• Journal of the Korean Data and Information Science Society
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• v.5 no.2
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• pp.87-94
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• 1994

In this paper, we consider optimum plan to determine stress change times under the three-step stress PALTs, assuming that each test units follows an exponential distribution. The tampered random variable(TRV) model for the three-step stress PALTs setup are introduced, and maximum likelihood estimators(MLEs) of the failure rate and the acceleration factors are obtained. The change times to minimize the generalized asymptotic variance(GAVR) of MLEs of the failure rate and the acceleration factors are proposed for the three-step stress PALTs.

• International Journal of Reliability and Applications
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• v.1 no.2
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• pp.155-165
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• 2000

In this paper, we propose some estimators of Kullback- Leibler Information functions using the data from three step stress accelerated life tests. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

• Journal of the Korean Data and Information Science Society
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• v.14 no.4
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• pp.951-963
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• 2003

In this paper, we propose goodness of fit test statistics based on the estimated Kullback-Leibler information functions using the data from three step stress accelerated life test. This acceleration model is assumed to be a tampered random variable model. The power of the proposed test under various alternatives is compared with Kolmogorov-Smirnov statistic, Cramer-von Mises statistic and Anderson-Darling statistic.

• Journal of the Korean Data and Information Science Society
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• v.17 no.4
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• pp.1375-1386
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• 2006

In life testing, the lifetimes of test units under the usual conditions are so long that life testing at usual conditions is impractical. Testing units are subjected to conditions of high stress to yield informations quickly. In this paper, the inferences of parameters on the three step-stress accelerated life testing are studied. The two-parameter exponential distribution with a failure rate function that a log-quadratic function of stress and the tempered failure rate model are considered. We obtain the maximum likelihood estimators of the model parameters and their confidence regions. A numerical example will be given to illustrate the proposed inferential procedures.

• Journal of the Korean Data and Information Science Society
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• v.23 no.4
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• pp.843-850
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• 2012

The inferences of data obtained from periodic inspection and type I censoring for the three step stress accelerated life test are studied in this paper. The failure rate function that a log-quadratic relation of stress and the tampered failure rate model are considered under the exponential distribution. The optimal stress change times which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined and the maximum likelihood estimators of the model parameters are estimated. A numerical example will be given to illustrate the proposed inferential procedures.

• Proceedings of the KSME Conference
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• 2000.04a
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• pp.854-859
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• 2000

When the round bar with step is twisted and bent, stress concentration is occurred in the irregular geometric parts. Two dimensional axisymmetric stress analysis is carried out according to the geometric change of the stress-concentrated part of round bar with step. Three dimensional cases are also investigated.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.271-280
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• 2015

In this paper, the maximum likelihood estimators for parameters are derived under three step-stress accelerated life tests for Type-I hybrid censored data. The exponential distribution and the cumulative exposure model are considered based on the assumption that a log quadratic relationship exits between stress and the mean lifetime ${\theta}$. The test plan to search optimal stress change times minimizing the asymptotic variance of maximum likelihood estimators are presented. A numerical example to illustrate the proposed inferential procedures and some simulation results to investigate the sensitivity of the optimal stress change times by the guessed parameters are given.

• Journal of the Korean Statistical Society
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• v.28 no.4
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• pp.415-433
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• 1999

This paper considers the design of step-stress accelerated life tests for the Weibull distribution with a nonconstant shape parameter under Type I censoring. It is assumed that scale and shape parameters are log-linear functions of (possibly transformed) stress and that a cumulative exposure model holds for the effect of changing stress. The asymptotic variance of the maximum likelihood estimator of a stated quantile at design stress is used as an optimality criterion. The optimum three step-stress plans are presented for selected values of design parameters and the effects of errors in pre- estimates of the design parameters are investigated.

• Journal of the Korean Data and Information Science Society
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• v.7 no.2
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• pp.295-299
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• 1996

In this paper, optimal change times are determined for fully three-step stress accelerated life tests, which minimize the asymptotic variance for maximum likelihood estimator of logarithm of the failure rate at the usual condition and exponential distribution is given for life time data.

• Journal of Power Electronics
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• v.16 no.5
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• pp.1861-1868
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• 2016

In this paper, a three-phase AC-DC high step-up converter is developed for application to microscale wind-power generation systems. Such an AC-DC boost converter prossessess the property of the single-switch high step-up DC-DC structure. For power factor correction, the advanced half-stage converter is operated under the discontinuous conduction mode (DCM). Simulatanously, to achieve a high step-up voltage gain, the back half-stage functions in the continuous conduction mode (CCM). A high voltage gain can be obtained by use of an output-capacitor mass and a coupled inductor. Compared to the output voltage, the voltage stress is decreased on the switch. To lessen the conducting losses, a low rated voltage and small conductive resistance MOSFETs are adopted. In addition, the coupled inductor retrieves the leakage-inductor energy. The operation principle and steady-state behavior are analyzed, and a prototype hardware circuit is realized to verify the performance of the proposed converter.