• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.1
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• pp.28-35
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• 2007

This paper presents a high-speed flash analog-to-digital converter (ADC) for ultra wide band (UWB) receivers. In this flash ADC, the interpolating technique is adopted to reduce the number of the amplifiers and a linear and wide-bandwidth interpolating amplifier is presented. For this ADC, the transistor size for the cascaded stages is inversely scaled to improve the trade-off in bandwidth and power consumption. The active inductor peaking technique is also employed in the pre-amplifiers of comparators and the track-and-hold circuit to enhance the bandwidth. Furthermore, a digital-to-analog converter (DAC) is embedded for the sake of measurements. This chip has been fabricated in $0.13{\mu}m$ 1P8M CMOS process and the total power consumption is 113mW with 1V supply voltage. The ADC achieves 4-bit effective number of bits (ENOB) for input signal of 200MHz at 5-GSample/sec.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.12
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• pp.20-27
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• 1997

In this paper, a multiplying digital-to-analog converter (MDAC) circuit for low-power high-resolution CMOS algorithmic A/D converters (ADC's) is proposed. The proposed MDAC is designed to operte properly at a supply at a supply voltge between 3 V and 5 V and employs an analog0domain power reduction technique based on a bias switching circuit so that the total power consumption can be optimized. As metal-to-metal capacitors are implemented as frequency compensation capacitors, opamps' performance can be varied by imperfect process control. The MDAC minimizes the effects by the circuit performance variations with on-chip tuning circuits. The proposed low-power MDAC is implementd as a sub-block of a 10-bit 200kHz algorithmic ADC using a 0.6 um single-poly double-metal n-well CMOS technology. With the power-reduction technique enabled, the power consumption of the experimental ADC is reduced from 11mW to 7mW at a 3.3V supply voltage and the power reduction ratio of 36% is achieved.

• JSTS:Journal of Semiconductor Technology and Science
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• v.3 no.3
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• pp.139-144
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• 2003

We report the results of extensive mixed mode simulations and theoretical analysis to quantify the contribution of the edge direct tunneling (EDT) current on the total gate leakage current of 80nm NMOSFET with SiO2 gate dielectric. It is shown that EDT has a profound impact on basic analog circuit building blocks such as sample-hold (S/H) circuit and the current mirror circuit. A transistor design methodology with zero gate-source/drain overlap is proposed to mitigate the EDT effect. This results in lower voltage droop in S/H application and better current matching in current mirror application. It is demonstrated that decreasing the overlap length also improves the basic analog circuit performance metrics of the transistor. The transistor with zero gate-source/drain overlap, results in better transconductance, input resistance, output resistance, intrinsic gain and unity gain transition frequency.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1019-1022
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• 2003

This paper has proposed a 4- bit 20MHz Flash A/D converter design available analog signal processing and realized its intergrated circuit. The parallel comparison method A/D converter quantized analog signals swiftly using various converters. Also this theme has designed economic power dissipation circuit using a preamplifier of low volt & power CMOS comparator. Also the system was fabricated by Hynix 0.35um CMOS process.

• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.960-964
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• 2003

In this paper, the CMOS integrated circuit technique for implementing current-mode maximum and minimum operations scheme is described. The maximum and minimum operations are incorporated into the same scheme with parallel processing. Using this scheme as the basic unit, an analog three-input maximum, median, and minimum circuit is designed. The performance of the proposed circuit shows a very sharp transfer characteristic and high accuracy. The proposed circuit achieves a high-speed operation, which is suitable for real-time systems. The PSPICE simulation results demonstrating the characteristic of the proposed circuit are included.

• The Journal of the Korea Contents Association
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• v.13 no.10
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• pp.54-61
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• 2013

This paper presents a simplified hardware based edge detection circuit which is based on an analog correlator combining with the neighbor pixels in CMOS image sensor. A pixel element of the edge detector consists of an active pixel sensor and an analog correlator circuit which connects two neighbor pixels. The edge detector shares a comparator on each column that the comparator decides an edge of the target pixel with an adjustable reference voltage. The circuit detects image edge from CIS directly that reduces area and power consumption 4 times and 20%, respectively, compared with the previous works. And also it has advantage to regulate sensitivity of the edge detection because the threshold value is able to control externally. The fabricated chip has 34% of fill factor and 0.9 ${\mu}W$ of power per a pixel under 0.18 ${\mu}m$ CMOS technology.

• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.73-77
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• 2003

This paper presents a high-speed algorithmic analog-to-digital converter (ADC), which is based on gray coding. The realization method makes use of a two-input maximum circuit to provide a high-speed operation and a low-distortion in the transfer characteristic. The proposed ADC based on the CMOS integrated circuit technique is simple and suitable for implementing a highresolution ADC. The performances of the proposed circuit were studied using the PSPICE analog simulation program. The simulation-results verifying the circuit performances are agreed with the expected values.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.34S no.5
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• pp.94-103
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• 1997

It is necesary that analog buffer circuit should drive an external load in the VLSI design such as switched capacitor efilter (SCF), D/A converter, A/d converter, telecommunicatin circuit, etc. The conventional CMOS buffer circuit have many probvlems according as CMOS technique. Firstly, Capacity of large load ar enot able to opeate well. The problem can be solve to use class AB stages. But large load are operated a difficult, because an element of existing CMOS has a quadratic functional relation with inptu and outut voltage versus output current. Secondly, whole circuit of dynamic rang edecrease, because a range of inpt and output voltages go down according as increasing of intergration rate drop supply voltage. In this paper suggests that new differential CMOS line driver make out of operating an external of large load. In telecommunication's chip case transmission line could be a load. It is necessary that a load operate line driver. The proposal circuit is planned to hav ea high generation power rnage of voltage with preservin linearity. And circuit of capability is inspected through simulation program (HSPICE).

• ETRI Journal
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• v.26 no.6
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• pp.560-564
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• 2004

An analog front-end circuit for ISO/IEC 14443-compatible radio frequency identification (RFID) interrogators was designed and fabricated by using a $0.25{\mu}m$ double-poly CMOS process. The fabricated chip was operated using a 3.3 Volt single-voltage supply. The results of this work could be provided as reusable IPs in the form of hard or firm IPs for designing single-chip ISO/IEC 14443-compatible RFID interrogators.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.12
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• pp.2257-2261
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• 2007

A new CMOS transresistance amplifier for low-voltage analog integrated circuit design applications is presented. The proposed transresistance amplifier circuit based on common-source and negative feedback topology is compared with other recent reported transresistance amplifier. The proposed transresistance amplifier achieves high transresistance gain, gain-bandwidth with the same input/output impedance and the minimum supply voltage $2V_{DSAT}+V_T$. Hspice simulation using 1.8V TSMC $0.18{\mu}m$ CMOS technology was performed and achieved $59dB{\Omega}$ transresistance gain which is above the maximum about $18dB{\Omega}$ compared to transresistance gain of the reported circuit.