• Title/Summary/Keyword: RF Modeling

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A Simple and Accurate Parameter Extraction Method for Substrate Modeling of RF MOSFET (간단하고 정확한 RF MOSFET의 기판효과 모델링과 파라미터 추출방법)

  • 심용석;양진모
    • Proceedings of the Korea Society for Industrial Systems Conference
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    • 2002.11a
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    • pp.363-370
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    • 2002
  • A substrate network model characterizing substrate effect of submicron MOS transistors for RF operation and its parameter extraction with physically meaningful values are presented. The proposed substrate network model includes a single resistance and inductance originated from ring-type substrate contacts around active devices. Model parameters are extracted from S-parameter data measured from common-bulk configured MOS transistors with floating gate and use where needed with out any optimization. The proposed modeling technique has been applied to various-sized MOS transistors. Excellent agreement the measurement data and the simulation results using extracted substrate network model up to 30㎓

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Characterization of high performance CNT-based TSV for high-frequency RF applications

  • Kannan, Sukeshwar;Kim, Bruce;Gupta, Anurag;Noh, Seok-Ho;Li, Li
    • Advances in materials Research
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    • v.1 no.1
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    • pp.37-49
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    • 2012
  • In this paper, we present modeling and characterization of CNT-based TSVs to be used in high-frequency RF applications. We have developed an integrated model of CNT-based TSVs by incorporating the quantum confinement effects of CNTs with the kinetic inductance phenomenon at high frequencies. Substrate parasitics have been appropriately modeled as a monolithic microwave capacitor with the resonant line technique using a two-polynomial equation. Different parametric variations in the model have been outlined as case studies. Furthermore, electrical performance and signal integrity analysis on different cases have been used to determine the optimized configuration for CNT-based TSVs for high frequency RF applications.

Neural Network Modeling of Memory Effects in RF Power Amplifier Using Two-tone Input Signals (Two-Tone 입력을 이용한 RF 전력증폭기 메모리 특성의 신경망 모델링)

  • Hwangbo Hoon;Kim Won-Ho;Nah Wansoo;Kim Byung-Sung;Park Cheonsuk;Yang Youngoo
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.16 no.10 s.101
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    • pp.1010-1019
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    • 2005
  • In this paper, we used neural network technique to model memory effects of RF power amplifier which is fed by two-tone input signals. The memory effects in power amplifier were identified by observing the unsymmetrical distribution of IMD(Inter-Modulation Distortion) measurements with the change of tone spacings and power levels. Different asymmetries of IMD were also found at different center frequencies. We applied TDNN technique to model LDMOS power amplifier based on two tone IMD data, and the accuracy was very high compared to other modeling methods such as the(memoryless) adaptive modeling method.

Channel Modeling and RF Performance Verification in mmWave Bands Based on NS-3 (NS-3 기반의 mmWave 대역 채널 모델링 및 RF 성능 검증)

  • Seung-Min Lee;Jun-Seok Seo;Hong-Je Jang;Myung-Ryul Choi
    • Journal of IKEEE
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    • v.27 no.4
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    • pp.650-656
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    • 2023
  • This paper implements a channel model for mmWave bands using an NS-3-based 5G system-level simulator and analyzes the reliability and validity of the implemented model through RF performance verification. The channel model for RF performance verification in the mmWave bands consider parameters such as characteristics defined in 3GPP TR 38.901, beam-forming, antenna configuration, scenarios, among others. Furthermore, the simulation results verify compliance within the ranges permitted by the 3GPP standards and verify reliability in indoor environmental scenarios by exploiting the Radio Environment Map (REM). Therefore, the channel model implemented in this study is applicable to the actual design and establishment of 5G networks, presenting a method to evaluate and validate RF performance by adjusting various parameters.

New RF Empirical Nonlinear Modeling for Nano-Scale Bulk MOSFET (나노 스케일 벌크 MOSFET을 위한 새로운 RF 엠피리컬 비선형 모델링)

  • Lee, Seong-Hearn
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.12 s.354
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    • pp.33-39
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    • 2006
  • An empirical nonlinear model with intrinsic nonlinear elements has been newly developed to predict the RF nonlinear characteristics of nano-scale bulk MOSFET accurately over the wide bias range. Using an extraction method suitable for nano-scale MOSFET, the bias-dependent data of intrinsic model parameters have been accurately obtained from measured S-parameters. The intrinsic nonlinear capacitance and drain current equations have been empirically obtained through 3-dimensional curve-fitting to their bias-dependent curves. The modeled S-parameters of 60nm MOSFET have good agreements with measured ones up to 20GHz in the wide bias range, verifying the accuracy of the nano-scale MOSFET model.

Theoretical Analysis of Frequency Dependent Input Resistance in RF MOSFETs (RF MOSFET의 주파수 종속 입력 저항에 대한 이론적 분석)

  • Ahn, Jahyun;Lee, Seonghearn
    • Journal of the Institute of Electronics and Information Engineers
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    • v.54 no.5
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    • pp.11-16
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    • 2017
  • The frequency dependent input resistance observed in RF MOSFETs is analyzed in detail by deriving pole and zero frequency equations from a simplified input equivalent circuit. Using this theoretical analysis, we find that the reduction effect of the input resistance in the low frequency region arises from the channel resistance between source and pinch-off region in the saturation region. This channel resistance effect on the low frequency reduction of the input resistance is physically validated by performing small-signal equivalent circuit modeling with varying the channel resistance.

Effective Measurement and modeling of memory effects in Power Amplifier (RF 전력 증폭기 메모리 효과의 효율적인 측정과 모델링 기법)

  • Kim, Won-Ho;HwangBo, Hoon;Nah, Wan-Soo;Park, Cheon-Seok;Kim, Byung-Sung
    • Proceedings of the KIEE Conference
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    • 2004.11c
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    • pp.261-264
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    • 2004
  • In this paper, we identify the memory effect of high power(125W) laterally diffused metal oxide-semiconductor(LDMOS) RF Power Amplifier(PA) by two tone IMD measurement. We measure two tone IMD by changing the tone spacing and the power level. Different asymmetric IMD is founded at different center frequency measurements. We propose the Tapped Delay Line-Neural Network(TDNN) technique as the modeling method of LDMOS PA based on two tone IMD data. TDNN's modeling accuracy is highly reasonable compared to the memoryless adaptive modeling method.

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Design of RF Energy Detector for Spectrum Sensing in TV White Space Transceiver (TV White Space 송수신기의 스펙트럼 센싱을 위한 RF 에너지 검출 회로 설계)

  • Kim, Jong-Sik;Shin, Hyun-Chol
    • The Journal of The Korea Institute of Intelligent Transport Systems
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    • v.11 no.2
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    • pp.83-91
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    • 2012
  • An RF energy detector for spectrum sensing in TV white space transceiver is presented. It is based on an RF active filtering technique that comprises a low-noise amplifier with a frequency-translation high-pass filtering feedfoward loop, which attenuates the unwanted sideband energy and only passes the wanted band energy. Unlike the conventional architecture, a new architecture that can attenuate both sidebands at the same time is proposed. A simplified system modeling method is presented to assess the non-ideality effects on the RF energy detector performances. System behavioral simulations demonstrate that the proposed architecture can be instrumental for realizaing a RF energy detector circuit in CMOS.