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A Study of Semiconductor Process Control using Dual Damping EWMA  

Kim, Seon-Eok (Department of Industrial System and Information Engineering, Korea University)
Ko, Hyo-Heon (Department of Industrial System and Information Engineering, Korea University)
Kim, Jih-Yun (Semiconductor Technology Research Center, Korea University)
Kim, Sung-Shick (Department of Industrial System and Information Engineering, Korea University)
Publication Information
IE interfaces / v.21, no.2, 2008 , pp. 141-150 More about this Journal
Abstract
In this paper, an efficient control method for semiconductor fabrication process is presented. Generally, control is performed with data which is under the influence of process disturbance. EWMA is one of the most popular control methods in semiconductor fabrication that effectively deals with varying process condition. A new method using EWMA, called the Dual Damping EWMA, is presented in this study to reduce over-control by separating weight factor of input and output. The goal is to reflect Drift but reduce the effects of White noise in run to run control. Simulation is performed to evaluate the performance of DPEWMA and to compare with EWMA and Double EWMA.
Keywords
semiconductor; FAB control; EWMA; control logic;
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