics expressed $T_{j1}$, $T_{j2}$, $T_{j3}$. The activation energy ($E_a$) of the samples was calculated based on the value of the actually measured lifetime. We investigated the correlation between the activation energy ($E_a$) of the raw materials and the structural characteristics of the White LED PKGs. As a result, White LED PKGs activation energy($E_a$) value was confirmed that the material properties affected more than the structural characteristics of the LED PKGs and we found that activation energy of each LED Model has difference. Normally, The activation energy of phosphor of YAG type was indicated from 0.21 to 0.25[eV] and Silicate type was indicated from 0.12 to 0.16[eV]. According to the results, we confirmed that the activation energy of phosphor of YAG type is higher more than The activation energy of phosphor of Silicate type.

As a fundamental experimental study for reliability improvement of lithium ion secondary battery, degradation mechanism was investigated by microscopic observation and acoustic emission monitoring. Microstructural observation of the decomposed battery after cycle test revealed mechanical and chemical damages such as interface delamination, microcrack of the electrodes, and solid electrolyte interphase (SEI). Acoustic emission (AE) signal was detected during charge and discharge of lithium ion battery to investigate relationships among cumulative count, discharge capacity, and microdamages. With increasing number of cycle, discharge capacity was decreased and AE cumulative count was observed to increase. Observed damages were attributed to sources of the detected AE signals.

The study of environmental stress cracking (ESC) by contact with plastic rulers and PVC erasers which was artificially added to the external stress was carried out in order to accelerate the chemicals crack. To analyze a blooming plasticizer that migrates from the inside of blended eraser to the surface of the eraser, the ESC experiments were carried out at room temperature and $50^{\circ}C$ conditions. The chemicals crack shape caused by the plasticizer and the brittle fracture shape resulted from the external stress were observed in consequence with the cross-sectional surface analysis of the ruler crack by the ESC. The bending strength of the plastic rulers were fractured prior to the yield point and it had low bending flexure stress. We presented that ESC of polymer materials was affected by the polarity of the chemicals and polymer, the exposure time to chemicals, the exposure temperature and the level of strain on the polymer.