• 제목/요약/키워드: step-stress accelerated life testing

검색결과 11건 처리시간 0.019초

Necessity of step-stress accelerated life testing experiment at higher steps

  • Chandra, N.;Khan, Mashroor Ahmad;Pandey, M.
    • International Journal of Reliability and Applications
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    • 제15권2호
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    • pp.85-98
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    • 2014
  • Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

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Parameter Estimation of the Two-Parameter Exponential Distribution under Three Step-Stress Accelerated Life Test

  • Moon, Gyoung-Ae;Kim, In-Ho
    • Journal of the Korean Data and Information Science Society
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    • 제17권4호
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    • pp.1375-1386
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    • 2006
  • In life testing, the lifetimes of test units under the usual conditions are so long that life testing at usual conditions is impractical. Testing units are subjected to conditions of high stress to yield informations quickly. In this paper, the inferences of parameters on the three step-stress accelerated life testing are studied. The two-parameter exponential distribution with a failure rate function that a log-quadratic function of stress and the tempered failure rate model are considered. We obtain the maximum likelihood estimators of the model parameters and their confidence regions. A numerical example will be given to illustrate the proposed inferential procedures.

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Parametric inference on step-stress accelerated life testing for the extension of exponential distribution under progressive type-II censoring

  • El-Dina, M.M. Mohie;Abu-Youssef, S.E.;Ali, Nahed S.A.;Abd El-Raheem, A.M.
    • Communications for Statistical Applications and Methods
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    • 제23권4호
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    • pp.269-285
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    • 2016
  • In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

Exponentiality Test of the Three Step-Stress Accelerated Life Testing Model based on Kullback-Leibler Information

  • Park, Byung-Gu;Yoon, Sang-Chul;Lee, Jeong-Eun
    • Journal of the Korean Data and Information Science Society
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    • 제14권4호
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    • pp.951-963
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    • 2003
  • In this paper, we propose goodness of fit test statistics based on the estimated Kullback-Leibler information functions using the data from three step stress accelerated life test. This acceleration model is assumed to be a tampered random variable model. The power of the proposed test under various alternatives is compared with Kolmogorov-Smirnov statistic, Cramer-von Mises statistic and Anderson-Darling statistic.

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병렬형 시스템의 부분적 가속수명검사를 위한 최적계획 (Optimal design of Partially Accelerated Life Testing for the Parallel Systems)

  • 박희창;이석훈
    • 품질경영학회지
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    • 제24권4호
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    • pp.14-28
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    • 1996
  • We consider optimal designs of partially accelerated life testing which is deviced for parallel systems with the considerably long life time. In partially step-stress life testing, test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. In partially constant-stress life testing, test items are run at either use or accelerated condition only until a specified censoring time. The optimal criterion for each test is to minimize either the generalized asymptotic variance of maximum likelihood(ML) estimators of the hazard rates at use condition and the acceleration factors or the asymptotic variance of the ML estimators of the acceleration factors.

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Testing Exponentiality of Kullback-Leibler Information Function based on a Step Stress Accelerated Life Test

  • 박병구;윤상철
    • 한국통계학회:학술대회논문집
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    • 한국통계학회 2000년도 추계학술발표회 논문집
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    • pp.235-240
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    • 2000
  • In this paper a test of fit for exponentiality and we propose the estimator of Kullback-Leibler Information functions using the data from accelerated life tests. This acceleration model is assumed to be a tampered random variable model. The procedure is applicable when the exponential parameter based on the data from accelerated life tests is or is not specified under null hypothesis. Using Simulations, the power of the proposed test based on use condition of accelerated life test under alternatives is compared with that of other standard tests in the small sample.

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Bilevel-programming based failure-censored ramp-stress ALTSP for the log-logistic distribution with warranty cost

  • Srivastava, P.W.;Sharma, D.
    • International Journal of Reliability and Applications
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    • 제17권1호
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    • pp.85-105
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    • 2016
  • In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

Optimum time-censored ramp soak-stress ALT plan for the Burr type XII distribution

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • 제15권2호
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    • pp.125-150
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    • 2014
  • Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

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부분적 단계충격 수명검사에 관한 직렬형 시스템의 최적 검사계획 (Optimal design of partially step-stress life testing for the series systems)

  • 박희창;이석훈
    • 응용통계연구
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    • 제8권2호
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    • pp.121-132
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    • 1995
  • 정상조건에서 수명이 상당히 긴 다수의 부품으로 구성된 직렬형 시스템의 수명검사를 현실적으로 수행하기 위해 부분적 단계충격 수명검사의 최적 검사계획에 관하여 고찰하였다. 시스템을 구성하고 있는 부품의 수명이 서로 독립인 지수분포를 따르는 것으로 가정하여 각 부품의 고장률과 가속인자의 최우추정량을 구하였다. 또한 각 부품의 고장률과 가속인자에 관한 최우추정량의 일반화 점근분산의 합과 각 부품의 가속인자에 관한 최우추정량의 점근분산의 합을 구하여 이를 최소가 되게 하는 최적변환시점의 결정방법을 제안하였다.

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계단충격가속수명시험에서의 지수분포에 대한 적합도검정 (Goodness of Fit Testing for Exponential Distribution in Step-Stress Accelerated Life Testing)

  • 조건호
    • Journal of the Korean Data and Information Science Society
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    • 제5권2호
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    • pp.75-85
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    • 1994
  • 계단 충격 가속수명시험에서 통계적 추론을 위해 가정하는 수명분포에 대한 적합도검정을 Kolmogorov-Smirnov, Kuiper, Watson, Cramer-von Mises, Anderson-Darling과 같은 비모수적 검정통계량에 대하여 몬테칼로 방법을 이용한 기각치를 구하고, 검정력 측면에서 비교, 연구한다.

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