• ETRI Journal
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• v.25 no.5
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• pp.321-327
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• 2003

Testing time and power consumption during the testing of SoCs are becoming increasingly important with an increasing volume of test data in intellectual property cores in SoCs. This paper presents a new algorithm to reduce the scan-in power and test data volume using a modified scan latch reordering algorithm. We apply a scan latch reordering technique to minimize the column hamming distance in scan vectors. During scan latch reordering, the don't-care inputs in the scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.11
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• pp.109-118
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• 2007

As the integration density and the operating speed of System on Chips (SoCs) become increasingly high, it is crucial to test delay defects on the SoCs. This paper introduces an enhanced IEEE 1500 wrapper cell architecture and IEEE 1149.1 TAP controller for the wrapper interface logic, and proposes a transition delay fault test method. The method proposed can detect slow-to-rise and slow-to-fall faults sequentially with low area overhead and short test time. and simultaneously test IEEE 1500 wrapped cores operating at different core clocks.

• Journal of information and communication convergence engineering
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• v.6 no.4
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• pp.376-382
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• 2008

Developing highly cost-efficient and reliable embedded systems demands hardware/software co-design and co-simulation due to fast TTM and verification issues. So, it is essential that Platform-Based SoC design methodology be used for enhanced reusability. This paper addresses a reusable SoC platform based on OpenCores soft processor with reconfigurable architectures for hardware/software codesign methodology. The platform includes a OpenRISC microprocessor, some basic peripherals and WISHBONE bus and it uses the set of development environment including compiler, assembler, and debugger. The platform is very flexible due to easy configuration through a system configuration file and is reliable because all designed SoC and IPs are verified in the various test environments. Also the platform is prototyped using the Xilinx Spartan3 FPGA development board and is implemented to a single chip using the Magnachip cell library based on $0.18{\mu}m$ 1-poly 6-metal technology.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2003.10a
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• pp.990-994
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• 2003

This paper describes the VoIP(Voice over Internet Protocol) SoC(System on Chip) Design and the test board development for the function verification to support voice communication services using Internet. To implement the simple system of configuration, we designed the VoIP SoC which have ARM922T of 32bit microprocessor, IP network interface, voice signal interface, various user interface function. Also we developed test program and communication protocol to verify the function of this chip. We used several tools of design and simulation, developed and tested a test board with Excalibur which includes ARM922T microprocessor and FPGA.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.5
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• pp.54-64
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• 2002

Recently System On a Chip(SoC) design based on IP cores has become the trend of If design To prevent the testing problem from becoming the bottleneck of the core-based design, defining of an efficient test architecture and a successful test methodology are mandatory. This paper describes a test architecture and a test control access mechanism for SoC based on IEEE 1149.1 boundary,scan. The proposed SoC test architecture is fully compatible with IEEE P1500 Standard for Embedded Core Test(SECT), and applicable for both TAPed cores and Wrapped cores within a SOC with the same test access mechanism. Controlled by TCK, TMS, TDI, and TDO, the proposed test architecture provides a hierarchical test feature.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.257-263
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• 2002

Test scheduling of SoC becomes more important because it is one of the prime methods to minimize the testing time under limited power consumption of SoCs. In this paper, a heuristic algorithm, in which test resources are selected for groups and arranged based on the size of product of power dissipation and test time together with total power consumption in core-based SoCs is proposed. We select test resource groups which has maximum power consumption but does not exceed the constrained power consumption and make the testing time slot of resources in the test resource group to be aligned at the initial position to minimize the idle test time of test resources.

• JSTS:Journal of Semiconductor Technology and Science
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• v.5 no.4
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• pp.229-236
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• 2005

This paper presents a system level architecture evaluation technique that leverages transaction level modeling but also significantly extends it to the realm of system level performance evaluation. A major issue lies with the modeling effort. To reduce the modeling effort the proposed technique develops the concept of worst case scenarios. Since the memory controller is often found to be an important component that critically affects the system performance and thus needs optimization, the paper further addresses how to evaluate and optimize the memory controllers, focusing on the test environment and the methodology. The paper also presents an industrial case study using a real state-of-the-art design. In the case study, it is reported that the proposed technique has helped successfully find the performance bottleneck and provide appropriate feedback on time.

• Advances in aircraft and spacecraft science
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• v.7 no.1
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• pp.79-90
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• 2020

The dynamic coupling between shaker and test-article has been investigated by recent research through the so called Virtual Shaker Testing (VST) approach. Basically a VST model includes the mathematical models of the test-item, of the shaker body, of the seismic mass and the facility vibration control algorithm. The subsequent coupled dynamic simulation even if more complex than the classical hard-mounted sine test-prediction, is a closer representation of the reality and is expected to be more accurate. One of the most remarkable benefits of VST is the accurate quantification of the frequency down-shift (with respect to the hard-mounted value), typically affecting the first lateral resonance of heavy test-items, like medium or large size Spacecraft (S/Cs), once mounted on the shaker. In this work, starting from previous successful VST experiences, the parameters having impact on the frequency shift are identified and discussed one by one. A simplified analytical system is thus defined to propose an efficient and effective way of calculating the lower bound frequency shift through a simple equation. Such equation can be useful to correct the S/C lateral natural frequency measured during the test, in order to remove the contribution attributable to the shaker in use. The so-corrected frequency value becomes relevant when verifying the compliance of the S/C w.r.t. the frequency requirement from the Launcher Authority. Moreover, it allows to perform a consistent post-test correlation of the first lateral natural frequency of S/C FE model.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.2
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• pp.61-68
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• 2008

This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• v.9 no.1
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• pp.995-998
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• 2005

This paper proposes a new SoC (System-on-Chip)-based automatic compensation circuit (ACC) for 5GHz low noise amplifier (LNA). This circuit is extremely useful for today's RF IC (Radio Frequency Integrated Circuit) devices in a complete RF transceiver environment. The circuit contains RF BIST (Built-ln Self-Test) circuit, Capacitor Mirror Banks (CMB) and digital processing unit (DPU). The ACC automatically adjusts performance of 5GHz LNA by the processor in the SoC transceiver when the LNA goes out of the normal range of operation.