Design of Degradation Test without Replacement Based on Tightened Critical Value

엄격한 고장판정기준을 적용한 비복원 열화시험 설계에 관한 연구

  • Park Boo Hee (Department of Industrial Engineering, Ajou University) ;
  • Lim Ho Kyung (Department of Industrial Engineering, Ajou University) ;
  • Jang Joong Soon (Department of Industrial Engineering, Ajou University)
  • 박부희 (아주대학교 공과대학 산업공학과) ;
  • 임호경 (아주대학교 공과대학 산업공학과) ;
  • 장중순 (아주대학교 공과대학 산업공학과)
  • Published : 2005.03.01

Abstract

Design of a degradation test without replacement is considered based on tightened critical value to reduce the evaluation testing time. The sample size, number of inspections, and the critical values are determined to assure the same probability of acceptance when the testing time is reduced to some degree. Photo-diode balance of an optical pickup is analyzed as a case study.

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