Journal of the Institute of Electronics Engineers of Korea TC (대한전자공학회논문지TC)

The Institute of Electronics and Information Engineers (대한전자공학회)
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New Programmable RF DFT Circuit for Low Noise Amplifiers

LNA를 위한 새로운 프로그램 가능 고주파 검사용 설계회로

  • Ryu, Jee-Youl (Samsung SDI Co., Ltd.) ;
  • Noh, Seok-Ho (Major of Electronic Engineering, College of Electronic & Information Engineering, Andong National University)
  • 류지열 (삼성 SDI Mobile Display 개발팀) ;
  • 노석호 (안동대학교 전자공학과)
  • Published : 2007.04.25
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Abstract

This paper presents a programmable RF DFT (Radio Frequency Design-for-Testability) circuit for low noise amplifiers. We have developed a new on-chip RF DFT circuit that measures RF parameters of low noise amplifier (LNA) using only DC measurements [1, 2]. This circuit is extremely useful for today's RFIC devices in a complete RF transceiver environment. The DFT circuit contains test amplifier with programmable capacitor banks and RF peak detectors. The test circuit utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the mathematical equations. Our on-chip DFT circuit can be self programmed for 1.8GHz, 2.4GHz and 5.25GHz low noise amplifiers for GSM, Bluetooth and IEEE802.11g standards. The circuit is simple and inexpensive.

본 논문에서는 저잡음 증폭기 (LNA)를 위한 새로운 구조의 프로그램 가능한 고주파 검사용 설계회로 (RF DFT)를 제안한다. 개발된 RF DFT 회로는 DC 측정만을 이용하여 LNA의 RF 변수를 측정할 수 있으며, 최근의 RFIC 소자에 매우 유용하다. DFT 회로는 프로그램 가능한 커패시터 뱅크 (programmable capacitor banks)와 RF 피크 검출기를 가진 test amplifier를 포함하며, 측정된 출력 DC 전압을 이용하여 입력 임피던스와 전압이득과 같은 LNA 사양을 계산할 수 있다. 이러한 온 칩 DFT 회로는 GSM, Bluetooth 및 IEEE802g 표준에 이용할 수 있는 3가지 주파수 대역, 즉 1.8GHz, 2.4GHz, 5.25GHz용 LNA에서 사용할 수 있도록 자체적으로 프로그램 할 수 있다. 이 회로는 간단하면서도 저렴하다

Keywords

References

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