• Title/Summary/Keyword: Nonnormal Distribution

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Reliability Analysis for Nonnormal Distributions Using Multi-Level DOE (다수준 실험계획법을 이용한 비정규 분포의 신뢰도 계산 방법)

  • Choi, Hyun-Seok;Lee, Sang-Hoon;Kwak, Byung-Man
    • Proceedings of the KSME Conference
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    • 2004.11a
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    • pp.840-845
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    • 2004
  • The reliability analysis for nonnormal distributions using the three level DOE(design of experiments) method was developed by Seo and Kwak in 2002. Although this method estimates only up to the first four moments(mean, standard deviation, skewness, and kurtosis) of the system response function, the result and the type of probability distribution determined by using the Pearson system are shown very good. However the accuracy is low in case of nonlinear performance function and sometimes, the level calculated is outside of the region in which the random variable is defined. In this article we suggest a modified three level DOE method to overcome these weaknesses and to obtain optimum choice for 3 levels and weights to handle nonnormal distributions. Furthermore we extend it to finding the optimum choice for 5 levels and weights to increase the accuracy in case of nonlinear performance function. A systematic procedure for reliability analysis is then proposed by using the Pearson system.

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System Reliability Analysis for Nonnormal Distributions and Optimization Using Experimental Design Technique (실험계획법을 이용한 비정규 분포에 대한 신뢰도 계산 방법과 최적 설계에의 적용)

  • Seo, Hyun-Seok;Chang, Jin-Ho;Kwak, Byung-Man
    • Proceedings of the KSME Conference
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    • 2001.06c
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    • pp.327-332
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    • 2001
  • An experimental design technique is developed for estimating the moments of system response functions. It is easy to implement and provides accurate results compared with other traditional methods. It is based on the work of Taguchi, later improved by D'Errico and Zaino. The existing experimental techniques, however, is applicable only for normally distributed cases. In this article the three-level Taguchi method is extended to obtain optimum choice for levels and weights to handle nonnormal distributions. A systematic procedure for reliability analysis is then proposed by using the Pearson system and the narrow system reliability bounds. Illustrative examples including a tolerance optimization problem are shown very accurate comparing with those by Monte-Carlo simulations and the first-order reliability method.

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A Note on the Simple Chi-Squared Test of Multivariate Normality

  • Park, Cheol-Yong
    • Journal of the Korean Data and Information Science Society
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    • v.15 no.2
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    • pp.423-430
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    • 2004
  • We provide the exact form of a Rao-Robson version of the chi-squared test of multivariate normality suggested by Park(2001). This test is easy to apply in practice since it is easily computed and has a limiting chi-squared distribution under multivariate normality. A self-contained formal argument is provided that it has the limiting chi-squared distribution. A simulation study is provided to study the accuracy, in finite samples, of the limiting distribution. Finally, a simulation study in a nonnormal distribution is conducted in order to compare the power of our test with those of other popular normality tests.

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Design of Median Control Chart for Nonnormally Distributed Processes (비정규분포공정(非正規分布工程)에서 메디안특수관리도(特殊管理圖)의 모형설계(模型設計))

  • Sin, Yong-Baek
    • Journal of Korean Society for Quality Management
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    • v.15 no.2
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    • pp.10-19
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    • 1987
  • Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\overline{X}$-chart, X-chart, $\widetilde{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In the Shewhart $\overline{X}$-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, and Truncated-normal distributions.

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A Comparison of the performance of mean, median, and precedence control charts for nonnormal data

  • Kim, Jung-Hee;Lee, Sung-Im;Park, Heon-Jin;Lee, Jae-Cheol;Jang, Young-Chul
    • Proceedings of the Korean Statistical Society Conference
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    • 2005.05a
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    • pp.197-201
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    • 2005
  • In this article, we will compare the performance of the mean control chart, the median control chart, the transformed mean control chart, the transformed median control chart, and the precedence control chart by simulation study. For control charts with transformed data, Yeo-Johnson transformation is used. Under the in-control condition, ARL's in all control charts coincide with the designed ARL in the normal distribution, but in the other distributions, only the precedence control chart provides the in-control ARL as designed. Under the out-of-control condition, the mean control chart is preferred in the normal distribution and the median control chart is preferred in the heavy-tailed distribution and the precedence control chart outperforms in the short-tailed distribution.

