• 한국생산제조학회지
• /
• 제20권2호
• /
• pp.193-201
• /
• 2011

Recently, mechanical reliabilities including a drop test have been a hot issue. In this paper, solder balls with new components which are Sn-3.0Ag-0.5Cu and Sn-1.0Ag-0.5Cu-0.05N are introduced, and board level drop test for them are conducted under JEDEC standard in which the board with 15 flip chips is dropped as 1,500g acceleration during 0.5ms. The drop simulations are studied by using a implicit method in the ANSYS LS-DYNA, and modal analysis is made. Through both analyses, the solder balls with new components are evaluated under the drop. It is found that the maximum stress of each chip is occurred between the solder ball and the PCB, and the highest value among the maximum stresses in the chips is occurred on the chip nearest to fixed holes on the board in the drop tests and simulations.

• 한국지능시스템학회:학술대회논문집
• /
• 한국퍼지및지능시스템학회 1993년도 Fifth International Fuzzy Systems Association World Congress 93
• /
• pp.975-976
• /
• 1993

This talk presents the overview of the author's research and development activities on fuzzy inference hardware. We involved it with two distinct approaches. The first approach is to use application specific integrated circuits (ASIC) technology. The fuzzy inference method is directly implemented in silicon. The second approach, which is in its preliminary stage, is to use more conventional microprocessor architecture. Here, we use a quantitative technique used by designer of reduced instruction set computer (RISC) to modify an architecture of a microprocessor. In the ASIC approach, we implemented the most widely used fuzzy inference mechanism directly on silicon. The mechanism is beaded on a max-min compositional rule of inference, and Mandami's method of fuzzy implication. The two VLSI fuzzy inference chips are designed, fabricated, and fully tested. Both used a full-custom CMOS technology. The second and more claborate chip was designed at the University of North Carolina(U C) in cooperation with MCNC. Both VLSI chips had muliple datapaths for rule digital fuzzy inference chips had multiple datapaths for rule evaluation, and they executed multiple fuzzy if-then rules in parallel. The AT & T chip is the first digital fuzzy inference chip in the world. It ran with a 20 MHz clock cycle and achieved an approximately 80.000 Fuzzy Logical inferences Per Second (FLIPS). It stored and executed 16 fuzzy if-then rules. Since it was designed as a proof of concept prototype chip, it had minimal amount of peripheral logic for system integration. UNC/MCNC chip consists of 688,131 transistors of which 476,160 are used for RAM memory. It ran with a 10 MHz clock cycle. The chip has a 3-staged pipeline and initiates a computation of new inference every 64 cycle. This chip achieved an approximately 160,000 FLIPS. The new architecture have the following important improvements from the AT & T chip: Programmable rule set memory (RAM). On-chip fuzzification operation by a table lookup method. On-chip defuzzification operation by a centroid method. Reconfigurable architecture for processing two rule formats. RAM/datapath redundancy for higher yield It can store and execute 51 if-then rule of the following format: IF A and B and C and D Then Do E, and Then Do F. With this format, the chip takes four inputs and produces two outputs. By software reconfiguration, it can store and execute 102 if-then rules of the following simpler format using the same datapath: IF A and B Then Do E. With this format the chip takes two inputs and produces one outputs. We have built two VME-bus board systems based on this chip for Oak Ridge National Laboratory (ORNL). The board is now installed in a robot at ORNL. Researchers uses this board for experiment in autonomous robot navigation. The Fuzzy Logic system board places the Fuzzy chip into a VMEbus environment. High level C language functions hide the operational details of the board from the applications programme . The programmer treats rule memories and fuzzification function memories as local structures passed as parameters to the C functions. ASIC fuzzy inference hardware is extremely fast, but they are limited in generality. Many aspects of the design are limited or fixed. We have proposed to designing a are limited or fixed. We have proposed to designing a fuzzy information processor as an application specific processor using a quantitative approach. The quantitative approach was developed by RISC designers. In effect, we are interested in evaluating the effectiveness of a specialized RISC processor for fuzzy information processing. As the first step, we measured the possible speed-up of a fuzzy inference program based on if-then rules by an introduction of specialized instructions, i.e., min and max instructions. The minimum and maximum operations are heavily used in fuzzy logic applications as fuzzy intersection and union. We performed measurements using a MIPS R3000 as a base micropro essor. The initial result is encouraging. We can achieve as high as a 2.5 increase in inference speed if the R3000 had min and max instructions. Also, they are useful for speeding up other fuzzy operations such as bounded product and bounded sum. The embedded processor's main task is to control some device or process. It usually runs a single or a embedded processer to create an embedded processor for fuzzy control is very effective. Table I shows the measured speed of the inference by a MIPS R3000 microprocessor, a fictitious MIPS R3000 microprocessor with min and max instructions, and a UNC/MCNC ASIC fuzzy inference chip. The software that used on microprocessors is a simulator of the ASIC chip. The first row is the computation time in seconds of 6000 inferences using 51 rules where each fuzzy set is represented by an array of 64 elements. The second row is the time required to perform a single inference. The last row is the fuzzy logical inferences per second (FLIPS) measured for ach device. There is a large gap in run time between the ASIC and software approaches even if we resort to a specialized fuzzy microprocessor. As for design time and cost, these two approaches represent two extremes. An ASIC approach is extremely expensive. It is, therefore, an important research topic to design a specialized computing architecture for fuzzy applications that falls between these two extremes both in run time and design time/cost. TABLEI INFERENCE TIME BY 51 RULES {{{{Time }}{{MIPS R3000 }}{{ASIC }}{{Regular }}{{With min/mix }}{{6000 inference 1 inference FLIPS }}{{125s 20.8ms 48 }}{{49s 8.2ms 122 }}{{0.0038s 6.4㎲ 156,250 }} }}

