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Bayesian Reliability Estimation for Small Sample-Sized One-shot Devices  

Mun, Byeong Min (Department of Industrial Engineering, Hanyang University)
Sun, Eun Joo (Department of Industrial Engineering, Hanyang University)
Bae, Suk Joo (Department of Industrial Engineering, Hanyang University)
Publication Information
Journal of Applied Reliability / v.13, no.2, 2013 , pp. 99-107 More about this Journal
Abstract
One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.
Keywords
bayesian reliability; gamma prior; maximum likelihood estimation; one-shot device; storage reliability;
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