• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2017.10a
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• pp.520-521
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• 2017

The converted error is occurred by the time difference between the time interval signal and the clock in a Time-to-Digital Converter of counter-type. If the clock period is $T_{CLOCK}$ the converted error is a maximum $T_{CLOCK}$ by the time difference between the start signal and the clock. And the converted error is a maximum $-T_{CLOCK}$ by the time difference between the stop signal and the clock. However, when the clock is synchronized with the start signal and the colck is generated during the time interval signal the range of converted digital error is from 0 to $(1/2)T_{CLOCK}$.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.6
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• pp.446-455
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• 2001

In this paper, the precise synchronized clock generator using GPS receiver is presented. The GPS receiver provides a synchronized IPPS signal which guaranties a reliable standard time mark. This signal allows us to do time synchronization and correct the time step. We designed and implemented the precise synchronized clock generator based on DPLL in order to generate a high-resolution clock from a low-cost inaccurate oscillator with ALTERA FLEX EPM6016TC144-3. We also implemented a hardware unit and proved that the unit provides 1MHz clock output which had a high resolution and accuracy when it was combined with GPS receiver.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.7
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• pp.1261-1266
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• 2017

A random and systematic jitter suppressed delay locked loop (DLL)-based clock generator with a delay-time voltage variance converter (DVVC) and an averaging circuit (AC) is presented. The DVVC senses the delay variance of each delay stage and generates a voltage. The AC averages the output voltages of two consecutive DVVCs to suppress the systematic and random delay variance of each delay stage in the VCDL. The DVVC and AC averages the delay time of successive delay stages and equalizes the delay time of all delay stages. In addition, a capacitor with a switch working effectively as a negative feedback function is introduced to reduce the variation of the loop filter output voltage. Measurement results of the DLL-based clock generator fabricated in a one-poly six-metal $0.18{\mu}m$ CMOS process shows 13.4-ps rms jitter.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.7
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• pp.68-73
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• 2009

This paper describes design and implementation of a spread spectrum clock generator (SSCG) for the DisplayPort. The proposed architecture generates the spread spectrum clock using a sigma-delta fractional-N PLL. The SSCG uses a digital End order MASH 1-1 sigma-delta modulator and a 9bit Up/Dn counter. By using MASH 1-1 sigma-delta modulator, complexity of circuit and chip area can be reduced. The advantage of sigma-delta modulator is the better control over modulation frequency and spread ratio. The SSCG generates dual clock rates which are 270MHz and 162MHz with 0.25% down-spreading and triangular waveform frequency modulation of 33kHz. The peak power reduction is 11.1dBm at 270MHz. The circuit has been designed and fabricated using in 0.18$\mu$m CMOS technology. The chip occupies 0.620mm$\times$0.780mm. The measurement results show that the fabricated chip satisfies the DispalyPort standard.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.5
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• pp.893-898
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• 2017

A TDC(Time-to-Digital Converter) of counter-type is designed by $0.18{\mu}mCMOS$process and the supply voltage is 1.5 volts. The converted error of maximum $T_{CK}$ is occurred by the time difference between the start signal and the clock when the period of clock is $T_{CK}$ in the conventional TDC. And the converted error of -$T_{CK}$ is occurred by the time difference between the stop signal and the clock. However in order to compensate the disadvantage of the conventional TDC the clock is generated within the TDC circuit and the clock is synchronized with the start and stop signals. In the designed TDC circuit the conversion error is not occurred by the difference between the start signal and the click and the magnitude of conversion error is reduced (1/2)$T_{CK}$ by the time difference between the stop signal and the clock.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.23 no.7
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• pp.816-821
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• 2019

A counter-type time-to-digital converter was designed using a dual edge T flip-flop. The time-to-digital converter was designed with a $0.18{\mu}m$ CMOS process at a supply voltage of 1.5 volts. In a typical time-to-digital converter, when the period of the clock is T, a conversion error corresponding to the period of the clock occurs due to the asynchronism between the input signal and the clock. However, the clock of the time-to-digital converter proposed in this paper is generated in synchronization with the start signal which is the input signal. As a result, conversion errors that may occur due to asynchronization of the start signal and the clock do not occur. The flip-flops constituting the counters are composed of dual-edge flip-flops operating at the positive and negative edges of the clock to improve the resolution.