• 대한기계학회논문집B
• /
• 제37권1호
• /
• pp.75-79
• /
• 2013

반도체 수요의 폭발적인 증가와 기술의 진보로 단위면적당 소자수가 늘어나고 있다. 그에 따라 단위면적당 발열량이 더욱 높아져서 반도체의 수명과 신뢰성 보장을 위한 냉각문제의 해결이 점점 중요해지고 있다. 특히, 집적도를 높이기 위해 소자를 기판에 매립하는 chip-in-board (CIB) 패키지에서는 방열이 더욱 심각한 문제가 된다. 본 논문에서는 각기 다른 재질의 층으로 구성된 열 전달모형을 설정하고, 3 차원 열 전달 해석으로 적절한 경계 조건에 맞추어 계산하였다. 이를 토대로 발열량을 정량적으로 예측하여 실제모델에 적용 될 수 있는 설계자료로 이용하고자 한다.

• 조명전기설비학회논문지
• /
• 제23권8호
• /
• pp.8-13
• /
• 2009

LED 광원 기술의 발전과 더불어 응용분야도 다양하게 넓어지고 있다. 이중 본 논문에서는 액정 후면 배광 장치와 같이 고성능의 광원이 요구되는 응용제품에 적합한 광원을 제작하였다. 논문에서 제안한 광원은 금속산화물 절연층을 이용하여 LED chip에서 발생한 열을 효율적으로 외부로 전달하는 구조를 적용하였으며 패키지 구조가 아닌 chip과의 접촉면에 반사컵 구조를 적용하여 배광 분포 제어와 광자 재흡수 특성을 개선하였다.

