• Title/Summary/Keyword: process capability indices

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Estimating Process Capability with Truncated Samples (절단 표본을 이용한 공정능력의 추정)

  • Kim, Young-Jin
    • IE interfaces
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    • v.16 no.spc
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    • pp.65-69
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    • 2003
  • Process capability has long been viewed as a critical performance measure to indicate how well a process meet the specifications and customer requirements. Several indices, including $C_p$ and $C_{pk}$, have been proposed and widely implemented to quantify the process capability. However, these indices have been obtained without regard to inspection or screening procedures through which finished products will be truncated at the specifications. Consequently, only a fraction of outgoing products within the specifications will be passed into the customers. From the customer's point of view, it will thus be meaningful to assess the process capability with truncated samples. This article investigates how to estimate the process capability when only incomplete truncated data are available. On the basis of parameter estimation for truncated samples, the proposed methodology may be helpful to evaluate the process capability by examining a sample of items from the lots submitted.

On Statistical Estimation of Multivariate (Vector-valued) Process Capability Indices with Bootstraps)

  • Cho, Joong-Jae;Park, Byoung-Sun;Lim, Soo-Duck
    • Communications for Statistical Applications and Methods
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    • v.8 no.3
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    • pp.697-709
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    • 2001
  • In this paper we study two vector-valued process capability indices $C_{p}$=($C_{px}$, $C_{py}$ ) and C/aub pm/=( $C_{pmx}$, $C_{pmy}$) considering process capability indices $C_{p}$ and $C_{pm}$ . First, two asymptotic distributions of plug-in estimators $C_{p}$=($C_{px}$, $C_{py}$ ) and $C_{pm}$ =) $C_{pmx}$, $C_{pmy}$) are derived.. With the asymptotic distributions, we propose asymptotic confidence regions for our indices. Next, obtaining the asymptotic distributions of two bootstrap estimators $C_{p}$=($C_{px}$, $C_{py}$ )and $C_{pm}$ =( $C_{pmx}$, $C_{pmy}$) with our bootstrap algorithm, we will provide the consistency of our bootstrap for statistical inference. Also, with the consistency of our bootstrap, we propose bootstrap asymptotic confidence regions for our indices. (no abstract, see full-text)see full-text)e full-text)

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Optimization of Process Capability Index by Loss Function of Taguchi (다구찌의 손실함수(損失函數)를 이용한 공정능력지수(工程能力指數)의 최적화(最適化)에 관한 연구(硏究))

  • Gu, Bon-Cheol;Song, Dan-Il
    • Journal of Korean Society for Quality Management
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    • v.20 no.1
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    • pp.80-90
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    • 1992
  • In industries, the capability indices $C_p$ and $C_{pk}$ can be used to provide measures of process potential capability and performance, respectively. The new approach advocated by Taguchi in quality control overcomes some problems in other approaches preventive management activities. Taguchi introduces the emphasis on loss function to improve quality of products on the side of customer. The proceeding concept of capability indices is not rational for the measurement of quality if the process mean is not equal to target value. The Taguchi approach is said to be more reasonable than the others in quality evaluation because of his loss function. However, the capability indices $C_{pm}{^+}$ and $C_{pn}$ using Taguchi's loss function only consider, acceptance cost for deviation from target value within specification limits. In other words, they do not include rejection cost for nonconformings that are failed to fall on the specification limits.

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A New Multivariate System Process Capability Index (다변량 시스템 공정능력지수(SCpsk))

  • 조남호;이용훈
    • Journal of the Korea Safety Management & Science
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    • v.5 no.3
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    • pp.145-156
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    • 2003
  • As we understand it, Process Capability indices are intended to provide single-number assessments of ability to meet specification limits on quality characteristics of interest. As a consequence of the varied ways in which PCIs are used, there have been two natural lines of research work: $\circled1$ studies on the properties of PCIs and their estimators in many different environments; $\circled2$ construction of new PCIs purporting to have better properties in certain circumstances. The most of existing process capability indices are concerned with the single variable. But, in many cases, a quality characteristic is composed with several factors. In that case, we want to know the integrated process capability of a quality characteristic not those of each factor. In this paper, we proposed a new multivariate system process capability index called $MSPCI:SC_{psk}$ which is the geometric mean of performance measure $C_{psk}$'S, and will be used as the criterion to assess multiple response process designs. Numerical illustration is done for $SC_{psk}$, $\overline{C_p}$(f), Cp, Cpk, Cpm, and Cpsk.

