• Journal of the Korean Data and Information Science Society
• /
• v.19 no.3
• /
• pp.951-957
• /
• 2008

We derive some approximate maximum likelihood estimators(AMLEs) and maximum likelihood estimator(MLE) of the scale parameter in the half-triangle distribution based on progressively Type-II censored samples. We compare the proposed estimators in the sense of the mean squared error for various censored samples. We also obtain the approximate maximum likelihood estimators of the reliability function using the proposed estimators. We compare the proposed estimators in the sense of the mean squared error.

• Journal of the Korean Data and Information Science Society
• /
• v.13 no.2
• /
• pp.11-19
• /
• 2002

In this paper, the problem of estimating a p-variate $(p\geq4)$ normal mean vector in a decision-theoretic setup is considered. Using a technique of Guo and Pal (1992), a sequence of estimators dominating the Lindley type estimator is derived and each improved estimator is better than the previous one.

• Bulletin of the Korean Mathematical Society
• /
• v.47 no.2
• /
• pp.221-229
• /
• 2010

Some new $\check{C}$eby$\check{s}$ev type inequalities have been developed by working on functions whose first derivatives are absolutely continuous and the second derivatives belong to the usual Lebesgue space $L_{\infty}[a,\;b]$. A unified treatment of the special cases is also given.

• Journal of the Korean Data and Information Science Society
• /
• v.19 no.4
• /
• pp.1441-1448
• /
• 2008

We propose the modified quantile-quantile (Q-Q) plot using the approximate maximum likelihood estimators and the modified normalized sample Lorenz curve (NSLC) plot for the extreme value distribution based on multiply Type-II censored samples. Using two example data sets, we picture the modified Q-Q plot and the modified NSLC plot.

• Journal of the Korean Data and Information Science Society
• /
• v.16 no.1
• /
• pp.145-156
• /
• 2005

In this paper, we derive the approximate maximum likelihood estimators (AMLEs) of the scale parameter of the half-logistic distribution based on multiply Type-II censored samples. We compare the proposed estimators in the sense of the mean squared error (MSE) for various censored samples.

• Journal of the Korean Data and Information Science Society
• /
• v.9 no.1
• /
• pp.71-76
• /
• 1998

By assuming a general progressive Type-II censored sample, we propose the minimum risk estimator (MRE) of the location parameter and the scale parameter of the two-parameter exponential distribution. An example is given to illustrate the methods of estimation discussed in this paper.

• Journal of the Korean Data and Information Science Society
• /
• v.16 no.3
• /
• pp.629-638
• /
• 2005

We derive the approximate maximum likelihood estimators of the scale parameter and location parameter of the extreme value distribution based on multiply Type-II censored samples. We compare the proposed estimators in the sense of the mean squared error for various censored samples.

• Journal of the Korean Data and Information Science Society
• /
• v.17 no.4
• /
• pp.1319-1328
• /
• 2006

For multiply Type-II censored samples from two-parameter Rayleigh distribution, the maximum likelihood method does not admit explicit solutions. In this case, we propose some explicit estimators of the location and scale parameters in the Rayleigh distribution by the approximate maximum likelihood methods. We compare the proposed estimators in the sense of the mean squared error for various censored samples.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2003.05a
• /
• pp.457-459
• /
• 2003

A new hairpin type bandpass fille. (BPF) with novel type of resonators on Teflon substrate is designed, measured, and compared with its simulation results. The proposed filter seems to have advantages of low cost and low loss, thus being very useful for 12 GHz RF applications.

• The Journal of Korean Institute of Communications and Information Sciences
• /
• v.16 no.7
• /
• pp.615-627
• /
• 1991

In this paper the relative magnitudes of the 1/f noise constants were experimentally investigated in the plana type's resistors fabricated with the different type's semicondector materials, and a new measurement technique for the 1/f noise in the semiconductor plana type's resistors may be located at the semiconductor and silicon dioxde.