• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.5
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• pp.54-64
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• 2002

Recently System On a Chip(SoC) design based on IP cores has become the trend of If design To prevent the testing problem from becoming the bottleneck of the core-based design, defining of an efficient test architecture and a successful test methodology are mandatory. This paper describes a test architecture and a test control access mechanism for SoC based on IEEE 1149.1 boundary,scan. The proposed SoC test architecture is fully compatible with IEEE P1500 Standard for Embedded Core Test(SECT), and applicable for both TAPed cores and Wrapped cores within a SOC with the same test access mechanism. Controlled by TCK, TMS, TDI, and TDO, the proposed test architecture provides a hierarchical test feature.

• Proceedings of the Korean Institute of Intelligent Systems Conference
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• 2000.05a
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• pp.17-20
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• 2000

본 논문에서는 간단한 비선형 시냅스 회로를 이용하여 온 칩 학습기능을 포함한 모듈 칩을 구현하였다. 학습 회로는 MEBP(modified error back-propagation) 학습 규칙을 적용하여 구현하였으며, 제안된 회로는 표준 CMOS 공정으로 구현되었고, MOSIS AMI $1.5\mu\textrm{m}$공정 HSPICE 파라메터를 이용하여 그 동작을 검증하였다. 구현된 모듈 칩은 온 칩 학습기능을 가진 확장 가능한 신경회로망 칩으로 대규모의 FNNs(feedforwad neural networks) 구현에 매우 적합하리라 예상된다.

• IEMEK Journal of Embedded Systems and Applications
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• v.5 no.1
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• pp.1-6
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• 2010

본 논문에서는 네트워크 온 칩(NoC: network on chip) 구조에서의 내부 데이터 통신의 성능을 최적화 할 수 있는 새로운 온 칩 네트워크 인터페이스 구조를 제안하였다. 제안하는 NoC 구조는 기본적으로 하드웨어 면적을 줄이기 위하여 XY 라우팅 알고리듬을 기반으로 구현되었으며, 전달되는 패킷의 크기 또는 플릿의 개수를 최소화하기 위하여 Golomb-Rice 인코딩/디코딩 알고리듬에 기반을 둔 하드웨어 압축기/해제기를 이용하여 통신되는 데이터의 양을 크게 줄임으로써 네트워크 지연시간을 최소화 할 수 있는 새로운 구조를 제안하였다. 즉 전송될 데이터는 전송자(sender)의 네트워크 인터페이스에서 내장된 하드웨어 인코더를 통해 압축된 형태로 패킷의 개수를 최소화하여 온 칩 네트워크상의 데이터를 업로드하게 된다. 이러한 압축된 데이터가 리시버(receiver)에 도착하면, 하드웨어 디코더를 통해서 원래의 데이터로 복원된다. 사이클 수준의 시뮬레이터를 통하여 제안된 라우터 구조가 온 칩 시스템의 네트워크 지연시간을 크게 줄일 수 있음을 증명하였다.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.713-715
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• 2012

본 논문은 24GHz 차량 추돌 예방 레이더 시스템-온-칩을 위한 입력 임피던스, 전압이득 및 잡음지수를 자동으로 측정할 수 있는 새로운 형태의 고주파 자체 내부검사(BIST, Built-In Self-Test) 회로를 제안한다. 이러한 BIST 회로는 TSMC $0.13{\mu}m$ 혼성신호/고주파 CMOS 공정 ($f_T/f_{MAX}$=140/120GHz)으로 설계되어 있다. 알고리즘은 LabVIEW로 구현되어 있다. BIST 알고리즘은 입력 임피던스 정합과 출력 직류 전압 측정원리를 이용한다. 본 논문에서 제안하는 방법은 자동으로 쉽게 고주파 회로의 성능변수를 측정할 수 있기 때문에 시스템-온-칩의 저가 성능 검사의 대안이 될 것으로 기대한다.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2002.05a
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• pp.96-99
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• 2002

This paper describes the implementation of a SoC(system on a Chip) for a mult communication terminal in ISDN network and also reviews the developed software struct service procedures which are working on the SoC. And finally this paper descr： of an ISDN terminal equipment using the implemented SoC and terminal software.