A Study on a Measure for Non-Normal Process Capability (비정규 공정능력 측도에 관한 연구)

  • 김홍준;김진수;조남호
    • Proceedings of the Korean Reliability Society Conference
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    • 2001.06a
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    • pp.311-319
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    • 2001
  • All indices that are now in use assume normally distributed data, and any use of the indices on non-normal data results in inaccurate capability measurements. Therefore, $C_{s}$ is proposed which extends the most useful index to date, the Pearn-Kotz-Johnson $C_{pmk}$, by not only taking into account that the process mean may not lie midway between the specification limits and incorporating a penalty when the mean deviates from its target, but also incorporating a penalty for skewness. Therefore we propose, a new process capability index $C_{psk}$( WV) applying the weighted variance control charting method for non-normally distributed. The main idea of the weighted variance method(WVM) is to divide a skewed or asymmetric distribution into two normal distribution from its mean to create two new distributions which have the same mean but different standard distributions. In this paper we propose an example, a distribution generated from the Johnson family of distributions, to demonstrate how the weighted variance-based process capability indices perform in comparison with another two non-normal methods, namely the Clements and the Wright methods. This example shows that the weighted valiance-based indices are more consistent than the other two methods In terms of sensitivity to departure to the process mean/median from the target value for non-normal process.s.s.s.

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Better Statistical Test for Process Capability Index $C_p$ (공정능력지수 $C_p$에 대한 효율적인 가설검정)

  • Cho, Joong-Jae;Lim, Soo-Duck
    • Journal of Korean Society for Quality Management
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    • v.34 no.3
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    • pp.66-72
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    • 2006
  • The process capability indices are widely used to measure the capability of the process to manufacture items within the specified tolerance. Most evaluations on process capability indices focus on point estimates, which may result in unreliable assessments of process performance. The index $C_p$ has been widely used in various industries to assess process performance. In this paper, we propose new testing procedure on assessing $C_p$ index for practitioners to use in determining whether a given process is capable. The provided approach is easy to use and the decision making is more reliable. Whether a process is clearly normal or nonnormal, our bootstrap testing procedure could be applied effectively without the complexity of calculation. A numerical result based on the proposed approach is illustrated.

A STUDY ON PROCESS CAPABILITY INDICES FOR NON-NORMAL DATA

  • Kwon Seungsoo;Park Sung H.;Xu Jichao
    • Proceedings of the Korean Society for Quality Management Conference
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    • 1998.11a
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    • pp.159-173
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    • 1998
  • Quality characteristics on the properties of process capability indices (PCIs) are often required to be normally distributed. But, if a characteristic is not normally distributed, serious errors can result from normal-based techniques. In this case, we may well consider the use of new PCIs specially designed to be robust for non-normality. In this paper, a newly proposed measure of process capability is introduced and compared with existing PCIs using the simulated non-normal data.

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More Comments on Non-Normal Process Capability Indices : $C_{NP}$(U, V, W) (비정규 공정능력지수의 고찰 : $C_{NP}$(U, V, W))

  • Kim Hong Jun;Kim Jin Soo
    • Proceedings of the Society of Korea Industrial and System Engineering Conference
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    • 2002.05a
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    • pp.371-377
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    • 2002
  • In this paper, We consider some generalization of these five basic indices to cover non-normal distribution. The proposed generalizations are compared with the five basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalization in measuring process capability. We compared an estimation methods by Clements with based on sample percentiles, WVM to calculate the proposed generalization as an example. The results indicated that Clements method is more accurate than percentile method, WVM in measuring process capability. But the calculations of percentile method are easy to understand, straightforward to apply, and show be valuable used for applications.

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Evaluation of Procss Capability measles for Exponential Distributed Data

  • Kim, Hong-Jun
    • Proceedings of the Korean Reliability Society Conference
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    • 2000.11a
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    • pp.375-384
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    • 2000
  • The main objective of this paper to purpose a evaluating methods of process capability measures for exponential distributed quality characteristics. For correctly evaluating process capability , the first thing , exponential data is applied the Lilliefors test statistic to the null hypothesis of nornality. The next, exponential parameters is estimated in terms of MLE , ME , MME and then evaluated , respectively , process capability index based on exponential curved (Ιe) proposed by in this study and process capability indices based on Pearson system and Johnson system.

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A New Measure of Process Capability for Non-Normal Process : $C_{psk}$ (비정규 공정에 대한 공정능력의 새로운 측도: $C_{psk}$)

  • 김홍준;송서일
    • Journal of Korean Society for Quality Management
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    • v.26 no.1
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    • pp.48-60
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    • 1998
  • This paper proposes a fourth generation index $C_{psk}$, constructed from $C_{psk}$, by introducing the factor|$\mu$-T| in the numerator as an extra penalty for the departure of the process mean from the preassigned target value T. The motivation behind the introduction of $C_{psk}$ is that when $T\neqM$ process shifts away from target are evaluated without respect to direction. All indices that are now in use assume normally distributed data, and any use of the indices on non-normal data results in inaccurate capability measurements. In this paper, a new process capability index $C_{psk}$ is introduced for non-normal process. The Pearson curve and the Johnson curve are selected for capability index calculation and data modeling the normal-based index $C_{psk}$ is used as the model for non-normal process. A significant result of this research find that the ranking of the six indices, $C_{p}$, $C_{pk}$, $C_{pm}$, ${C^*}_{psk}$, $C_{pmk}$, $C_{psk}$in terms of sensitivity to departure of the process median from the target value from the most sensitive one up to the least sensitive are $C_{psk}$, $C_{pmk}$, ${C^*}_{psk}$,$C_{pm}$, $C_{pk}$, $C_{p}$.

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