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Median Control Chart for Nonnormally Distributed Processes (비정규분포공정에서 매디안특수관리도의 모형설계와 적용연구)

  • 신용백
    • Journal of the Korean Professional Engineers Association
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    • v.20 no.3
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    • pp.15-25
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    • 1987
  • Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the X-chart, X-chart, X-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart X-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for tile more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the X-chart, the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the X-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based on a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $X^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the propose4 median chart and the X chart was also performed with these examples and the median chart turned out to be superior to the X-chart.

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Median Control Chart for Nonnormally Distributed Processes (비정규분포공정에서 메디안특수관리도 통용모형설정에 관한 실증적 연구(요약))

  • 신용백
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.10 no.16
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    • pp.101-106
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    • 1987
  • Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\bar{X}$-chart, $\bar{X}$-chart, $\bar{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart $\bar{X}$-chart. which is the most widely used one in Kora, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the $\bar{X}$-chart; the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the $\bar{X}$-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based oh a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $\chi$$^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the proposed median chart and the $\bar{X}$ chart was also performed with these examples and the median chart turned out to be superior to the $\bar{X}$-chart.

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A Comparison of Confidence Intervals for the Reliability of the Stress-Strength Models with Explanatory Variables

  • Eun Sik Park;Jae Joo Kim;Sung Hyun Park
    • Communications for Statistical Applications and Methods
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    • v.3 no.1
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    • pp.73-85
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    • 1996
  • In this paper, we consider the distribution-free confidence intervals for the reliability of the stress-strength model when the stress X and strength Y depend linearly on some explanatory variables z and w, respectively. We apply these confidence intervals to the Rocket-Motor data and compare the results to those of Guttman et al. (1988). Some simulation results show that the distribution-free confidence intervals have better performance for nonnormal errors compared to those of Guttman et al. (1988), which are designed for normal random variables in respect that the former yield the coverage levels closer to the nominal coverage level than the latter.

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Better Confidence Limits for Process Capability Index $C_{pmk}$ under the assumption of Normal Process (정규분포 공정 가정하에서의 공정능력지수 $C_{pmk}$ 에 관한 효율적인 신뢰한계)

  • Cho Joong-Jae;Park Byoung-Sun;Park Hyo-il
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.229-241
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    • 2004
  • Process capability index is used to determine whether a production process is capable of producing items within a specified tolerance. The index $C_{pmk}$ is the third generation process capability index. This index is more powerful than two useful indices $C_p$ and $C_{pk}$. Whether a process distribution is clearly normal or nonnormal, there may be some questions as to which any process index is valid or should even be calculated. As far as we know, yet there is no result for statistical inference with process capability index $C_{pmk}$. However, asymptotic method and bootstrap could be studied for good statistical inference. In this paper, we propose various bootstrap confidence limits for our process capability Index $C_{pmk}$. First, we derive bootstrap asymptotic distribution of plug-in estimator $C_{pmk}$ of our capability index $C_{pmk}$. And then we construct various bootstrap confidence limits of our capability index $C_{pmk}$ for more useful process capability analysis.

Better Statistical Test for Process Capability Index $C_p$ (공정능력지수 $C_p$에 대한 효율적인 가설검정)

  • Cho, Joong-Jae;Lim, Soo-Duck
    • Journal of Korean Society for Quality Management
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    • v.34 no.3
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    • pp.66-72
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    • 2006
  • The process capability indices are widely used to measure the capability of the process to manufacture items within the specified tolerance. Most evaluations on process capability indices focus on point estimates, which may result in unreliable assessments of process performance. The index $C_p$ has been widely used in various industries to assess process performance. In this paper, we propose new testing procedure on assessing $C_p$ index for practitioners to use in determining whether a given process is capable. The provided approach is easy to use and the decision making is more reliable. Whether a process is clearly normal or nonnormal, our bootstrap testing procedure could be applied effectively without the complexity of calculation. A numerical result based on the proposed approach is illustrated.