• 정보처리학회논문지A
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• 제17A권3호
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• pp.121-126
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• 2010

본 논문에서는 저 전압 스윙 기술을 적용하여 저 전력 회로를 구현하고, 슬립 트랜지스터 (sleep-transistor)를 이용하여 누설전류를 최소화하는 새로운 저 전력 MOS 전류모드 논리회로 (MOS current-mode logic circuit)를 제안하였다. 제안한 회로는 저 전압 스윙 기술을 적용하여 저 전력 특성을 갖도록 설계하였고 고 문턱전압 PMOS 트랜지스터 (high-threshold voltage PMOS transistor)를 슬립 트랜지스터로 사용하여 누설전류를 최소화하였다. 제안한 회로는 $16\;{\times}\;16$ 비트 병렬 곱셈기에 적용하여 타당성을 입증하였다. 이 회로는 슬립모드에서 기존 MOS 전류 모드 논리회로 구조에 비해 대기전력소모가 1/104로 감소하였으며, 정상 동작모드에서 11.7 %의 전력소모 감소효과가 있었으며 전력소모와 지연시간의 곱에서 15.1 %의 성능향상이 있었다. 이 회로는 삼성 $0.18\;{\mu}m$ CMOS 공정을 이용하여 설계하였으며, HSPICE를 통하여 검증하였다.

• 한국위성정보통신학회논문지
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• 제8권3호
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• pp.10-14
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• 2013

본 논문에서는 저전력 기술인 DVFS (Dynamic Voltage Frequency Scaling) 응용을 위하여, 동작주파수의 변화에도 소비전력이 일정한 특성을 갖는 전류모드 회로를 적용함에 있어서, 저속 동작에서 소비전력이 과다한 전류모드 회로의 문제점을 전류모드 회로에서 sub-threshold 영역 동작의 MOSFET을 적용함으로써 소비전력을 최소화하는 설계기술을 소개한다. 회로설계는 MOSFET BSIM 3모델을 사용하였으며, 시뮬레이션한 결과, strong-inversion 동작일 때 소비전력은 $900{\mu}W$이었으나, sub-threshold 영역으로 동작하였을 때, 소비전력이 $18.98{\mu}W$가 되어, 98 %의 소비전력의 절감효과가 있음을 확인하였다.

• Transactions on Electrical and Electronic Materials
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• 제14권5호
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• pp.235-241
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• 2013

A low power CMOS control circuit is applied in an integrated DC-DC buck converter. The integrated converter is composed of a feedback control circuit and power block with 0.35 ${\mu}m$ CMOS process. A current-sensing circuit is integrated with the sense-FET method in the control circuit. In the current-sensing circuit, a current-mirror is used for a voltage follower in order to reduce power consumption with a smaller chip-size. The N-channel MOS acts as a switching device in the current-sensing circuit where the sensing FET is in parallel with the power MOSFET. The amplifier and comparator are designed to obtain a high gain and a fast transient time. The converter offers well-controlled output and accurately sensed inductor current. Simulation work shows that the current-sensing circuit is operated with an accuracy of higher than 90% and the transient time of the error amplifier is controlled within $75{\mu}sec$. The sensing current is in the range of a few hundred ${\mu}A$ at a frequency of 0.6~2 MHz and an input voltage of 3~5 V. The output voltage is obtained as expected with the ripple ratio within 1%.

• 전력전자학회논문지
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• 제23권5호
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• pp.299-304
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• 2018

An ideal circuit breaker should supply electric power to loads without losses in a conduction state and completely isolate the load from the power source by providing insulation strength in a break state. Fault current is relatively easy to break in an Alternating Current (AC) circuit breaker because the AC current becomes zero at every half cycle. However, fault current in DC circuit breaker (DCCB) should be reduced by generating a high arc voltage at the breaker contact point. Large fire may occur if the DCCB does not take sufficient arc voltage and allows the continuous flow of the arc fault current with high temperature. A semiconductor circuit breaker with a power electronic device has many advantages. These advantages include quick breaking time, lack of arc generation, and lower noise than mechanical circuit breakers. However, a large load capacity cannot be applied because of large conduction loss. An extinguishing technology of DCCB with polymeric positive temperature coefficient (PPTC) device is proposed and evaluated through experiments in this study to take advantage of low conduction loss of mechanical circuit breaker and arcless breaking characteristic of semiconductor devices.

