• 전기전자학회논문지
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• 제27권3호
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• pp.234-238
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• 2023

본 논문에서는 PVT(process, voltage, and temperature) 변화에 대한 보상기능을 가지는 시간-디지털 변환기(time-to-digital converter : TDC)를 제안한다. 일반적인 지연 라인(delay line) 기반의 TDC는 인버터의 전파 지연을 기반으로 시간을 측정하기 때문에 근본적으로 PVT 변화에 민감하다. 이 논문은 PVT 변화에 의한 전파 지연을 보상하여 TDC의 해상도 변화를 최소화시키는 방법을 제안한다. 또한 넓은 입력 측정 범위(detection range)를 갖기 위해 Cyclic Vernier TDC (CVTDC) 구조를 채택한다. 제안하는 PVT보상 기능의 CVTDC는 45nm CMOS 공정으로 설계되어, 8mW의 전력을 소모하며, 5 ps의 TDC 해상도 및 약 5.1 ns 입력 측정 범위를 갖는다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제12권4호
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• pp.411-417
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• 2012

A Coarse-Fine Time-to-Digital Converter (TDC) using the single time amplifier is proposed. A vernier delay line is used to overcome process dependency and the 2-stage time amplifier is designed to have high resolution by increasing the gain of the time amplifier. Single time amplifier architecture reduces the silicon area of the TDC and alleviates mismatch effect between time amplifiers. The proposed TDC is implemented in $0.18{\mu}m$ CMOS process with the supply voltage of 1.8 V. The measured results show that the resolution of the TDC is 0.73 ps with 10-bit digital output, although highend process is not applied. The single time amplifier architecture reduces 13% of chip area compared to previous work. By reducing the supply voltage, the linearity of the TDC is enhanced and the resolution is decreased to 1.45 ps.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권2호
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• pp.145-151
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• 2013

In this paper, a low power, small area cyclic time-to-digital converter in All-Digital PLL for DVB-S2 application is presented. Coarse and fine TDC stages in the two-step TDC are shared to reduce the area and the current consumption maintaining the resolution since the area of the TDC is dominant in the ADPLL. It is implemented in a 0.13 ${\mu}m$ CMOS process with a die area of 0.12 $mm^2$. The power consumption is 2.4 mW at a 1.2 V supply voltage. Furthermore, the resolution and input frequency of the TDC are 5 ps and 25 MHz, respectively.

• Journal of information and communication convergence engineering
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• 제8권4호
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• pp.461-465
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• 2010

This paper describes the design method of Time-to-Digital Converter(TDC) to obtain the constant delay time and good reliability. The reliability property is described with delay elements. In TDC the time signal is converted to digital value which is based on delay elements for the time interpolation. To obtain the constant delay time, the first and the last delay elements have different structure compared to the middle delay elements. In the first and the last delay elements, the driving ability could be controlled for the different delay time. The delay element can be designed by analog and digital devices. The delay time of the element using analog devices is not sensitive to process parameters than that of the element using digital devices. And the TDC circuit by the elements using analog devices shows better reliability than that by the elements using digital devices also.

• Nuclear Engineering and Technology
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• 제55권2호
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• pp.484-492
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• 2023

Time-to-digital converters (TDCs) based on the tapped delay line (TDL) architecture have been widely used in various applications requiring a precise time measurement. However, the poor uniformity of the propagation delays in the TDL implemented on FPGA leads to bubble error and large nonlinearity of the TDC. The purpose of this study was to develop an advanced TDC architecture capable of minimizing the bubble errors and improving the linearity. To remove the bubble errors, the decimated delay line (DDL) architecture was implemented on the UltraScale + FPGA; meanwhile, to improve the linearity of the TDC, a histogram uniformization (HU) and multi-chain TDL (MCT) methods were developed and implemented on the FPGA. The integral nonlinearities (INLs) and differential nonlinearities (DNLs) of the plain TDCs with the 'HU method' (HU TDC) and with 'both HU and MCT methods' (HU-MCT TDC) were measured and compared to those of the TDC with 'DDL alone' (plain TDC). The linearity of HU-MCT TDC were superior to those of the plain TDC and HU TDC. The experiment results indicated that HU-MCT TDC developed in this study was useful for improving the linearity of the TDC, which allowed for high timing resolution to be achieved.

