• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.6 no.4
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• pp.39-45
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• 1997

Shadow moire topography has been used as a noncontact method for measuring the 3-D shapes of objects. The moire fringes are results from the superposition of a master grating and its shadow projected on the surface of an object. But in case of the classical shadow moire method, in general, the resolution is a few tenths of millimeter. It is difficult to use a phase -shifting method in shadow moire because it is impossible to obtain uniform phase shifts on the whole field. But in this study , We introduce a phase-shifting method to improve the resolution of the classical shadow moire method. This method is based on the fact that if the depth of object is much less than the distance between the observer and the master grating, the phase shifts are almost uniform on the whole field area. Finally, we applied this new phase-shifting method to the measurement of the 3-D shape of a coin.

• Journal of the Optical Society of Korea
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• v.10 no.4
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• pp.178-183
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• 2006

An in-line phase-shifting digital holographic microscopy system was constructed by inserting a conventional microscope in the object arm of a Mach-Zehnder interferometer. It was used to measure the three dimensional shape of a micro Fresnel lens. It was also shown that both the lateral and the axial resolutions of the in-line phase-shifting system using a self-calibration algorithm were superior to those of the best off-axis system.

• Journal of the Optical Society of Korea
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• v.12 no.4
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• pp.281-287
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• 2008

An acousto-optic tunable filter based 3-D micro surface profile measurement using an equally spaced 5 spectral phase shifting is described. The 5-bucket spectral phase shifting method is compared with a Fourier-transform method in the spectral domain. It can provide a fast measurement capability while maintaining high accuracy since it needs only 5 pieces of spectrally phase shifted imaging data and a simple calculation in comparison with the Fourier transform method that requires full wavelength scanning data and relatively complicated computation. The 3-D profile data of micro objects can be obtained in a few seconds with an accuracy of ${\sim}10nm$. The 3-D profile method also has an inherent benefit in terms of being speckle-free in measuring diffuse micro objects by employing an incoherent light source. Those simplicity and practical applicability is expected to have diverse applications in 3-D micro profilometry such as semiconductors and micro-biology.

• Journal of Korea Multimedia Society
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• v.25 no.8
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• pp.983-990
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• 2022

In this paper, we implemented a hierarchical encryption system using two-step phase-shifting digital holography(PSDH) technology based on XOR and scramble operations. The proposed encryption system is a system that authenticates access through the issuance of an encryption key for access to individual laboratories, department offices, and universities. In the encryption process, we proposed a double encryption method using XOR and scramble operation with digital technology and two-step phase-shifting digital holography with optical technology. In the two-step PSDH process, an new method of determining the reference wave intensity without measuring it by using random common object image gererated from digital encryption process was also proposed. In the decryption process, the process is performed in the reverse order of encryption process. And only when the various key information used in the encryption process is correct, the encrypted information can be decrypted, so that the user can access the desired place. That is, there is a feature that can hierarchically control the space that can be accessed according to the type of key issued in the proposed encryption system. Through the computer simulation, the feasibility of the proposed hierarchical encryption system was confirmed.

• Journal of the Korean Society for Nondestructive Testing
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• v.25 no.2
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• pp.67-73
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• 2005

The thickness of a Si3N4 thin film with a 100m nominal thickness was measured by use of a Mach-Zehnder interferometer. The map of the phase-delay through the thin film was obtained by an interframe intensity-correlation-matrix method that could elliminate phase-shifting errors. After the spatial phase-shifting errors were treated with a least-squares method, the reference to surface of the phase map was estimated. The overall accuracy of the method was found to be 5nm.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.6
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• pp.2457-2462
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• 2011

The need for rapid and accurate measurement of 3-dimensional objects is increasing due to the paradigmatic shift in manufacturing from mass production to small batch production. A three dimensional measurement technique which can provide the dimensional information of the object manufactured or to be manufactured has been developed. This method is based on phase shifting moire topology. Digital-Micromirror-Device (DMD) has been used in generating phase shifting moire fringes. And the mechanically moving optical components used for phase shifting, which might result in measurement errors, have been replaced by the DMD. Inherent $2\pi$-ambiguity problem, occurring in the calculation of phase from the light intensity distribution due to the nature of arctangent function, has been overcome by adapting the phase unwrapping method. The advantage of this technique is the easy change of the range and the resolution of the measurement by simply changing the computer generated grid pattern with the appropriate combination of projection lens of various focal length.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.7
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• pp.149-154
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• 2001

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

• Journal of the Korean Society for Precision Engineering
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• v.25 no.1
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• pp.85-91
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• 2008

White light scanning interferometry has gotten a firm position in 3D surface profile measuring field. Recently, the LCD industry gave a chance for this technology to enter into real industry fields. It is known that white-light phase-shifting algorithm give a best resolution compare to other algorithms, but there are some problems to be resolved. One of them is 300nm jump in height profile, called bat-wing effect. The main reason of this problem is an ambiguity of phase-peak detection algorithm, and some solution has been proposed, but it didn't work perfectly. In this paper, I will show the cases when these effects are occurred, and these height discrepancies will be almost disappeared when broad-band illuminators are used.

• Current Optics and Photonics
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• v.2 no.5
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• pp.474-481
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• 2018

We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.27 no.1
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• pp.109-112
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• 2013

It is well known that the maximum torque of a 3-phase induction motor does not vary as the resistance of rotor varies by proportional shifting. However, proportional shifting is derived using simplified equivalent circuit of induction motor. Therefore, there are some errors in the torque characteristics shown in the text book. This paper presents the torque characteristics using not simplified equivalent circuit but equivalent circuit. Errors produced by simplified equivalent circuit are presented.