• Journal of KIISE:Computer Systems and Theory
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• v.35 no.3
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• pp.120-132
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• 2008

Networks-on-Chip (NoC) is emerging as a practical development platform for future systems-on-chip products. We propose an energy-efficient static algorithm which optimizes the energy consumption of task communications in NoCs with voltage scalable links. In order to find optimal link speeds, the proposed algorithm (based on a genetic formulation) globally explores the design space of NoC-based systems, including network topology, task assignment, tile mapping, routing path allocation, task scheduling and link speed assignment. Experimental results show that the proposed design technique can reduce energy consumption by 28% on average compared with existing techniques.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2010.10a
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• pp.718-721
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• 2010

본 논문은 고주파 시스템-온-칩 응용을 위한 자동 보상 시스템을 제안한다. 이러한 시스템은 고주파 회로 칩 제작과정에서 예기치 않게 발생한 미세한 PVT(공정, 전압, 온도) 변동으로 인한 회로 성능 변수들의 미세변동을 검출하여 이를 자동으로 보상한다. 자동으로 보상 가능한 고주파 회로 성능 변수들은 중요한 요소인 입력 임피던스, 전압이득 및 잡음지수를 포함한다. 이러한 시스템은 미세 변동을 자동으로 보상할 수 있도록 고주파 신호를 직류 신호로 변환하는 DFT(Design-for-Testability) 회로를 포함한다.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.15 no.3
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• pp.632-638
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• 2011

This paper presents on-chip Design-for-Testability (DFT) circuit for radio frequency System-on-Chip (SoC) applications. The proposed circuit measures functional specifications of RF integrated circuits such as input impedance, gain, noise figure, input voltage standing wave ratio (VSWRin) and output signal-to-noise ratio (SNRout) without any expensive external equipment. The RF DFT scheme is based on developed theoretical expressions that produce the actual RF device specifications by output DC voltages from the DFT chip. The proposed DFT showed deviation of less than 2% as compared to expensive external equipment measurement. It is expected that this circuit can save marginally failing chips in the production testing as well as in the RF system; hence, saving tremendous amount of revenue for unnecessary device replacements.

• Journal of KIISE:Computer Systems and Theory
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• v.32 no.11_12
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• pp.629-638
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• 2005

In the System on a Chip design, the on chip bus is one of the critical factors that decides the overall system performance. Especially, in the case or reusing the IPs such as processors, DSPs and multimedia IPs that requires higher bandwidth, the bandwidth problems of on chip bus are getting more serious. Recently ARM proposes the Multi-Layer AHB BusMatrix that is a highly efficient on chip bus to solve the bandwidth problems. The Multi-Layer AHB BusMatrix allows parallel access paths between multiple masters and slaves in a system. This is achieved by using a more complex interconnection matrix and gives the benefit of increased overall bus bandwidth, and a more flexible system architecture. However, there is one clock cycle delay for each master in existing Multi-Layer AHB BusMatrix whenever the master starts new transactions or changes the slave layers because of the Input Stage and arbitration logic realized with Moore type. In this paper, we improved the existing Multi-Layer AHB BusMatrix architecture to solve the one clock cycle delay problems and to reduce the area overhead of the Input Stage. With the elimination of the Input Stage and some restrictions on the arbitration scheme, we tan take away the one clock cycle delay and reduce the area overhead. Experimental results show that the end time of total bus transaction and the average latency time of improved Multi-Layer AHB BusMatrix are improved by $20\%\;and\;24\%$ respectively. in ease of executing a number of transactions by 4-beat incrementing burst type. Besides the total area and the clock period are reduced by $22\%\;and\;29\%$ respectively, compared with existing Multi-layer AHB BusMatrix.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.6 no.3
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• pp.410-415
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• 2002

This paper describes the implementation of a SoC(System-on-a-Chip) and an ISDN communication terminal by the SoC in ISDN network. The SoC has been developed with the functions of 32-bit ARM7TDMI RISC core processor, network connection with S/T interface, TDM--bus interface and voice codec, user interface. And we also review the developed software structure and the ISDN service protocol procedures which are working on the SoC. And finally this paper describers a structure of an ISDN terminal equipment using the implemented SoC and terminal software.