• Title/Summary/Keyword: VLSI circuit

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(Signal Integrity Verification of a General VLSI Interconnects using Virtual-Straight Line Model) (가상 직선 모델을 사용한 일반적 VLSI 배선의 신호의 무결성 검증)

  • Jin, U-Jin;Eo, Yeong-Seon;Sim, Jong-In
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.39 no.2
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    • pp.146-156
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    • 2002
  • In this paper, a new virtual-straight line parameter determination methodology and fast time domain simulation technique for non-uniform interconnects are presented and verified. Time domain signal response of interconnects circuit considering the characteristic of non-linear transistor is performed by using model order reduction method. Since model order reduction method is peformed by using per unit length parameters, virtual- straight line parameters for non-uniform interconnects are determined. Its method is integrated into Berkeley SPICE and shown that time domain signal responses using proposed method have a good agreement with the results of conventional circuit simulator HSPICE. The proposed method can be efficiently employed in the high-performance VLSI circuit design since it can provide a fast and accurate time domain signal response of complicated multi - layer interconnects.

The Design of Self Testing Comparator (자체시험(Self-Testing) 특성을 갖는 비교기(Comparator) 설계)

  • 양성현;이상훈
    • Journal of the Korea Computer Industry Society
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    • v.2 no.2
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    • pp.219-228
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    • 2001
  • This paper presents the implementation of comparator which are Fail-Safe with respect to faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it at the Fail-Safe system. First, a new fault model for PLA(Programmable Logic Array) is presented. This model reflects several physical defects in VLSI circuits. It focuses on designs based on PLA because VLSI chips are far too complex to allow detailed analysis of all the possible physical defects that can occur and of the effects on the operation of the circuit. Second, this paper show that these design, which was implemented with 2 level AND_ORor NOR-NOR circuit, are optimal in term of size. And it also present a formal proof that a comparator implemented as NOR-NOR PLA, based on these design, is self-testing with respect to most single faults in the presented fault model. Finally, it discuss the application of the self-testing comparator as a building block for implementing Fail-Safe Adder.

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Implementation of Recursive DSP Algorithms Based on an Optimal Multiprocessor Scheduler (최적 멀티프로세서 스케줄러를 이용한 재귀 DSP 알고리듬의 구현)

  • Kim Hyeong-Kyo
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.10 no.2
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    • pp.228-234
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    • 2006
  • This paper describes a systematic process which can generate a complete circuit specification efficiently for a given recursive DSP algorithm based on an optimal multiprocessor scheduler. The process is composed of two states: scheduling and circuit synthesis. The scheduling part accepts a fully specified flow graph(FSFG) as an input, and generates an optimal synchronous multiprocessor schedule. Then the circuit synthesis part translates the modified schedule into a complete circuit diagram including a control specification. The circuit diagram can be applied to a silicon compiler for VLSI layout generation. This paper illustrates the whole process with an example of a second order Gray-Market lattice filter.

An efficient VLSI Implementation of the 2-D DCT with the Algorithm Decomposition (알고리즘 분해를 이용한 2-D DCT)

  • Jeong, Jae-Gil
    • The Journal of Natural Sciences
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    • v.7
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    • pp.27-35
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    • 1995
  • This paper introduces a VLSI (Very Large Scale Integrated Circuit) implementation of the 2-D Discrete Cosine Transform (DCT) with an application to image and video coding. This implementation, which is based upon a state space model, uses both algorithm and data partitioning to achieve high efficiency. With this implementation, the amount of data transfers between the processing elements (PEs) are reduced and all the data transfers are limitted to be local. This system accepts the input as a progressively scanned data stream which reduces the hardware required for the input data control module. With proper ordering of computations, a matrix transposition between two matrix by matrix multiplications, which is required in many 2-D DCT systems based upon a row-column decomposition, can be also removed. The new implementation scheme makes it feasible to implement a single 2-D DCT VLSI chip which can be easily expanded for a larger 2-D DCT by cascading these chips.

