• The Journal of Information Technology
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• v.10 no.2
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• pp.47-64
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• 2007

Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require quantification of a critical element of the software testing process : test coverage. This model called enhanced non-homogeneous poission process(ENHPP). In this paper, exponential coverage and S-coverage model was reviewed, proposes the exponentiated exponential coverage reliability model, which maked out efficiency substituted for gamma and Weibull model(2 parameter shape illustrated by Gupta and Kundu(2001). In this analysis of software failure data, algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics for the sake of efficient model, was employed.

• Journal of Radiation Protection and Research
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• v.26 no.3
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• pp.177-181
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• 2001

The conversion efficiency of a cesium iodine coated micro-channel plate is studied. We use the EGS4 code to transport photons and generated electrons until their energies become less than 1keV and 10keV respectively. Among the generated electrons, the emission from the secondary electrons located within the escape depth of 56nm from the photo-converter boundary is estimated by integrating the product of the secondary electrons with a probability depending only on their geometric locations. The secondary electron emission from the generated electrons of energy higher than 100eV is estimated by the 'universal yield curve'. The sum of these provides an estimate for the secondary electron yield and we show that results of applying this algorithm agree with known experimental results. Using this algorithm, we computed secondary electron emissions from a micro-channel plate used in a gas electron multiplier detector that is currently being developed at Korea Atomic Energy Research Institute.

• Journal of applied mathematics & informatics
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• v.26 no.5_6
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• pp.973-981
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• 2008

In this paper we focus on a type of Unimodular polynomial pair used for digital systems and present some new properties of them which lead us to estimation of their autocorrelation coefficients and the moments of a Rudin-Shapiro polynomial product. Some new results on the Rudin-shapiro sequences will be presented in the last section. Main Facts: For positive integers M and n with $M\;<\;2^n$ - 1, consider the $2^n$ - M numbers ${\epsilon}_k$ ($M\;{\leq}\;k\;{\leq}\;2^n$ - 1) which form a collection of Rudin-Shapiro coefficients. We verify that $|{\sum}_{k=M}^{2^{n-1}}\;{{\epsilon}_k}e^{ikt}|$ is dominated by $(2+\sqrt{2})\;\sqrt {2^n-M}-{\sqrt{2}}$.

• Proceedings of the Korean Society of Marine Engineers Conference
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• 2002.05a
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• pp.273-277
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• 2002

This paper describes an optimal synthesis method of binary neural network(BNN) for an approximation problem of a circular region and synthetic image having four class using a newly proposed learning algorithm. Our object is to minimize the number of connections and neurons in hidden layer by using a Newly Expanded and Truncated Learning Algorithm(NETLA) based on the multilayer BNN. The synthesis method in the NETLA is based on the extension principle of Expanded and Truncated Learning (ETL) learning algorithm using the multilayer perceptron and is based on Expanded Sum of Product (ESP) as one of the boolean expression techniques. The number of the required neurons in hidden layer can be reduced and fasted for learning pattern recognition.. The superiority of this NETLA to other algorithms was proved by simulation.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.5
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• pp.31-41
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• 1995

In this paper, the relationship between k consecutive outputs of the conventional differential detector and output of differential detector with k-symbol periods delay for differential MSK and GMSK systems is investigated. It is hown that there exists periodity in modulo-2 sum and product of k successive outputs of the conventional differential detector with the output of a detector with k-symbol periods delay circuit. This relationships are used to achieve performance gains over conventional differential detection. The error rate performance of the method is carried out by computer simulation and performance improvement is achieved for differential MSK and GMSK systems.

• Korean Journal of Mathematics
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• v.21 no.4
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• pp.463-471
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• 2013

Let R be a ring with identity 1, $I(R){\neq}\{0\}$ be the set of all nonunit idempotents in R, and M(R) be the set of all primitive idempotents and 0 of R. We say that I(R) is additive if for all e, $f{\in}I(R)$ ($e{\neq}f$), $e+f{\in}I(R)$. In this paper, the following are shown: (1) I(R) is a finite additive set if and only if $M(R){\backslash}\{0\}$ is a complete set of primitive central idempotents, char(R) = 2 and every nonzero idempotent of R can be expressed as a sum of orthogonal primitive idempotents of R; (2) for a regular ring R such that I(R) is a finite additive set, if the multiplicative group of all units of R is abelian (resp. cyclic), then R is a commutative ring (resp. R is a finite direct product of finite field).

• Management Science and Financial Engineering
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• v.11 no.1
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• pp.63-78
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• 2005

Disassembly scheduling is the problem of determining the ordering and disassembly schedules of used or end-of-life products while satisfying the demand of their parts or components over a certain planning horizon. This paper considers the case of the assembly product structure for the cost-based objective of minimizing the sum of purchase, setup, inventory holding, and disassembly operation costs. To represent and solve the problem optimally, this paper presents an integer programming model, which is a reversed form of the multi-level lot sizing formulation. Computational experiments on an example derived from the literature and a number of randomly generated test problems are done and the results are reported.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.11a
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• pp.444-449
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• 1996

The semiconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip affect on the functions of the semiconductors. The defects of the chip surface are cracks or voids. As general inspection method requires many inspection procedure, the inspection system which searches immediately and precisely the defects of the semiconductor chip surface is required. We suggest the detection algorithm for inspecting the surface defects of the semiconductor surface. The proposed algorithm first regards the semiconductor surface as random texture and point spread function, and secondly presents the character of texture by linear estimation theorem. This paper assumes that the gray level of each pixel of an image is estimated from a weighted sum of gray levels of its neighbor pixels by linear estimation theorem. The weight coefficients are determined so that the mean square error is minimized. The obtained estimation window(two-dimensional estimation window) characterizes the surface texture of semiconductor and is used to discriminate the defects of semiconductor surface.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.35 no.3
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• pp.129-135
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• 2012

Companies strive for quality improvement and use process data obtained through measurement process to monitor and control the process. Measurement data contain variation due to error of operator and instrument. The total variation is sum of product variation and measurement variation. Gage R&R is for repeatability and reproducibility of measurement system. Gage R&R study is usually conducted to analyze the measurement process. In performing the gage R&R study, several parameters such as the appropriate number of operators (o), sample size of parts (p), and replicate (r) are used. In this paper we propose how to determine the optimal combination of number of operators (o), sample size of parts (p), and replicates (r) considering measurement time and cost by statistical method.

• Proceedings of the Korean Operations and Management Science Society Conference
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• 2002.05a
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• pp.686-692
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• 2002

Disassembly scheduling is the problem of determining the ordering and disassembly schedules of used products while satisfying the demand of their parts of components over a certain planning horizon. The objective is to minimize the sum of purchase, setup, disassembly operation and inventory holding costs. This paper considers products with assembly structure, i.e. products without parts commonality, and suggests a heuristic in which an initial solution is obtained in the form of the minimal latest disassembly schedule, and then improved considering trade-offs among different cost factors. To show the performance of the heuristic suggested in this paper, computational experiments were done on the modified existing examples and the results show that the heuristic can give optimal of very near optimal solutions within very short computation times.