• ETRI Journal
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• 제19권2호
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• pp.35-47
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• 1997

A power amplifier operating at 3.3 V has been developed for CDMA/AMPS dual-mode cellular phones. It consists of linear GaAs power MESFET's, a new gate bias control circuit, and an output matching circuit which prevents the drain terminal of the second MESF from generating the harmonics. The relationship between the intermodulation distortion and the spectral regrowth of the power amplifier has been investigated with gate bias by using the two-tone test method and the adjacent channel leakage power ratio (ACPR) method of CDMA signals. The dissipation power of the power amplifier with a gate bias control circuit is minimized to below 1000 mW in the range of the low power levels while satisfying the ACPR of less than -26 dBc for CDMA mode. The ACPR of the power amplifier is measured to be -33 dBc at a high output power of 26 dBm.

• 전력전자학회논문지
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• 제25권2호
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• pp.87-93
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• 2020

This study proposes a gate driver that operates semiconductor switches in the bipolar pulsed power modulator. The proposed gate driver was designed to receive isolated power and synchronized signals through the gate transformer. The gate circuit has a separate delay in the on-and-off operation to prevent a short circuit between the top and bottom switches of each leg. On the basis of the proposed gate circuit, a bipolar pulsed power modulator prototype with a 2.5 kV/100 A rating was developed. Finally, the bipolar pulsed power modulator was tested under resistive load and plasma reactor load conditions. It is verified that the proposed gate driver can be applied to a bipolar pulsed power modulator.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1998년도 추계종합학술대회 논문집
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• pp.703-706
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• 1998

This paper presents an efficient substrate-bias generator(SBG)for low-power, high-density DRAM's The proposed SBG can supply stable voltage with switching the supply voltage of driving circuit, and it can substitude the small capacitance for the large capacitance. The charge pumping circuit of the SBG suffere no VT loss and is to be applicable to low-voltage DRAM's. Also it can reduce the power consumption to make VBB because of it's high pumping efficiency. Using biasing voltage with positive temperature coefficient, VBB level detecting circuit can detect constant value of VBB against temperature variation. VBB level during VBB maintaining period varies 0.19% and the power dissipation during this period is 0.16mw. Charge pumping circuit can make VBB level up to -1.47V using VCC-1.5V, and do charge pumping operation one and half faster than the conventional ones. The temperature dependency of the VBB level detecting circuit is 0.34%. Therefore the proposed SBG is expected to supply a stable VBB with less power consumption when it is used in low power DRAM's.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2000년도 학술대회 논문집 전문대학교육위원
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• pp.85-88
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• 2000

This paper was development a discharge lamp ballast in order to wave improvement of high power factor and high efficiency. The discharge lamp ballast consists of a power factor correction circuit and a correction circuit on switching frequency of inverter. Instead of passive power factor circuit, active power factor circuit is adopted. Because it has the advantage of size, weight, total harmonic distortion, out DC voltage regulation, and power factor. The power factor circuit with MG34262 is controlled by variable frequency discontinuous mode. Results experiments, discharge lamp ballast is showed to have excellent for the proposed electronic ballast's operation and characteristics.

• Journal of Power Electronics
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• 제11권5호
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• pp.669-676
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• 2011

A novel polarity inversion dc-dc power conversion circuit that features the high input to output step-up voltage conversion ratio characteristics is presented for high voltage DC power supply applications. The proposed circuit features the reduced voltage stresses of the components compared to those of the conventional ones. The operational principles of the proposed circuit are analyzed and comparative features are presented. The simulation results and experimental results are presented to verify the validity of the proposed circuit.

• 전력전자학회논문지
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• 제28권1호
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• pp.76-81
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• 2023

A new test circuit for an MMC-based valve HVDC power converter is proposed. The proposed scheme satisfies the required clauses from IEC-62501. The valve test current contains second harmonic component and DC offset as well as a fundamental component that is quite similar to the real operating arm current of MMC based HVDC power system. The structure of the proposed test circuit is simple compared to conventional test circuits. Furthermore, the power supply voltage rating of the proposed test circuit is reduced dramatically around 20% of the conventional scheme with the same current rating. The validity of the proposed test circuit is verified through simulation and experimental results.