• Title/Summary/Keyword: optical interferometry

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A Study on the Vibration Mode Measurement of Rectangular Plate with Two Parallel Sides Fixed by Electronic Speckle Pattern Interferometry (전자처리 스페클 간섭법에 의한 양단이 고정된 직사각형 평판의 진동모드 측정에 관 한 연구)

  • 김경석
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 1996.03a
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    • pp.85-90
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    • 1996
  • In the word, there is varied types of vibration, and these affect the mechanical industry. In this paper is plates with two parallel sides fixed. Electronic speckle pattern interferometry (ESPI) is one of the optical nondestructive testing technique. By using the ESPI, vibration modes for excitation point, a/b(ratio of longuitudinal and lateral length), and kind of specimen are measured and compared qualitatively with theoritical analysis that Warburton proposed.

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Quantitative Interpretation of Holographic Interferometry using Carrier Fringe and Digital Image Processing Technique (무늬 반송법과 디지털 영상처리를 이용한 홀로그래피 간섭무늬의 정량적 해석)

  • 고영욱
    • Proceedings of the Optical Society of Korea Conference
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    • 1991.06a
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    • pp.168-171
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    • 1991
  • 홀로그래피 간섭무늬로부터 변형의 요철방향을 구하기 위하여 무늬반송법을 응용하였다. 변형에 의해 형성된 간섭무늬의 차수가 기준무늬를 따라 한 방향으로 증가하도록 하였으며, 디자탈 영상처리 기술을 이용하여 간섭무늬 해석을 자동화 하였다.

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Volumetric Interferometry Using Spherical Wave Interference for Three-dimensional Coordinate Metrology

  • Rhee, Hyug-Gyo;Chu, Ji-Young;Kim, Seung-Woo
    • Journal of the Optical Society of Korea
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    • v.5 no.4
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    • pp.140-145
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    • 2001
  • We present a new method of volumetric interferometer, which is intended to measure the three-dimensional coordinates of a moving object in a simultaneous way with a single optical setup. The method is based on the principles of phase-measuring interferometry with phase shifting. Two diffraction point sources, which are made of the polished ends of single-mode optical fibers are embedded on the object. Two spherical wavefronts emanate from the diffraction point sources and interfere with each other within the measurement volume. One wavefront is phase-shifted by elongating the corresponding fiber using a PZT extender. A CCD array sensor fixed at the stationary measurement station detects the resulting interference field. The measured phases are then related to the three-dimensional location of the object with a set of non-liner equations of Euclidean distance, from which the complete set of three-dimensional spatial coordinates of the object is determined through rigorous numerical computation based upon the least square error minimization.

Effect of scratches on optical connector interface surface on the insertion loss (광 커넥터 접합면의 스크래치가 삽입손실에 미치는 영향)

  • 윤영민;윤정현;김부균;신영곤;송국현
    • Korean Journal of Optics and Photonics
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    • v.15 no.4
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    • pp.287-292
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    • 2004
  • This paper presents the effect of scratches on an optical connector interface surface on the insertion loss of optical connectors. We propose a model for calculating the insertion loss of optical connectors. The model is expressed in terms of geometrical parameters of scratches assuming that the transmission coefficient of a light wave on the scratch surfaces is linearly varied as a function of scratch depth. Geometrical parameters of scratches such as location, width, and depth of scratches are measured using 3D optical interferometry surface profiler. We obtain the equation of the transmission coefficient in terms of scratch depth comparing the experimental insertion loss data to the insertion loss data using the model presented in this paper. Using the model and the equation of the transmission coefficient presented in this paper, we present the results of the insertion loss of optical connectors for various geometrical parameters of scratches. Scratches which are located at longer than two times the core radius from the center of the core show negligible effect on the insertion loss of optical connectors.