• Journal of the Korea Society of Computer and Information
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• v.4 no.1
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• pp.28-37
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• 1999

In this paper. we developed a delay test architecture and test procedure for clocked 5-bit asynchronous counter circuit based on boundary scan architecture. To develope, we analyze the problems of conventional method on delay test for clocked sequential circuit in boundary scan architecture. This paper discusses several problems of delay test on boundary scan architecture for clocked sequential circuit. Conventional test method has some problems of improper capture timing, of same pattern insertion, of increase of test time. We suggest a delay test architecture and test procedure, is based on a clock count-generation technique to generate continuous clocks for clocked input of CUT. The simulation results or 5-bit counter shows the accurate operation and effectiveness of the proposed delay test architecture and procedure.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2011.10a
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• pp.436-439
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• 2011

본 논문은 클록 보정회로를 가진 1V 2.56-GS/s 6-bit flash analog-to-digital converter (ADC) 제안한다. 제안하는 ADC 구조에서 아날로그 블록은 단일 T/H와 2단의 프리앰프, 그리고 비교기를 사용된다. 2단의 프리앰프와 비교기의 출력에 옵셋의 크기를 줄이기 위하여 저항 평균화 기법을 적용하였다. 디지털 블록은 quasi-gray rom base 구조를 사용한다. 3입력 voting 회로로 flash ADC에서 발생하기 쉬운 bubble error를 제거하였으며, 고속 동작을 위해 단일 클록을 사용하는 TSPC F/F로 구현한다. 제안하는 flash ADC는 클록 듀티 비를 조절할 수 있는 클록 보정회로를 사용한다. 클록 보정 회로는 비교기 클록 듀티 비를 조절하여 리셋 시간과 evaluation 시간의 비율을 최적화함으로 dynamic 특성을 확보한다. 제안한 flash ADC는 1V 90nm의 CMOS 공정에서 설계되었다. Full power bandwidth인 1.2 GHz 입력에 대하여 ADC 성능을 시뮬레이션을 통해 확인하였다. 설계된 flash ADC의 면적과 전력소모는 각각 $800{\times}400\;{\mu}m^2$와 193.02mW 이다.

• Journal of IKEEE
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• v.15 no.1
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• pp.23-28
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• 2011

This paper describes design and implementation of a spread spectrum clock generator(SSCG). The proposed architecture generates the spread spectrum clock controlling a input voltage signal for VCDL(Voltage Controlled Delay Line). Spread charge pump is controlled by the SSC modulation logic block provides a control signal to VCDL through LPF in DLL. By using this architecture, chip area and power consumption can be reduced because it is not necessary additional circuit to control modulation rate. This circuit has been designed and fabricated using the UMC 0.25um CMOS technology. The chip occupies an area of 290${\times}$120um^2.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.6
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• pp.13-21
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• 2010

A energy efficient $V_{pp}$ generator using a variable pumping frequency for mobile DRAM is presented in this paper. The proposed $V_{pp}$ generator exploits 3 stages of a cross-coupled charge pump for energy efficiency. Instead of using a fixed pumping frequency in the conventional $V_{pp}$ generator, our proposed $V_{pp}$ generator adopts a voltage-controlled oscillator and uses variable frequencies to reduce the ramp-up time. As a result, our $V_{pp}$ generator generates 3.0 V output voltage with 24.0-${\mu}s$ ramp-up time at 2 mA current load and 1 nF capacitor load with 1.2 V supply voltage. Experimental results show that the proposed $V_{pp}$ generator consumes around 26% less energy (1573 nJ $\rightarrow$ 1162 nJ) and reduces 29% less ramp-up time (33.7-${\mu}s$ $\rightarrow$ 24.0-${\mu}s$) compared to the conventional approach.