• Journal of Advanced Marine Engineering and Technology
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• v.22 no.5
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• pp.687-692
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• 1998

Test pattern generation is one of most difficult problems encountered in automating the design of logic circuits. The goal is to obtain the highest fault coverage with the minimum number of test patterns for a given circuit and fault set. although there have been many deterministic algorithms and heuristics the problem is still highly complex and time-consuming. Therefore new approach-es are needed to augment the existing techniques. This paper considers the problem of test pattern improvement for combinational circuits as a restricted subproblem of the test pattern generation. The problem is to maximize the fault coverage with a fixed number of test patterns for a given cir-cuit and fault set. We propose a new approach by use of a genetic algorithm. In this approach the genetic algorithm evolves test patterns to improve their fault coverage. A fault simulation is used to compute the fault coverage of the test patterns Experimental results show that the genetic algorithm based approach can achieve higher fault coverages than traditional techniques for most combinational circuits. Another advantage of the approach is that the genetic algorithm needs no detailed knowledge of faulty circuits under test.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.29A no.11
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• pp.97-106
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• 1992

In integrated circuits, protection circuits are required to protect the internal nodes from the harmful ESD(Electrostatic discharge). This paper discusses the characteristics of the circuit components in ESD protection circuitry in order to analyze the ESD phenomina, and the design methodalogy of ESD protection circuits, using test pattern with a variation of the number of diode and transistor. The test devices are fabricated using a 0.8$\mu$m CMOS process. SPICE simulation was also carried out to relate output node voltage and measured ESD voltage. With increasing number of diodes and transistors in protection circuit, the ESD voltage also increases. The ESD voltage of the bi-directional circuit for both input and output was 100-300[V], which in higher than that of only output(uni-directional) circuit. In addition, the ESD protection circuit with the diode under the pad region was useful for the reduction of chip size and parasitic resistance. In this case, ESD voltage was improved to a value about 400[V].

• Journal of Power Electronics
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• v.17 no.2
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• pp.561-569
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• 2017

Power converter design requires simulation accuracy. In addition to the requirement of accurate models of power semiconductor devices, this paper highlights the role of considering a very good description of the converter circuit layout for an accurate simulation of its electrical behavior. This paper considers a simple experimental circuit including one switching cell where a MOSFET transistor controls the diode under test. The turn-off transients of the diode are captured, over which the circuit wiring has a major influence. This paper investigates the necessity for accurate modeling of the experimental test circuit wiring and the MOSFET transistor. It shows that a simple wiring inductance as the circuit wiring representation is insufficient. An adequate model and identification of the model parameters are then discussed. Results are validated through experimental and simulation results.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.44 no.4
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• pp.28-39
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• 2007

This paper presents a programmable RF DFT (Radio Frequency Design-for-Testability) circuit for low noise amplifiers. We have developed a new on-chip RF DFT circuit that measures RF parameters of low noise amplifier (LNA) using only DC measurements [1, 2]. This circuit is extremely useful for today's RFIC devices in a complete RF transceiver environment. The DFT circuit contains test amplifier with programmable capacitor banks and RF peak detectors. The test circuit utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the mathematical equations. Our on-chip DFT circuit can be self programmed for 1.8GHz, 2.4GHz and 5.25GHz low noise amplifiers for GSM, Bluetooth and IEEE802.11g standards. The circuit is simple and inexpensive.

• Proceedings of the KIEE Conference
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• summer
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• pp.587-589
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• 2004

In this paper analytical pattern classification of TRV waves created by double-frequency synthetic test circuit was proposed. According to the classified patterns of the TRV wave, calculation methods of 3 reference lines and 4 parameters characterizing the TRV wave wire proposed. These methods can be utilized to optimize test facility and to standardize test quality.

• Journal of the Korea Institute of Military Science and Technology
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• v.21 no.6
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• pp.857-864
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• 2018

This paper describes about the circuit design and test of the electronic Arm Fire Device. Electronic arm fire device consists of igniter, circuit and housing case and it operates without the actuator such as torque motor or solenoid. A high-voltage DC-DC converter was used to generate the voltage for initiating the LEEFI(Low Energy Exploding Foil Initiator). The MEMS switch was used to detect the acceleration that occurs when missile is launched, and the circuit was designed considering the size, performance, and specification of the electronic devices. The performance test was conducted to verify the designed circuit and we confirmed that it operates well.

• The Transactions of the Korean Institute of Power Electronics
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• v.27 no.3
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• pp.214-220
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• 2022

This paper proposes a test device designed for developing a high-voltage multilayer ceramic capacitor (MLCC). The proposed topology consists of an energy recovery circuit for charging/discharging capacitor, a flyback converter, and a boost converter for supplying power and a bias voltage application to the energy recovery circuit. The energy recovery circuit designed with a half-bridge converter has auxiliary switches operating before the main switches to prevent excessive current from flowing to the main switches. A prototype has been designed to verify the reliability of target capacitors following the voltage fluctuation with a frequency range below 65 kHz. To conduct high root mean square (RMS) current to the capacitor as a load, the MLCC test was conducted after the topology verification was completed through the film capacitor as a load. Through the agreement between the RMS current formula proposed in this paper and the MLCC test results, the possibility of its use was demonstrated for high-voltage MLCC development in the future.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• v.9 no.1
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• pp.995-998
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• 2005

This paper proposes a new SoC (System-on-Chip)-based automatic compensation circuit (ACC) for 5GHz low noise amplifier (LNA). This circuit is extremely useful for today's RF IC (Radio Frequency Integrated Circuit) devices in a complete RF transceiver environment. The circuit contains RF BIST (Built-ln Self-Test) circuit, Capacitor Mirror Banks (CMB) and digital processing unit (DPU). The ACC automatically adjusts performance of 5GHz LNA by the processor in the SoC transceiver when the LNA goes out of the normal range of operation.

• Proceedings of the KIEE Conference
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• 2003.10b
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• pp.63-65
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• 2003

In the case of the large motors which can't direct load tests, IEEE 112 equivalent circuit test was selected instead of the circle diagram method in the newly KEPIC's code. According to the change of code, Hyosung established an equivalent circuit test method based on Standard IEEE 112. In this paper, we compared the test results between IEEE 112 and other standards, CSA C-390, JEC2137 for the large motors.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.53 no.1
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• pp.22-27
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• 2004

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.