• Journal of the Korea Institute of Information and Communication Engineering
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• v.17 no.10
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• pp.2380-2386
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• 2013

A PLL with an unipolar charge pump and a loop filter consisting of sample-hold capacitor and 2nd-order RC filter has been proposed. The goal of the proposed PLL is the suppression of reference spur which is caused by charge pump mismatch. It also improves phase noise characteristic. It has been designed with a 1.8V $0.18{\mu}m$ CMOS process and proved by HSPICE simulation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.326-329
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• 2002

In this paper, we investigated a feasibility of cerium oxide(CeO$_2$) films as a buffer layer of MFIS(metal ferroelectric insulator semiconductor) type capacitor. CeO$_2$ layer were Prepared by two step process of a low temperature film growth and subsequent RTA (rapid thermal annealing) treatment. By app1ying an ultra thin Ce metal seed layer and N$_2$ Plasma treatment, dielectric and interface properties were improved. It means that unwanted SiO$_2$ layer generation was successfully suppressed at the interface between He buffer layer and Si substrate. The lowest lattice mismatch of CeO$_2$ film was as low as 1.76% and average surface roughness was less than 0.7 m. The Al/CeO$_2$/Si structure shows breakdown electric field of 1.2 MV/cm, dielectric constant of more than 15.1 and interface state densities as low as 1.84${\times}$10$\^$11/ cm$\^$-1/eV$\^$-1/. After N$_2$ plasma treatment, the leakage current was reduced with about 2-order.

• Journal of IKEEE
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• v.23 no.1
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• pp.35-43
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• 2019

A capacitor self-calibration is proposed to improve the linearity of the capacitor digital-to-analog converter (CDAC) for an asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with 10-bit resolution. The proposed capacitor self-calibration is performed so that the value of each capacitor of the upper 5 bits of the 10-bit CDAC is equal to the sum of the values of the lower capacitors. According to the behavioral simulation results, the proposed capacitor self-calibration improves the performances of differential nonlinearity (DNL) and integral nonlinearity (INL) from -0.810/+0.194 LSBs and -0.832/+0.832 LSBs to -0.235/+0.178 LSBs and -0.227/+0.227 LSBs, respectively, when the maximum capacitor mismatch of the CDAC is 4%. The proposed 10-bit 20-MS/s asynchronous SAR ADC is implemented using a 110-nm CMOS process with supply of 1.2 V. The area and power consumption of the proposed asynchronous SAR ADC are $0.205mm^2$ and 1.25 mW, respectively. The proposed asynchronous SAR ADC with the capacitor calibration has a effective number of bits (ENOBs) of 9.194 bits at a sampling rate of 20 MS/s about a $2.4-V_{PP}$ differential analog input with a frequency of 96.13 kHz.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.59 no.2
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• pp.355-358
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• 2010

As CMOS technology continues to scale down, signal processing is favorably done in the digital domain, which requires Analog-to-Digital (A/D) Converter to be integrated on-chip. This paper presents a design methodology of 12-bit 1-MS/s Rail-to-Rail fully differential SAR ADC using Deep N-well Switch based on binary search algorithm. Proposed A/D Converter has the following architecture and techniques. Firstly, chip size and power consumption is reduced due to split capacitor array architecture and charge recycling method. Secondly, fully differential architecture is used to reduce noise between the digital part and converters. Finally, to reduce the mismatch effect and noise error, the circuit is designed to be available for Rail-to-Rail input range using simple Deep N-well switch. The A/D Converter fabricated in a TSMC 0.18um 1P6M CMOS technology and has a Signal-to-Noise-and-Distortion-Ratio(SNDR) of 69 dB and Free-Dynamic-Range (SFDR) of 73 dB. The occupied active area is $0.6mm^2$.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.5
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• pp.48-55
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• 1999

