• 대한전자공학회논문지SD
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• 제44권7호통권361호
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• pp.9-15
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• 2007

본 논문에서는 UHF 대역 수동 RFID 태그(UHF-band passive RFID tag) 칩 제작에 필수적인 요소인 쇼트키(Schottky) 다이오드를 CMOS 공정으로 제작하고 크기에 따른 특성을 분석하였으며 이를 이용하여 전압체배기를 설계하였다. 쇼트키 다이오드는 Titanium-Silicon 접합을 이용하여 제작되었으며, $4{\times}10{\times}10\;{\mu}m^{2}$의 면적을 가지는 쇼트키 다이오드는 $20\;{\mu}A$의 전류 구동에 대해 약 0.15 V의 순방향 전압 강하의 우수한 특성을 나타내었다. 역방향 파괴전압(breakdown)은 약 -9 V로 수동 RFID 태그칩의 전압체배기에 사용될 수 있는 충분한 값을 나타내었다. 제작된 쇼트키 다이오드의 소신호 등가모델을 이용하여 다이오드의 크기에 따른 순방향 전압강하와 입력 임피던스간의 trade-off에 대해 분석하였다. 이를 이용하여 제작된 6-단 전압체배기는 900 MHz 주파수, 200mV 최대 입력 전압에 대해 1.3 V이상의 출력 전압 특성을 나타내어 인식거리가 비교적 큰 수동형 태그에 적합한 특성을 나타내었다.

• Transactions on Electrical and Electronic Materials
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• 제15권6호
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• pp.324-327
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• 2014

Germanium (Ge) is a promising material for next generation nanoelectronics and multiple junction solar cells. This work investigated the electrical properties in Cu/p-type Ge Schottky diodes, using current-voltage (I-V) measurements. The Schottky barrier heights were 0.66, 0.59, and 0.70 eV from the forward ln(I)-V, Cheung, and Norde methods, respectively. The ideality factors were 1.92 and 1.78 from the forward ln(I)-V method and Cheung method, respectively. Such high ideality factor could be associated with the presence of an interfacial layer and interface states at the Cu/p-Ge interface. The reverse-biased current transport was dominated by the Poole-Frenkel emission rather than the Schottky emission.

• Journal of Electrical Engineering and Technology
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• 제10권6호
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• pp.2343-2347
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• 2015

This paper reports the effect of Titanium dioxide (TiO₂) nanoparticles on a TiO₂ sol-gel Schottky diode. TiO₂ nanoparticles were blended with TiO₂ sol-gel to fabricate the Schottky diode. TiO₂ nanoparticles showed strong anatase and rutile X-ray diffraction peaks. However, the mixture of TiO₂ sol-gel and TiO₂ nanoparticles exhibited no anatase and rutile peaks. The forward current of the Schottky diode drastically increased as the concentration of TiO₂ nanoparticles increased up to 10 wt. % and decreased after that. The possible conduction mechanism is more likely space charge limited conduction.

• 전자공학회논문지 IE
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• 제46권3호
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• pp.1-5
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• 2009

고전력, 고온에서 사용되는 소자에서 RuO2는 다른 전극 물질에 비해 많은 장점을 가지고 있으며, 특히 GaN를 이용하는 소자의 전극물질로서 매우 우수한 특성을 갖음을 확인할 수 있었다. RuO2을 이용한 GaN 소자의 제작은 새로운 전기화학 금속증착법을 통하여 금속배선을 형성하였으며, 과염소산(HClO4)용액을 수용액 사용하였다. RuO2의 두께는 인가전압과 시간에 의존하며, 두께를 조절함으로서 정류성 및 비정류성 소자의 전극으로의 사용 가능성을 확인할 수 있었다.

• 한국전기전자재료학회논문지
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• 제13권5호
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• pp.365-370
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• 2000

Schottky contacts on n-In$\_$0.53//Ga$\_$0.47//As have been made by metal deposition on substrates cooled to a temperature of 77K. The current-voltage and capacitance-voltage characteristics showed that the Schottky diodes formed at low temperature had a much improved barrier height compared to those formed at room temperature. The Schottky barrier height ø$\_$B/ was found to be increased from 0.2eV to 0.6eV with Ag metal. The saturation current density of the low temperature diode was about 4 orders smaller than for the room temperature diode. A current transport mechanism dominated by thermionic emission over the barrier for the low temperature diode was found from current-voltage-temperature measurement. Deep level transient spectroscopy studies exhibited a bulk electron trap at E$\_$c/-0.23eV. The low temperature process appears to reduce metal induced surface damage and may form an MIS (metal-insulator-semiconductor)-like structure at the interface.

