Activation energy standardization of White LED Phosphor |
Jang, In-Hyeok
(Chosun University)
Kim, Su-Kyoung (Korea Testing Certification) Han, Ji-Hoon (Korea Testing Certification) Lee, Chang-Hoon (Korea Testing Certification) Lim, Houng-Woo (Korea Testing Certification) |
1 | 주은철(2011). LED/OLED 최신 산업동향 및 혁신기술 동향분석, BIR. |
2 | L. Trevisanello, M. Meneghini, G. Mura, M. Vanzi, Maura Pavesi, G. Meneghesso, and E. Zanoni(2008), "Accelerated Life Test of High Brightness Light Emitting Diodes," IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY., vol. 8, NO. 2. |
3 | M. Meneghini, A. Tazzoli, G. Mura, G. Meneghesso, E. Zanoni, , "A Review on the Physocal Mechanisms That Limit the Reliability if GaN-Based LEDs(2010), " IEEE TRANSACTIONS ON ELECTRON DEVICES., vol. 57, NO. 1. DOI ScienceOn |
4 | J. Liu, W. S. Tam, H. Wong, and V. Filip(2009), "Temperature-dependent light-emitting characteristics of InGaN/GaN diodes," Microelectronics Reliability., 49, pp. 38-41. DOI ScienceOn |
5 | J. M. Kang, J. W. Kim, J. H. Choi, D. H. Kim, and H. K. Kwon(2009), "Life-time estimation of high-power blue light-emitting diode chips," Microelectronics Reliability., 49, pp. 1231-1235. DOI ScienceOn |
6 | G. Meneghesso, S. Levada, R. Pierobon, F. Rampazzo, E. Zanoni, A. Cavallini, A. Castaldini, and I. Eliashevich(2002), "Degradation Mechanisms of GaN-Based LEDs after Accelerated DC Current Aging," Technical Digest-International Electron Devices Meeting, pp. 103-106. |
7 | C. M. Tan, B. K. E. Chen, G. Xu, and Y. Liu(2009), "Analysis of humidity effects on the degradation of high-power white LEDs," Microelectronics Reliability, 49(9-11), pp. 1226-1230. DOI ScienceOn |