• Communications for Statistical Applications and Methods
• /
• v.11 no.3
• /
• pp.619-629
• /
• 2004

Binomial group testing or composite sampling is often used to estimate the proportion, p, of positive(infects, defectives) in a population when that proportion is known to be small; the potential benefits of group testing over one-at-a-time testing are well documented. The literature has focused on maximum likelihood estimation. We provide two Bayes estimators and compare them with the MLE. The first of our Bayes estimators uses an uninformative Uniform (0, 1) prior on p; the properties of this estimator are poor. Our second Bayes estimator uses a much more informative prior that recognizes and takes into account key aspects of the group testing context. This estimator compares very favorably with the MSE, having substantially lower mean squared errors in all of the wide range of cases we considered. The priors uses a Beta distribution, Beta ($\alpha$, $\beta$), and some advice is provided for choosing the parameter a and $\beta$ for that distribution.

• Journal of Digital Convergence
• /
• v.12 no.1
• /
• pp.371-377
• /
• 2014

Software quality is very important in software. We think, software testing is very important in point of functionality, usability. But, we have to consider about all of the software quality. We change our thinking about software quality from time to time. In this paper, we try to the best to find important factors by the number of testing dates and the number of testing in point of functionality, usability, reliability, efficiency, portability, maintainability. We study the mean of the number of faults according to products. We find the difference the number of errors by sex of tester.

• Journal of the Korean Society for Heat Treatment
• /
• v.24 no.6
• /
• pp.311-317
• /
• 2011

The effect of strain rate on the yield stress of an Al-Li alloy has been investigated at temperatures between 77 and 523 K and over the strain rate range from $1.77{\times}10^{-4}s^{-1}$ to $1.77{\times}10^{-2}s^{-1}$. At testing temperatures below 373 K, the yield stress is almost independent of strain rate at any aging stage. At testing temperatures above 373 K, the yield stress increases linearly with the logarithm of strain rate, and the strain rate dependence increases with increasing testing temperature. The yield stresses of under-aged alloy at temperatures between 373 and 473 K at high strain rates are greater than the yield stress at 77 K. For the alloy under-aged or aged nearly to its peak strength, the temperature range within which the positive temperature dependence of yield stress appears expands to the higher temperature side with increasing strain rate. The strain rate dependence of the yield stress is slightly negative at this aging stage. The yield stress of the over-aged alloy decreases monotonically with decreasing strain rate and with increasing testing temperature above 373 K. The modulus normalized yield stress is nearly constant at testing temperatures below 373 K at any strain rate investigated. And, strength depends largely both on the aging conditions and on the testing temperature. The peak positions in strength vs. aging time curves shift to the side of shorter aging time with increasing testing temperature. For the specimens aged nearly to the peak strength, the positive temperature dependence of yield stress is observed in the temperature range. The shift of peak positions in the aging curves are explained in terms of the positive temperature dependence of cutting stress and the negative temperature dependence of by-passing stress.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.46 no.5
• /
• pp.1-8
• /
• 2009

Since scan based testing is very efficient and widely used for testing large sequential circuits. However, since test patterns are serially injected through long scan chains, scan based testing requires very long test application time. Also, compared to the normal operations, scan shifting operations drastically increase power consumption. In order to solve these problems, this paper presents a new scan architecture for both test application time and test power reduction. The proposed scan architecture partitions scan chains into several segments and bypasses some segments which do not include any specified bit. Since bypassed segments are excluded from the scan shifting operation, the test application time and test power can be significantly reduced.

• Journal of the Korean Society for Nondestructive Testing
• /
• v.28 no.1
• /
• pp.59-63
• /
• 2008

Time reversal (TR) of nondispersive body waves has been used in many applications including ultrasonic NDE. However, the study of the TR method for Lamb waves on thin structures is not well established. In this paper, the full reconstruction of the input signal is investigated for dispersive Lamb waves by introducing a time reversal operator based on the Mindlin plate theory. A broadband and a narrowband input waveform are employed to reconstruct the $A_0$ mode of Lamb wave propagations. Due to the frequency dependence of the TR process of Lamb waves, different frequency components of the broadband excitation are scaled differently during the time reversal process and the original input signal cannot be fully restored. This is the primary reason for using a narrowband excitation to enhance the flaw detectability.

• Journal of the Korean Statistical Society
• /
• v.30 no.3
• /
• pp.511-527
• /
• 2001

This paper consider the testing problem of variance component for the unbalanced tow=-way error component model. We provide a conditional LM test statistic for testing zero individual(time) effects assuming that the other time-specific(individual)efefcts are present. This test is extension of Baltagi, Chang and Li(1998, 1992). Monte Carlo experiments are conducted to study the performance of this LM test.

• Journal of Korean Society for Quality Management
• /
• v.32 no.4
• /
• pp.242-251
• /
• 2004

Several statistical methods are introduced 1=o analyze the accelerated failure time data. Most frequently used method is the log-linear approach with parametric assumption. Since the accelerated failure time experiments are exposed to many environmental restrictions, parametric log-linear relationship might not be working properly to analyze the resulting data. The models proposed by Buckley and James(1979) and Stute(1993) could be useful in the situation where parametric log-linear method could not be applicable. Those methods are introduced in accelerated experimental situation under the thermal acceleration and discussed through an illustrated example.

• 한국데이터정보과학회:학술대회논문집
• /
• 2005.10a
• /
• pp.135-138
• /
• 2005

In this paper, we consider the problem of testing for parameter change in time series models based on a cusum of squares. Although the test procedure is well-established for the mean and variance in time series models, a general parameter case was not discussed in literatures. Therefore, here we develop the cusum of squares type test for parameter change in a more general framework. As an example, we consider the change of the parameters in an RCA(1) model. Simulation results are reported for illustration.

• Journal of the Korean Society for Nondestructive Testing
• /
• v.3 no.1
• /
• pp.5-11
• /
• 1983

The impulse response function are studied using time domain Born approximation in two cases; firstly when the material parameters of a flaw are constant, secondly when the parameters are varying with positions. From the impulse response functions, characteristics can be learned about a flaw with high symmetry.

• Journal of Applied Reliability
• /
• v.5 no.1
• /
• pp.167-180
• /
• 2005

Design of a degradation test without replacement is considered based on tightened critical value to reduce the evaluation testing time. The sample size, number of inspections, and the critical values are determined to assure the same probability of acceptance when the testing time is reduced to some degree. Photo-diode balance of an optical pickup is analyzed as a case study.