This paper describes automatic gain control circuit (AGC) design techniques for CMOS CCD camera interface systems. The required gain of the AGC in the proposed system is controlled directly by digital bits without conventional extra D/A converters and the signal settling behavior is almost independent of AGC gain variation at video speeds. A capacitor-segment combination technique to obtain large capacitance values considerably improves the effective bandwidth of the AGC based on switched-capacitor techniques. A proposed layout scheme for capacitor implementation shows AGC matching accuracy better than 0.1 %. The outputs from the AGC are transferred to a 10b A/D converter integrated on the same chip. The proposed AGC is implemented as a sub-block of a CCD camera interface system using a 0.5 um n-well CMOS process. The prototype shows the 32-dB AGC dynamic range in 1/8-dB steps with 173 mW at 3 V and 25 MHz.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.5
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• pp.61-66
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• 2013

In this paper, temperature dependence of matching characteristics of $Si_3N_4$ MIM capacitor was analyzed in depth. The matching characteristics becomes worse as the temperature increases. That is, the matching coefficient of $Si_3N_4$ MIM capacitor at $25^{\circ}C$, $75^{\circ}C$, and $125^{\circ}C$ was 0.5870, 0.6151, and $0.7861%{\mu}m$, respectively. This phenomena is believed to be due to the reduction of the carrier mobility and the increase of the charge concentration of the inner capacitor at greater temperature. Therefore, the analysis of the matching characteristics of $Si_3N_4$ MIM capacitors at high temperatures is essential for application to analog and SoC (System on Chip) circuit.

• JSTS:Journal of Semiconductor Technology and Science
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• v.10 no.4
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• pp.276-281
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• 2010

A 2.5 V feed-forward second-order deltasigma modulator for audio application is presented. A 9-level quantizer with a tree-structured dynamic element matching (DEM) was employed to improve the linearity by shaping the distortion resulted from the capacitor mismatch of the feedback digital-toanalog converter (DAC). A chopper stabilization technique (CHS) is used to reduce the flicker noise in the first integrator. The prototype delta-sigma analogto-digital converter (ADC) implemented in a 65 nm 1P8M CMOS process occupies 0.747 $mm^2$ and achieves 109.1 dB dynamic range (DR), 85.4 dB signal-to-noise ratio (SNR) in a 24 kHz audio signal bandwidth, while consuming 14.75 mW from a 2.5 V supply.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.185-185
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• 2008

This paper describes the broadband SDC (Single-ended to Differential Converter) for Digital Video Broadcasting-Satellite $2^{nd}$ edition (DVB-S2) receiver tuner IC. It is fabricated by using $0.18{\mu}m$ CMOS process. In order to obtain high linearity and low phase mismatch, the broadband SDC (Single-ended to Differential Converter) is designed with current mirror structure and cross-coupled capacitor and current source binding differential structure at VDD. The simulation result of SDC shows IIP3 of 11.9 dBm and IIP2 of 38 dBm. It consumes 5mA current with 2.7V supply voltage.

• JSTS:Journal of Semiconductor Technology and Science
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• v.11 no.1
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• pp.23-32
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• 2011

A 40 fJ/c-s, 1 V, 10-bit SAR ADC is presented for energy constrained wearable body sensor network application. The proposed 10-bit dual sampling capacitive DAC topology reduces switching energy by 62% compared with 10-bit conventional SAR ADC. Also, it is more robust to capacitor mismatch than the conventional architecture due to its cancelling effect of each capacitive DAC. The proposed SAR ADC is fabricated in 0.18 ${\mu}m$ 1P6M CMOS technology and occupies 1.17 $mm^2$ including pads. It dissipates only 1.1 ${\mu}W$ with 1 V supply voltage while operating at 100 kS/s.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.23 no.5
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• pp.1310-1318
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• 1998

Sigma-delta converter is frequently used for conyerting low-frequency anglog to digital signal. The converter consists of a modulator and a digital filer, but our work is concentrated on the modulator. In this works, to design second-order sigma-dalta modulator with 14bit resolution, we define maximumerror limits of each components (operational smplifier, integrator, internal ADC, and DAC) of modulator. It is first performed modeling of an ideal second-order sigma-delta modulator. This is then modified by adding the non-ideal factors such as limit of op-amp output swing, the finit DC gain of op-amp slew rate, the integrator gian error by the capacitor mismatch, the ADC error by the cmparator offset and the mismatch of resistor string, and the non-linear of DAC. From this modeling, as it is determined the specification of each devices requeired in design and the fabrication error limits, we can see the final performance of modulator.