• 센서학회지
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• 제18권3호
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• pp.222-225
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• 2009

This paper describes the fabrication and characteristics of Schottky micro hydrogen sensors for high temperatures by using polycrystalline(poly) 3C-SiC thin films grown on Si substrates with thermal oxide layer using APCVD. Pd/poly 3C-SiC Schottky diodes were made and evaluated by I-V and C-V measurements. Electric current density and barrier height voltage were $2{\times}10^{-3}A/cm^2$ and 0.58 eV, respectively. These devices could operate stably at about 400 $^{\circ}$. The characteristics of implemented sensors have been investigated in terms of sensitivity, linearity of response, response rate, and response time. Therefore, from these results, Pd/poly 3C-SiC Schottky devices have very high potential for high temperature $H_2$ sensor applications.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.390-390
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• 2010

We fabricate Schottky diodes with the contact between a sol-gel derived ZnO layer and Au that guarantees the expected Schottky contact due to the high work function. The formed single metal Schottky barrier shows characteristics comparable to the barrier formed by alloys. Au is deposited by thermal evaporation on a ZnO thin film that is optimally formed under sol-gel process conditions of a 1-mol zinc acetate concentration and a 3000-rpm coating speed. Possible defects. which can provide deleterious current paths. are minimized by patterning the deposited Au. The I-V curve verifies the formation of a Schottky contact. Measurements showed that the Schottky barrier height and leakage current at -5 V were 0.6 eV and $1{\times}10^{-12}A$. respectively.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.310.1-310.1
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• 2013

We show the novel hot electron based-solar energy conversion using tandem structured Schottky diode with double Schottky barriers. In this report, we show the effect of the double Schottky barriers on solar cell performance by enhancing both of internal photoemission and band-to-band excitation. The tandem structured Au/Si diode capped with TiO2 layer as second semiconductor exhibited improved ability for light harvesting. The proposed mechanisms consist of multiple reflections of hot electrons and additional pathway of solar energy conversion due to presence of multiple interfaces between thin gold film and semiconductors. Short-circuit photocurrent measured on the tandem structured Au/Si diodes under illumination of AM1.5 increased by approximately 70% from 3.1% to 5.3% and overall incident photon to electron conversion efficiency (IPCE) was enhanced in visible light, revealing that the concept of the double Schottky barriers have significant potential as novel strategy for light harvesting.

• 센서학회지
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• 제14권2호
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• pp.96-100
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• 2005

The planar Schottky diodes were fabricated and modeled to probe the device applicability of the cracked GaN epitaxial layer on a (111) silicon substrate. On the unintentionally n-doped GaN grown on silicon, we deposited Ti/Al/Ni/Au as the ohmic metal and Pt as the Schottky metal. The ohmic contact achieved a minimum contact resistivity of $5.51{\times}10.5{\Omega}{\cdot}cm^{2}$ after annealing in an $N_{2}$ ambient at $700^{\circ}C$ for 30 sec. The fabricated Schottky diode exhibited the barrier height of 0.7 eV and the ideality factor was 2.4, which are significantly lower than those parameters of crack free one. But in photoresponse measurement, the diode showed the peak responsivity of 0.097 A/W at 300 nm, the cutoff at 360 nm, and UV/visible rejection ratio of about $10^{2}$. The SPICE(Simulation Program with Integrated Circuit Emphasis) simulation with a proposed model, which was composed with one Pt/GaN diode and three parasitic diodes, showed good agreement with the experiment.

• 대한전자공학회논문지
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• 제20권3호
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• pp.33-39
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• 1983

종래의 쇼트키 다이오드들이 가지는 금속중첩 및 P보호환 구조와 비교하여 금속-반도체 접합면 가장자리에 얇은 계단형 산화막(약1000Å) 구조를 갖는 새로운 소자들을 설계 제작하였다. 별은 계단형 산화막의 형성은 T.C.E. 산화공정으로 처리하였으며 이러한 새로운 소자들의 항복현상을 비교 검토하기 위하여 이들과 함께 동일한 소자 크기를 갖는 종래의 금속 중첩 쇼트키 다이오드와 P보호환 쇼트키 다이오드를 같은 폐이퍼상에 집적시켰고 항복전압에 대한 측정을 통해 고찰해 본 결과 금속-반도체 접합면 가장자리에 얇은 계단형 산화막 구조를 갖는 소자들은 종래의 쇼트키 다이오드들에 비해 항복현상에 있어서 월등한 개선을 보여 주는 것으로 나타났다.