• 한국CDE학회논문집
• /
• 제9권4호
• /
• pp.416-424
• /
• 2004

In this paper, the heat transfer analysis and thermal stress analysis of the PCB(Printed Circuit Board) equipped in electronic Packages are carried out for various may types of chips on the PCB. And two structural PCB models are used in the analyses. The electronic chips on the PCB usually emit heat and this heat generates the thermal stress around the chip. The thermal load due to the heat generation of chips on the PCB may cause the malfunction of the electronic packages such as a monitor. a computer etc. Hence, the PCB should be designed to withstand these thermal loads. In this paper, the heat transfer analysis and thermal stress analysis are executed for the PCB model with pins and the analysis results are compared with the results for the PCB model without pins. The analysis results show that the PCB model without pins is not good for the thermal stress analysis of PCB, even though these two models have similar heat transfer characteristics. The analysis results also show that the highest thermal stress occurs in the pin especially attached to the highest temperature chip, and the PCB constrained to the electronic package on the long side is structurally more stable than other cases. The analyses of the PCB are executed using the finite element analysis code, NISA.

• 한국정밀공학회지
• /
• 제20권10호
• /
• pp.183-190
• /
• 2003

Major device failures such as die cracking, interfacial delamination and warpage in flip chip packages are due to excessive heat and thermal gradients- There have been significant researches toward understanding the thermal performance of electronic packages, but the majority of these studies do not take into account the combined effects of thermo-mechanical interactions of the different package constituents. This paper investigates the thermo-mechanical performance of flip chip package constituents based on the finite element method with thermo-mechanically coupled elements. Delaminations with different lengths between the silicon die and underfill resin interfaces were introduced to simulate the defects induced during the assembly processes. The temperature gradient fields and the corresponding stress distributions were analyzed and the results were compared with isothermal case. Parametric studies have been conducted with varying thermal conductivities of the package components, substrate board configurations. Compared with the uniform temperature distribution model, the model considering the temperature gradients provided more accurate stress profiles in the solder interconnections and underfill fillet. The packages with prescribed delaminations resulted in significant changes in stress in the solder. From the parametric study, the coefficients of thermal expansion and the package configurations played significant roles in determining the stress level over the entire package, although they showed little influence on stresses profile within the individual components. These observations have been implemented to the multi-board layer chip scale packages (CSP), and its results are discussed.

• Journal of the Korean Wood Science and Technology
• /
• 제41권6호
• /
• pp.490-496
• /
• 2013

폐목재의 재활용으로 인한 보드의 물리 기계적 특성이 하락하는 경향이 있다. 그 원인으로는 가공되어 있던 재료를 재활용함에 있어 그 형상이 불균질하고 기존의 접착제 성분과 이물질로 인한 보드 품질의 불균일과 저하를 초래한다. 또한 접착제에 포함되어 있는 포름알데히드로 인해 높은 방산량을 가지게 된다. 이러한 제품의 질적 하락이 수입되는 파티클보드와의 가격 및 품질 경쟁력 약화로 이어져 국내 보드 산업의 문제점으로 대두되고 있다. 따라서 본 연구에서는 최근 파티클보드의 원재료로 사용되고 있는 합판 정재단 부산물을 이용한 보드를 제조하고 각각의 제조 조건별 물리 기계적 특성을 평가하였다. 그 평가결과로 베니어 적층 복합보드를 EMDI 수지를 이용하여 4~16 mesh의 일반적인 chip 크기로 중층을 제작했을 때 휨강도가 57.7 $N/mm^2$로 OSB 측정결과 26.8 $N/mm^2$에 비해 215% 높은 휨강도를 나타냈으며 7.1~17.3%의 두께팽창률은 내수성을 지닌 보드로서 적합함을 보였다. 또한 0.7 ppm의 포름알데히드 방산량은 E1등급의 평균값 1.5 ppm과 E0 등급 최대값 0.7 ppm의 조건에 충족하며 이러한 결과는 바닥 깔개용 OSB를 대체 가능할 것으로 사료된다.

• 한국정보통신학회:학술대회논문집
• /
• 한국해양정보통신학회 2003년도 추계종합학술대회
• /
• pp.990-994
• /
• 2003

본 논문은 인터넷을 이용한 음성통신 서비스를 제공하기 위해 사용되는 VoIP 시스템 칩 설계 및 기능 검증을 위한 보드 개발에 관한 것이다. 구성이 간단한 시스템을 구현하기 위하여 32비트 RISC 프로세서인 ARM922T 프로세서 코어를 중심으로 IP 망 접속 기능, 음성신호 접속 기능 및 다양한 사용자 정합 기능을 가지는 VoIP 시스템 칩을 설계하고, 이 칩의 기능을 검증하기 위하여 시험 프로그램 및 통신 프로토콜을 개발하였으며, 각종 설계 및 시뮬레이션 툴을 사용하고 ARM922T와 FPGA가 결합된 Excalibur를 사용한 시험용 보드를 개발하여 시험하였다.

