광학적 비접촉 측정에 의한 구조물 해석의 화상처리 계측 시스템 개발에 관한 연구

A Study on the Development of Image Processing Measurement System for Structural Analysis by Optical Non-contact Measurement

  • 발행 : 2001.07.01

초록

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

키워드

참고문헌

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