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A Study on the Design of Contunous-Time GYRATOR Filter for VLSI (VLSI 구현을 위한 연속시간 GYRATOR 필터회로 설계에 관한 연구)

  • 김석호;조성익;정우열;정학기;정경택;이종인
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.19 no.1
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    • pp.83-90
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    • 1994
  • In this paper, the GYRATOR circuit is designed by the highly linear MOS transconductor with the gain factor controllable by offset voltage, and the floating inductor, the floating resistor and the grounded resistor are simulated by the GYTATOR for VLSI. And for the design exmple, Butterworth filter is designed using this GYRATOR, and is conpensated by the frequency transformation for the frequency shift that due to non-ideal output impedance of transconductor.

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Implementation of ATPG for IdDQ testing in CMOS VLSI (CMOS VLSI의 IDDQ 테스팅을 위한 ATPG 구현)

  • 김강철;류진수;한석붕
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.176-186
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    • 1996
  • As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

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ASM Chart and SDL for VLSI Logic Design Automation (VLSI의 논리 설계 자동화를 위한 ASM 도표와 SDL)

  • Cho, Joung Hwee;Chong, Jung Wha
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.23 no.2
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    • pp.269-277
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    • 1986
  • This paper proposes a new algorithmic state machine(ASM) chart and a new hardware description for automatic logic design of VLSI. To describe the behavioral characteristics of the design specification, the conventional ASM chart is modified, and a new hardware description language, SDL, is proposed. The SDL is one-to-one correspondent to the proposed ASM chart symbol, and can be used in a hierachical design of VLSI. As a design example, we obtain a logic circuit diagram of gate lebel utilizing a SDL hardware compiler after drawing an ASM chart and describing in SDL.

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Design of a Low-Power Carry Look-Ahead Adder Using Multi-Threshold Voltage CMOS (다중 문턱전압 CMOS를 이용한 저 전력 캐리 예측 가산기 설계)

  • Kim, Dong-Hwi;Kim, Jeong-Beom
    • The KIPS Transactions:PartA
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    • v.15A no.5
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    • pp.243-248
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    • 2008
  • This paper proposes a low-power carry look-ahead adder using multi-threshold voltage CMOS. The designed adder is compared with conventional CMOS adder. The propagation delay time is reduced by using low-threshold voltage transistor in the critical path. Also, the power consumption is reduced by using high-threshold voltage transistor in the shortest path. The other logic block is implemented with normal-threshold transistor. Comparing with the conventional CMOS circuit, the proposed circuit is achieved to reduce the power consumption by 14.71% and the power-delay-product by 16.11%. This circuit is designed with Samsung $0.35{\mu}m$ CMOS process. The validity and effectiveness are verified through the HSPICE simulation.

Implementation of Euclidean Calculation Circuit with Two-Way Addressing Method for Reed-Solomon Decoder (Reed-Solomon decoder를 위한 Two-way addressing 방식의 Euclid 계산용 회로설계)

  • Ryu, Jee-Ho;Lee, Seung-Jun
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.36C no.6
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    • pp.37-43
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    • 1999
  • Two-way addressing method has been proposed for efficient VLSI implementation of Euclidean calculation circuit for pipelined Reed-Solomon decoder. This new circuit is operating with single clock while exploiting maximum parallelism, and uses register addressing instead of register shifting to minimize the switching power. Logic synthesis shows the circuit with the new scheme takes 3,000 logic gates, which is about 40% reduction from the previous 5,000 gate implementation. Computer simulation also shows the power consumption is about 3mW. The previous implementation with multiple clock consumed about 5mW.

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Design of High-Speed Parallel Multiplier on Finite Fields GF(3m) (유한체 GF(3m)상의 고속 병렬 곱셈기의 설계)

  • Seong, Hyeon-Kyeong
    • Journal of the Korea Society of Computer and Information
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    • v.20 no.2
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    • pp.1-10
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    • 2015
  • In this paper, we propose a new multiplication algorithm for primitive polynomial with all 1 of coefficient in case that m is odd and even on finite fields $GF(3^m)$, and design the multiplier with parallel input-output module structure using the presented multiplication algorithm. The proposed multiplier is designed $(m+1)^2$ same basic cells. Since the basic cells have no a latch circuit, the multiplicative circuit is very simple and is short the delay time $T_A+T_X$ per cell unit. The proposed multiplier is easy to extend the circuit with large m having regularity and modularity by cell array, and is suitable to the implementation of VLSI circuit.