• Journal of information and communication convergence engineering
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• 제5권2호
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• pp.112-115
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• 2007

A CMOS TDC(time-to-digital converter) is proposed which has a simple cyclic structure. The proposed TDC consists of pulse-shrinking elements, D latches and D flip-flops. The operation is based on pulse-shrinking of the input pulse. The resolution of digital output can be easily improved by increasing the number of the pulse-shrinking elements, D latches and D flip flops. The TDC performance is improved in viewpoints of power consumption and chip area. Simulation results are shown to illustrate the performance of the proposed TDC circuit.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2008년도 하계종합학술대회
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• pp.587-588
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• 2008

Digital PLL을 위한 높은 해상도를 갖는 TDC(Time to Digital Converter)를 $0.18{\mu}m$ CMOS 공정으로 설계하였다. 2단 구조를 갖는 TDC를 제안하였고 이를 Cadence Spectre를 이용하여 검증하였다. TDC는 Difference pulse generator, coarse 변환기와 fine 변환기로 구성된다. 그리고, 2단 변환기와 Thermometer decoder를 이용하여 delay cell의 수를 적게 유지하면서도 높은 해상도를 얻을 수 있었다.

• 전자공학회논문지
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• 제52권2호
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• pp.195-200
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• 2015

본 논문에서는 ADPLL의 잡음 개선을 위해 8비트 SVBS-TDC (Semi-Vernier Binary-Search Time-to-Digital Converter)를 제안했다. TDC의 동작 속도를 높이기 위해 인코더 등 디지털 블록을 사용하지 않는 BS-TDC (Binary-Search TDC) 구조를 사용했으며, 버니어 구조를 적용하여 기존의 BS-TDC에 비해 해상도를 10배 이상 증가시켰다. TDC의 단점인 좁은 입력범위를 개선하기 위해 버니어 구조를 절반만 적용하여 510ps의 넓은 입력 범위를 확보했다. 제안하는 SVBS-TDC는 65nm CMOS 공정으로 설계하였고, 모의실험 결과 1.2V 전원 전압에서 동작 속도는 200MHz이고 해상도는 4ps로서 ADPLL의 잡음 특성을 효과적으로 개선함을 확인하였다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제15권3호
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• pp.334-341
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• 2015

This research outlines the design of a HR-TDC (High Resolution Time-to-Digital Converter) for high data rate communication systems using a $0.18{\mu}m$ CMOS process. The coarse-fine architecture has been adopted to improve the resolution of the TDC. A two-stage vernier time amplifier (2S-VTA) was used to amplify the time residue, and the gain of the 2S-VTA was larger than 64. The error during time amplification was compensated using two FTDCs (Fine-TDC) with their outputs. The resolution of the HR-TDC was 0.15 ps with a 12-bit output and the power consumption was 4.32 mW with a 1.8-V supply voltage.

• 전기전자학회논문지
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• 제8권2호
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• pp.166-171
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• 2004

본 논문은 두 신호의 시간 차이를 디지털 신호로 변환하는 시간디지털변환기(Time to Digital Converter) 변환기에 대해서 서술하였다. 시간 차이를 측정하는 방법에는 여러 가지가 있으나 변환시간이나 저해상도의 단점을 가지고 있으며 또한 복잡한 구조를 가지는 문제점이 있다. 그러나 본 논문에서 제안한 시간디지털변환기회로는 고속 디지털 샘플러를 사용함으로써 단순한 구조로 높은 해상도(25ps)를 실현할 수 있었다. 입력신호가 시간디지털변환기의 입력으로 들어오면 샘플러가 신호를 검출해내고 레지스터에 의해 처리된 후 코딩블럭에 의해서 코딩되게 된다. 또한 25ps의 해상도를 얻기 위해서 본 논문에서는 다중위상클록발생기를 구현하였다.