• 제목/요약/키워드: Off-Axis

검색결과 500건 처리시간 0.033초

Optical System Design for a Head-up Display Using Aberration Analysis of an Off-axis Two-mirror System

  • Kim, Byung-Hyun;Park, Sung-Chan
    • Journal of the Optical Society of Korea
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    • 제20권4호
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    • pp.481-487
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    • 2016
  • This study presents a new optical system for a combiner-type head-up display (HUD) with a cylindrical lens as an asymmetrical aberration corrector, instead of a freeform mirror. In the initial design process based on off-axial aberration analysis, we obtain an off-axis two-mirror system corrected for linear astigmatism and spherical aberration by adding a conic secondary mirror to an off-axis paraboloidal mirror. Thus, since the starting optical system for an HUD is corrected for dominant aberrations, it enables us to balance the residual asymmetrical aberrations with a simple optical surface such as a cylinder, not a complex freeform surface. From this design process, an optical system for an HUD having good performance is finally obtained. The size of the virtual image is 10 inches at 2 meters away from a combiner, and the area of the eye box is 130×50 mm2.

Off-axis RF 마그네트론 스퍼터링법을 이용하여 저온에서 결정화된 ITO 박막의 특성 (Characterization of the Crystallized ITO Thin Films Grown at a Low Temperature by Off-axis RF Magnetron Sputtering)

  • 최형진;정현준;허성기;윤순길
    • 한국전기전자재료학회논문지
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    • 제24권2호
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    • pp.126-130
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    • 2011
  • In this study, off-axis magnetron sputtering was used for the crystallized ITO thin films at a low temperature of about $120^{\circ}C$ instead of the conventional RF sputtering because the off-axis sputtering can avoid the damage for the plasma as well as fabrication of thin films with a high quality. The ITO thin films grown on PET substrate at $120^{\circ}C$ were crystallized with a (222) preferred orientation. 58-nm thick ITO films showed a resistivity of about $2{\times}10-4{\Omega}{\cdot}cm$ and a transmittance of about 75% at a wavelength of 550 nm. The transmittance of the ITO thin films by an insertion of SiO2 thin films on ITO films was improved.

Off-axis 고주파 마그네트론 스퍼터링법을 이용한 이종에피텍셜 ZnO 박막 성장 (Growth of Heteroepitaxial ZnO Thin Film by Off-axis RF Magnetron Sputtering)

  • 박재완;박종완;이전국
    • 한국세라믹학회지
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    • 제40권3호
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    • pp.262-267
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    • 2003
  • Off-axis 고주파 마그네트론 스퍼터링법으로 사파이어(0001) 기판 위에 이종에피텍셜 ZnO 박막을 제조하였다. ZnO 박막의 결정성은 증착압력, RF power 그리고 기판온도의 공정조건 변화에 많은 영향을 받았으며, 스퍼터링된 입자의 적당한 kinetic energy와 기판표면에서의 표면이동도(surface mobility)가 조화를 이룰 때 결정성이 우수한 이종에피텍셜 박막을 을 얻을 수 있었다. 이종에피텍셜 ZnO 박막의 Photoluminescence(PL) 특성 측정 결과, 저온(17K)에서 약 3.36 eV의 자외선 영역 발광을 관찰할 수 있었으며, 상온에서도 3.28 eV의 자외선 영역 발광을 관찰할 수 있었다. ZnO 박막을 산소 분위기에서 열처리함에 따라 결정성은 향상되는 반면 자외선 영역의 발광은 급격히 감소하는 경향을 보였다.

비 결정 축(off-zone axis)으로 입사된 빔에 대한 고 분해 투과전자현미경 이미지에서 HOLZ 반사 빔의 효과 (Effects of Higher-Order Laue Zone Reflections on HRTEM Images for illumination along an off-Bone Axis of a Crystal)

  • 김황수
    • Applied Microscopy
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    • 제37권4호
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    • pp.259-269
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    • 2007
  • 이 논문에서 비 결정 축(off-zone axis)으로 입사된 빔에 대한 고 분해 투과전자현미경(HRTEM)이미지로부터 HOLZ 반사 빔의 효과를 관측 할 수 있는 가능성을 탐색하였다. 이 관측에 대한 분석은 3차원적 결정 구조에 대한 유용한 정보를 줄 수 있다. 이 HRTEM 이미지 시뮬레이션에는 HOLZ 반사 빔들을 포함하는 수정된 Howie-Whelan 방정식이 사용되었다. 이 논문의 결론은 한 zone 축으로부터 수 도 경사진 매우 얇은 결정에 대한 고 분해 전자현미경 이미지는 HOLZ 반사 빔의 효과를 나타내고 있고 따라서 그 zone축에 따른 원자 배열의 정보를 분명히 내포함을 보여 주고 있음을 말한다.

