• Title/Summary/Keyword: FAB process

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Prediction Model on Delivery Time in Display FAB Using Survival Analysis (생존분석을 이용한 디스플레이 FAB의 반송시간 예측모형)

  • Han, Paul;Baek, Jun Geol
    • Journal of Korean Institute of Industrial Engineers
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    • v.40 no.3
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    • pp.283-290
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    • 2014
  • In the flat panel display industry, to meet production target quantities and the deadline of production, the scheduler and dispatching systems are major production management systems which control the order of facility production and the distribution of WIP (Work In Process). Especially the delivery time is a key factor of the dispatching system for the time when a lot can be supplied to the facility. In this paper, we use survival analysis methods to identify main factors of the delivery time and to build the delivery time forecasting model. To select important explanatory variables, the cox proportional hazard model is used to. To make a prediction model, the accelerated failure time (AFT) model was used. Performance comparisons were conducted with two other models, which are the technical statistics model based on transfer history and the linear regression model using same explanatory variables with AFT model. As a result, the mean square error (MSE) criteria, the AFT model decreased by 33.8% compared to the statistics prediction model, decreased by 5.3% compared to the linear regression model. This survival analysis approach is applicable to implementing the delivery time estimator in display manufacturing. And it can contribute to improve the productivity and reliability of production management system.

Numerical study on battery thermal management system using phase change material with oscillating heat pipe (상변화물질과 맥동형 히트 파이프를 이용한 배터리 열 관리 시스템에 대한 수치해석적 연구)

  • Seung Hyun Park;Min Gi Chu;Dong Kee Sohn;Han Seo Ko
    • Journal of the Korean Society of Visualization
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    • v.22 no.2
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    • pp.104-114
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    • 2024
  • To effectively control heat generation resulting from advancements in fast discharging technology for electric vehicle batteries, hybrid Battery Thermal Management Systems (BTMS) are gaining attention. In this study, a BTMS combining Phase Change Material (PCM) with Oscillating Heat Pipe (OHP) was designed. During the phase change process of the PCM, the maximum battery temperature increased slowly. Additionally, due to the excellent heat transfer capability of the OHP, the PCM/OHP BTMS delayed the time when the maximum battery temperature exceeded 50 ℃ by 810 s compared to the PCM/copper fin BTMS, resulting in the maximum battery temperature that was 41.29 ℃ lower at 3600 s. Furthermore, in the section where the latent heat of the PCM had the greatest impact, the slope of the battery temperature difference was 0.0017 lower than that of the PCM/copper fin BTMS. Therefore, the PCM/OHP BTMS demonstrates its potential as a viable hybrid BTMS.

Scheduling Simulator for Semiconductor Fabrication Line (반도체 FAB의 스케줄링 시뮬레이터 개발)

  • Lee, Young-Hoon;Cho, Han-Min;Park, Jong-Kwan;Lee, Byung-Ki
    • IE interfaces
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    • v.12 no.3
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    • pp.437-447
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    • 1999
  • Modeling and system development for the fabrication process in the semiconductor manufacturing is presented in this paper. Maximization of wafer production can be achieved by the wafer flow balance under high utilization of bottleneck machines. Relatively simpler model is developed for the fabrication line by considering main characteristics of logistics. Simulation system is developed to evaluate the line performance such as balance rate, utilization, WIP amount and wafer production. Scheduling rules and input rules are suggested, and tested on the simulation system. We have shown that there exists good combination of scheduling and input rules.

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A Study of Semiconductor Process Control using Dual Damping EWMA (Dual Damping EWMA를 이용한 효율적인 반도체 공정 제어에 관한 연구)

  • Kim, Seon-Eok;Ko, Hyo-Heon;Kim, Jih-Yun;Kim, Sung-Shick
    • IE interfaces
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    • v.21 no.2
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    • pp.141-150
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    • 2008
  • In this paper, an efficient control method for semiconductor fabrication process is presented. Generally, control is performed with data which is under the influence of process disturbance. EWMA is one of the most popular control methods in semiconductor fabrication that effectively deals with varying process condition. A new method using EWMA, called the Dual Damping EWMA, is presented in this study to reduce over-control by separating weight factor of input and output. The goal is to reflect Drift but reduce the effects of White noise in run to run control. Simulation is performed to evaluate the performance of DPEWMA and to compare with EWMA and Double EWMA.

Throughput Analysis of the Twin Chamber Platform Equipment according to the Load-lock Configuration (쌍 체임버 기반 장비의 로드락 구성에 따른 생산성 분석)

  • Hong, Joo-Pyo;Lee, Ki-Seok
    • Journal of the Semiconductor & Display Technology
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    • v.7 no.2
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    • pp.39-43
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    • 2008
  • Productivity is one of the performance indices of the semiconductor equipment in manufacturing viewpoint. Among many ways tried and adopted for improvement of the productivity of the FAB equipment, variation of equipment configuration was considered and its effect on the throughput was analyzed. Parallel machine cycle charts that were generated based on the equipment log were used in the analysis. Efficiency of the equipment due to change of the structure and the probability of the usage in the manufacturing process were examined. The results showed that the modification of the control algorithm in the equipment and the redistribution of the process time for each process and transfer module along to the change in the structure enhance the throughput of the equipment.