• 마이크로전자및패키징학회지
• /
• 제25권4호
• /
• pp.155-161
• /
• 2018

강성도가 서로 다른 polydimethylsiloxane (PDMS) 탄성고분자와 flexible printed circuit board (FPCB)로 이루어진 PDMS/FPCB 구조의 강성도 국부변환 신축기판에 $100{\mu}m$ 직경의 Cu/Au 범프를 갖는 Si 칩을 anisotropic conductive adhesive (ACA)를 사용하여 플립칩 본딩 후, ACA내 전도성 입자에 따른 플립칩 접속저항을 비교하였다. Au 코팅된 폴리머 볼을 함유한 ACA를 사용하여 플립칩 본딩한 시편은 $43.2m{\Omega}$의 접속저항을 나타내었으며, SnBi 솔더입자를 함유한 ACA로 플립칩 본딩한 시편은 $36.2m{\Omega}$의 접속저항을 나타내었다. 반면에 Ni 입자를 함유한 ACA를 사용하여 플립칩 본딩한 시편에서는 전기적 open이 발생하였는데, 이는 ACA내 Ni 입자의 함유량이 부족하여 entrap된 Ni 입자가 하나도 없는 플립칩 접속부가 발생하였기 때문이다.

• 한국마이크로전자및패키징학회:학술대회논문집
• /
• 한국마이크로전자및패키징학회 2004년도 ISMP Pb-free solders and the PCB technologies related to Pb-free solders
• /
• pp.233-241
• /
• 2004

A new alloy definition will be presented concerning increasing demands for the board level reliability of miniaturized interconnections. The damage mechanism for LFBGA components on different board finishes is not quite understood. Further demands from mobile phones are the drop test, characterizing interface performance of different package constructions in relation to decreased pad constructions and therefore interfaces. The paper discusses the characterization of interfaces based on SnPb, SnPbXYZ, SnAgCu and SnAgCuInNd ball materials and SnAgCuInNd as solder paste, the stability after accelerated tests and the description of modified interfaces strictly related to the assembly conditions, dissolution behavior of finishes on board side and the influence of intermetallic formation. The type of intermetallic as well as the quantity of intermetallics are observed, primaliry the hardness, E modules describing the ability of strain/stress compensation. First results of board level reliability are presented after TCT-40/+150. Improvement steps from the ball formulation will be discussed in conjunction to the implementation of lead free materials In order to optimize ball materials for area array devices accelareted aging conditions like TCTs were used to analyze the board level reliability of different ball materials for BGA, LFBGA, CSP, Flip Chip. The paper outlines lead-free ball analysis in comparison to conventional solder balls for BGA and chip size packages. The important points of interest are the description of processability related to existing ball attach procedures, requirements of interconnection properties and the knowledge gained the board level reliability. Both are the primary acceptance criteria for implementation. Knowledge about melting characteristic, surface tension depend on temperature and organic vehicles, wetting behavior, electrical conductivity, thermal conductivity, specific heat, mechanical strength, creep and relaxation properties, interactions to preferred finishes (minor impurities), intermetallic growth, content of IMC, brittleness depend on solved elements/IMC, fatigue resistance, damage mechanism, affinity against oxygen, reduction potential, decontamination efforts, endo-/exothermic reactions, diffusion properties related to finishes or bare materials, isothermal fatigue, thermo-cyclic fatigue, corrosion properties, lifetime prediction based on board level results, compatibility with rework/repair solders, rework temperatures of modified solders (Impurities, change in the melting point or range), compatibility to components and laminates.