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http://dx.doi.org/10.5351/CSAM.2016.23.4.269

Parametric inference on step-stress accelerated life testing for the extension of exponential distribution under progressive type-II censoring  

El-Dina, M.M. Mohie (Department of Mathematics, Faculty of Science, Al-Azhar University)
Abu-Youssef, S.E. (Department of Mathematics, Faculty of Science, Al-Azhar University)
Ali, Nahed S.A. (Department of Mathematics, Faculty of Education, Ain Shams University)
Abd El-Raheem, A.M. (Department of Mathematics, Faculty of Education, Ain Shams University)
Publication Information
Communications for Statistical Applications and Methods / v.23, no.4, 2016 , pp. 269-285 More about this Journal
Abstract
In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.
Keywords
step-stress accelerated life testing; progressive type-II censoring; Bayes estimation; extension of the exponential distribution; cumulative exposure model; bootstrap confidence interval; simulation study;
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