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Study on the Optimization of HSS STI-CMP Process (HSS STI-CMP 공정의 최적화에 관한 연구)

  • Jeong, So-Young;Seo, Yong-Jin;Park, Sung-Woo;Kim, Chul-Bok;Kim, Sang-Yong;Lee, Woo-Sun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05c
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    • pp.149-153
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    • 2003
  • Chemical mechanical polishing (CMP) technology for global planarization of multi-level inter-connection structure has been widely studied for the next generation devices. CMP process has been paid attention to planarized pre-metal dielectric (PMD), inter-layer dielectric (ILD) interconnections. Expecially, shallow trench isolation (STI) used to CMP process on essential. Recently, the direct STI-CMP process without the conventional complex reverse moat etch process has established by using slurry additive with the high selectivity between $SiO_2$ and $Si_3N_4$ films for the purpose of process simplification and n-situ end point detection(EPD). However, STI-CMP process has various defects such as nitride residue, tom oxide and damage of silicon active region. To solve these problems, in this paper, we studied the planarization characteristics using a high selectivity slurry(HSS). As our experimental results, it was possible to achieve a global planarization and STI-CMP process could be dramatically simplified. Also we estimated the reliability through the repeated tests with the optimized process conditions in order to identify the reproducibility of HSS STI-CMP process.

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A Study on Measures to Improve Smoke Control Performance in Case of Fire in a Clean room as an LCD Manufacturing Process (LCD 제조공정 클린룸의 화재시 CFD를 이용한 제연성능 개선대책에 관한 연구)

  • Son, Bong-Sei;Jang, Chan-Hee
    • Fire Science and Engineering
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    • v.26 no.5
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    • pp.41-47
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    • 2012
  • As a core process in the manufacture of state-of-the-art industrial technologies such as semiconductor and LCD, a clean room is the most important process which can affect the performance and quality of products drastically. Nevertheless, scientific research on comprehensive safety measures from a fire protection standpoint is not being carried out in Korea. This study aims to derive measures to improve smoke control systems by identifying performance and problems of smoke systems installed in clean rooms as an LCD manufacturing process and analyzing fire and evacuation simulations considering several scenarios. As a result of analysis of fires and smoke in a clean roomas an LCD manufacturing process, it is found to be necessary to stop air handling units through interlocking in case of a fire and exhaust smoke out of the room through the top of FAB in consideration of buoyancy of smoke. It is also found to be necessary to install quick response sprinkler heads and accessories to accelerate the response time, because the heat-accumulating performance of sprinkler heads decreases in this application. Despite its low density of dwelling due to the automation process, clean room is characterized by an array of complex production equipment and working environment requiring dustproof clothes, which makes it difficult to acquire evacuation safety performance. Thus, thorough control of danger factors in processes and periodic education and training are required. It is also necessary to establish a level of domestic technologies equivalent to the level of standards of advanced countries in fire protection.

Wafer Map Image Analysis Methods in Semiconductor Manufacturing System (반도체 공정에서의 Wafer Map Image 분석 방법론)

  • Yoo, Youngji;An, Daewoong;Park, Seung Hwan;Baek, Jun-Geol
    • Journal of Korean Institute of Industrial Engineers
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    • v.41 no.3
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    • pp.267-274
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    • 2015
  • In the semiconductor manufacturing post-FAB process, predicting a package test result accurately in the wafer testing phase is a key element to ensure the competitiveness of companies. The prediction of package test can reduce unnecessary inspection time and expense. However, an analysing method is not sufficient to analyze data collected at wafer testing phase. Therefore, many companies have been using a summary information such as a mean, weighted sum and variance, and the summarized data reduces a prediction accuracy. In the paper, we propose an analysis method for Wafer Map Image collected at wafer testing process and conduct an experiment using real data.

Transparent Conducting Nanodomes for Efficient Light Management

  • Hong, Seung-Hyouk;Yun, Ju-Hyung;Park, Hyeong-Ho;Kim, Joondong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.314.1-314.1
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    • 2013
  • Transparent conducting nanoscale-domes were periodically patterned on a Si substrate by nanoimprint method. Transparent conductor of indium-tin-oxide (ITO) was shaped as a nanodome, which effectively drives the incident light effectively into a light-absorber and therefore induces a substantially enhanced photo-response. An ITO nanodome is electrically isolated from the neighboring nanodomes. This structure benefits to provide a low contact between a Si substrate and a front metal electrode giving an efficient electrical path. The ITO nanodome device showed a significantly enhanced photo-response of 6010 from the value of 72.9 of a planar ITO film. The electrical and optical advantage of an ITO nanodome is suitable for various photoelectric applications.

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Purification and Structural Characterization of Glycolipid Biosurfactants from Pseudomonas aeruginoas YPJ-80

  • Park, Oh-Jin;Lee, Young-Eun;Cho, Joong-Hoon;Shin, Hyun-Jae;Yoon, Byung-Dae;Yang, Ji-Won
    • Biotechnology and Bioprocess Engineering:BBE
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    • v.3 no.2
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    • pp.61-66
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    • 1998
  • Glycolipids produced by Pseudomonas aeruginosa YPJ-80 were characterized by chromatographic and spectorscopic techniques as a mixture of two rhamnolipids. For recovery of glycolipids from the culture broth, various isolation methods including ultrafiltration, adsorption and solvent extraction were compared. Ultrafiltration showed the best results in terms of glycolipids recovery. Further purification for spectroscopic analysis was carried out by adsorption chromatography and preparative thin layer chromatography. From the spectroscopic analysis, such as IR spectroscopy. FAB-MS, 1H-NMR and 13C-NMR and hydrolysis analysis, the glycolipids were identified as L-${\alpha}$-rhamnopyranosyl-${\beta}$-hydroxydecanoly-${\beta}$-hydroxydecanoate and 2-O-${\alpha}$-L-rhamnopyranosyl-${\alpha}$-L-rhamnopyranosyl-${\beta}$-hydroxydecanoyl-${\beta}$-hydroxydecanoate. Monorhamnolipid and dirhamnolipid lowered the surface tension of water to 28.1 mN/M and 29.3 mN/m, respectively.

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