A Study on the Development of Image Processing Measurement System for Structural Analysis by Optical Non-contact Measurement (광학적 비접촉 측정에 의한 구조물 해석의 화상처리 계측 시스템 개발에 관한 연구)

  • Jang, Soon-Suck;Kim, Koung-Suk;Hong, Jin-Who;Choi, Ji-Eun;Kang, Ki-Soo;Kim, Dal-Woo
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.7
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    • pp.149-154
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    • 2001
  • This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

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Noise-robust Phase Gradient Retrieval Formulation for Phase-shifting Interferometry

  • Park, Dae-Seo;O, Beom-Hoan;Park, Se-Geun;Lee, El-Hang;Park, Jae-Hyun;Lee, Seung-Gol
    • Journal of the Optical Society of Korea
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    • v.14 no.2
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    • pp.131-136
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    • 2010
  • Modification of the phase gradient formulation is proposed in order to make phase retrieval less susceptible to noise. The modified formulation is derived from separation of the phase terms and the intensity modulation terms of interferograms, and subsequent differentiation to reduce the noise-induced error of the phase gradient vector. Its performance is evaluated and compared to that of the conventional formulation, and noise-robust nature is confirmed.

Heterodyne Optical Interferometer using Dual Mode Phase Measurement

  • Yim, Noh-Bin
    • International Journal of Precision Engineering and Manufacturing
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    • v.2 no.4
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    • pp.81-88
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    • 2001
  • We present a new digital phase measuring method for heterodyne optical interferometry, which providers high measuring speed up to 6 m/s with a fine displacement resolution of 0.1 nanometer. The key idea is combining two distinctive digital phase measuring techniques with mutually complementary characteristics to earth other one is counting the Doppler shift frequency counting with 20 MHz beat frequency for high-velocity measurement and the other is the synchronous phase demodulation with 2.0 kHz beat frequency for extremely fine displacement resolution. The two techniques are operated in switching mode in accordance wish the object speed in a synchronized way. Experimental results prove that the proposed dual mode phase measuring scheme is realized with a set of relatively simple electronic circuits of beat frequency shifting, heterodyne phase detection. and low-pass filtering.

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A Study on the Development of Image Processing Measurement System on the Structural Analysis by Optical Non-contact Measurement (광학적 비접촉 측정에 의한 구조물 해석의 화상처리 계측 시스템 개발에 관한 연구)

  • 김경석
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.8 no.6
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    • pp.78-83
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    • 1999
  • This study discusses a non-contact optical technique, electronic speckle pattern interformetry(ESPI), that is well suited for in-plane and out-of-plane deformation measurement. However, the existing ESPI methods that are based on dual-exposure, real-time and time-average method have difficulties for accurate measurement of structure, due to irregular intensity and shake of phase. Therefore, phase shifting method has been proposed in order to solve this problem. About the method, the path of reference light in interferometry is shifted and added to least square fitting method to make the improvement in distinction and precision. This proposed method is applied to measure in -plane displacement that is compared with the previous method. Also, Used as specimen AS4/PE따 [30/=30/90]s was analyzed by ESPI based on real-time to determine the characteristics of vibration under no-load and tension. These results are quantitatively compared with those of FEM analysis inmode shapes.

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Self-Compensation of PZT Errors in White Light Scanning Interferometry

  • Kang, Min-Gu;Lee, Sang-Yoon;Kim, Seong-Woo
    • Journal of the Optical Society of Korea
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    • v.3 no.2
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    • pp.35-40
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    • 1999
  • One of main error sources in white light scanning interferometry is the inaccuracy of scanning mechanisms in that PZT(piezoelectric transducer) micro-actuators are preferably used. We propose a new calibration method that is capable of identifying actual scanning errors directly by analyzing the spectral distribution of sampled interferograms. This calibration provides an effective means of self-compensation for the non-linearity errors caused by PZT hysteresis, enhancing the measurement uncertainty to a level of 5 nanometers over an entire measuring range of 100 ${\mu}{\textrm}{m}$.