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Efficient AMBA Based System-on-a-chip Core Test With IEEE 1500 Wrapper  

Yi, Hyun-Bean (Department of Computer Science & Engineering, Hanyang University)
Han, Ju-Hee (Department of Computer Science & Engineering, Hanyang University)
Kim, Byeong-Jin (Department of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Department of Computer Science & Engineering, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.45, no.2, 2008 , pp. 61-68 More about this Journal
Abstract
This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.
Keywords
AMBA; IEEE 1500; System-on-Chip Test; Scan Test;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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