References
- H. P. Tuinhout, "Design of Matching Test Structures," IEEE Conf. on Microelectronic Test Structures, pp. 21-27, San Diego, USA, Mar. 1994.
- M. J. M. Pelgrom, A. C. J. Duinmaijer and A. P. G. Welbers, "Matching Properties of MOS Transistors," IEEE Journal of Solid-State Circuits, Vol. 24, No. 5, pp. 1433-1440, Oct. 1998.
- K. R. Lakshmikumar, R. A. Hadaway and M. A. Copeland, "Characterization and modeling of mismatch in MOS transistors for precision analog design," IEEE Journal of Solid-State Circuits, Vol. 21, No. 6, pp. 1057-1066, Dec. 1986. https://doi.org/10.1109/JSSC.1986.1052648
- L. Pileggi, G. Keskin, X. Li, K. Mai and J. Proesel, "Mismatch Analysis and Statistical Design at 65nm and below," IEEE Conf. on Custom Integrated Circuits, pp. 9-12, California, USA, Sept. 2008.
- H. P. Tuinhout, H. Elzinga, J. T. Brugman and F. Postma, "The Floating Gate Measurement Technique for Characterization of Capacitor Matching," IEEE Trans. on Semiconductor Manufacturing, Vol. 9, No. 1, pp. 2-8, Feb. 1996. https://doi.org/10.1109/66.484276
-
장재형, 권혁민, 정의정, 곽호영, 권성규, 이환희, 고성용, 이원묵, 이성재, 이희덕, "MIM 구조를 갖는
$Al_{2}O_{3}/HfO_{2}/Al_{2}O_{3}$ 캐패시터의 정합특성 분석," 전기전자재료학회 논문지, Vol. 25, No. 1, pp. 1-5, Jan. 2012. https://doi.org/10.4313/JKEM.2012.25.1.1 - J. Hunter, P. Gudem and S. Winters, "A Differntial Floating Gate Capacitance Mismatch Measurement Technique," IEEE Conf. on Microelectronis Test Structures, pp. 142-147, California, USA, Mar. 2000.
- H. Zhao. R. Kim, A. Paul, M. Luisier, G. Klimeck, F. J. Ma, S. C. Rustagi, G. S. Samudra, N. Singh, G. Q. Lo and D. L. Kwong, "Characterization and Modeling of Subfemtofarad Nanowire Capacitance Using the CBCM Technique," IEEE Electron Device Letters, Vol. 30, No. 5, pp. 526-528, May. 2009. https://doi.org/10.1109/LED.2009.2015588
- P. Andricciola and H. P. Tuinout, "The Temperature Dependence of Mismatch in Deep-Submicrometer Bulk MOSFETs," IEEE Electron Device Letters, Vol. 30, No. 6, pp. 690-692, Jun. 2009. https://doi.org/10.1109/LED.2009.2020524
-
J. G. Hyun, S. Y. Lee, S. D. Cho and K. W. Paik, "Frequency and Temperature Dependence of Dielectric Constant of Epoxy/
$BaTiO_{3}$ Composite Embedded Capacitor Films (ECFs) for Organic Substrate," Electronic Components and Technology Conference, pp. 1241-1247, Jun. 2005. -
H. Hu, C. Zhu, Y. F. Lu, M. F. Li, B. J. Cho and W. K. Choi, "A High Performance MIM capacitor Using
$HfO_{2}$ Dielectrics," IEEE Electron Device Letters, Vol. 23, No. 9, pp. 514-516, Sept. 2002. https://doi.org/10.1109/LED.2002.802602 -
S. Becu, S. Cremer, O. Noblanc, J. L. Autran and P. Delpech, "Characterization and Modeling of
$Al_{2}O_{3}$ MIM capacitors : Temperature and Electrical Field Effects," IEEE Conf. on Solid State Device Research, pp. 265-268, Grenoble, France, Sept. 2005. -
C. Zhu, H. Hu, X. Yu, S. Kim, A. Chin, M. F. Li, B. J. Sho and D. L. Kwong, "Voltage and Temperature Dependence of Capacitance of High-k
$HfO_{2}$ MIM Capacitors : A Unified Understanding and Prediction," IEEE International Electron Devices Meeting, pp. 36.5.1-36.5.4, Dec. 2003. -
S. U. Park, C. Y. Kang, H. M. Kwon, B. S. Park, W. H. Choi, I. S. Han, G. Bersuker, R. Jammy and H. D. Lee, "Analysis of reliability characteristics of high capacitance density MIM capacitors with
$SiO_{2}-HfO_{2}-SiO_{2}$ dielectrics," Microelectronic Engineering, Vol. 88, pp. 3389-3392, Dec. 2011. https://doi.org/10.1016/j.mee.2010.01.012 -
S. U. Park, H. M. Kwon, I. S. Han, Y. J. Jung, H. Y. Kwak, W. I. Choi, M. L. Ha, J. I. Lee, C. Y. Kang, B. H. Lee, R. Jammy and H. D. Lee, "Comparison of Multilayer Dielectric Thin Films for Future Metal-Insulator-Metal Capacitors :
$Al_{2}O_{3}/HfO_{2}/Al_{2}O_{3}$ versus$SiO_{2}/HfO_{2}/SiO_{2}$ ," Japanese Journal of Applied Physics, Vol. 50, No. 10, pp. 10PB06-10PB06-4, Oct. 2011. https://doi.org/10.1143/JJAP.50.10PB06