Crystallized Indium Tin Oxide Thin Films at a Low Temperature on Polymer Substrate by Off-axis RF Magnetron Sputtering

  • 최형진;정현준;윤순길
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 추계학술발표대회
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    • pp.22.1-22.1
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    • 2011
  • In this study, off-axis RF magnetron sputtering was used for the crystallized ITO thin films at a low temperature of about $120^{\circ}C$ instead of the conventional RF sputtering because the off-axis sputtering can avoid the damage for the plasma as well as fabrication of thin films with a high quality. The structural, optical and electrical properties of the obtained films depending on deposition parameters, such as sputtering power, gas flow and working pressure, have been investigated. The ITO thin films grown on PET substrate at $120^{\circ}C$ were crystallized with a (222) preferred orientation. 100-nm thick ITO films showed a resistivity of about $4.2{\times}10^{-4}{\Omega}-cm$ and a transmittance of about 81% at a wavelength of 550nm. The transmittance of the ITO thin films by an insertion of $SiO_2$ thin films on ITO films was improved.

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Off-axis 펄스레이저 증착법으로 성장된 ZnO 나노구조에 관한 연구 (ZnO Nanostructure Formed by Off-axis Pulsed Laser Deposition)

  • 강정석;강홍성;김재원;이상렬
    • 한국전기전자재료학회논문지
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    • 제17권3호
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    • pp.319-322
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    • 2004
  • ZnO nanostructures were formed on a Si substrate by off-axis pulsed laser deposition(PLD) system in which a substrate plane was tilted toward a plume propagation direction. Atomic force microscopy (AFM) showed islands of 20∼40 nm width. From the x-ray diffraction (XRD) pattern exhibiting only (002) ZnO peak, the islands observed in AFM image were found to well crystallized. Optical bandgap enlargement from 3.26 eV to 3.35 and 3.47 eV due to the quantum size effect of ZnO nanostructures were observed by Photoluminescence (PL) at room temperature.

Novel PVA pixel design for mobile application with excellent off-axis image quality

  • Kim, Jae-Hyun;Kim, Gee-Bum;Choi, Ji-Youn;Jang, Yong-Kyu;Ahn, Seon-Hong;Kim, Kyeong-Hyeon;Kim, Sang-Soo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.295-298
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    • 2008
  • We developed a novel PVA pixel design for mobile application with excellent off-axis image quality and optical performance by introducing Active Level Shift technology and optimizing pixel structure. Our new pixel design enables better off-axis image quality without sacrificing other optical properties compared with a conventional mPVA structure.

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Surface Form Measurement Using Single Shot Off-axis Fizeau Interferometry

  • Abdelsalam, Dahi Ghareab;Baek, Byung-Joon;Cho, Yong-Jai;Kim, Dae-Suk
    • Journal of the Optical Society of Korea
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    • 제14권4호
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    • pp.409-414
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    • 2010
  • This paper describes the surface form measurement of a spherical smooth surface by using single shot off-axis Fizeau interferometry. The demodulated phase map is obtained and unwrapped to remove the $2\pi$ ambiguity. The unwrapped phase map is converted to height and the 3D surface height of the surface object is reconstructed. The results extracted from the single shot off-axis geometry are compared with the results extracted from four-frame phase shifting in-line interferometry, and the results are in excellent agreement.

유연성 기판 위에 증착된 ITO 박막의 공정 온도에 따른 전기적·광학적 특성 평가 (Characterization of the Crystallized ITO Thin Films Grown at Different Temperatures by Off-axis RF Magnetron Sputtering)

  • 최형진;윤순길
    • 한국전기전자재료학회논문지
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    • 제26권5호
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    • pp.397-400
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    • 2013
  • Off-axis magnetron sputtering was used for the crystallized ITO thin films deposition at various temperatures from 25 to $120^{\circ}C$. The ITO thin films were crystallized at $50^{\circ}C$ for Si (001) substrates and at $75^{\circ}C$ for PET substrate. The ITO thin films grown onto PET substrate at $120^{\circ}C$ were crystallized with a (222) preferred orientation. The 160-nm thick ITO films showed a resistivity of about $7{\times}10^{-4}{\Omega}{\cdot}cm$ and a transmittance of about 84% at a wavelength of 550 nm. Off-axis sputtering can be applied for low temperature crystallization of the ITO films.