1 |
K. Creath, “Step height measurement using two wavelength phase shifting interferometry,” Appl. Opt., vol. 26, no. 14, pp. 2810-2816, 1993
DOI
|
2 |
Hariharan P., Roeb. B and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt., vol. 26, no. 13, pp. 2504-2506, 1987
DOI
|
3 |
D. Kim, J. W. You and S. Kim, “White light on-axis digital holographic microscopy based on spectral phase shifting,” Opt. Exp., vol. 14, no. 1, pp. 229-234, 2006
DOI
|
4 |
H. J. Lee and S. K. Gil, “Error Analysis for Optical Security by means of 4-Step Phase-Shifting Digital Holography,” J. Opt. Soc. Korea, vol. 10, no. 3, pp. 118-123, 2006
과학기술학회마을
DOI
ScienceOn
|
5 |
D. Kim, B. J. Baek, Y. D. Kim and B. Javidi, “3D nano object recognition based on phase measurement technique,” J. Opt. Soc. Korea, vol. 11, no. 3, pp. 108-112, 2007
과학기술학회마을
DOI
ScienceOn
|
6 |
Y. Ishii, J. Chen, and K. Murata, “Digital phase-measuring interferometry with a tunable laser diode,” Opt. Lett., vol. 12, no. 4, pp. 233-235, 1988
DOI
|
7 |
C. Polhemus, “Two-wavelength interferometry,” Appl. Opt., vol. 12, no. 9, pp. 2071-2074, 1973
DOI
|
8 |
Y. Cheng and J. C. Wyant, “Two-wavelength phase shifting interferometry,” Appl. Opt., vol. 23, no. 24, pp. 4539-4543, 1984
DOI
|
9 |
M. Kinoshita, M. Takeda, H. Yago, Y. Watanabe, and T. Kurokawa, “Optical frequency-domain imaging microprofilometry with a frequency-tunable liquid-crystal Fabry-Perot etalon device,” Appl. Opt., vol. 38, no. 34, pp. 7063-7068, 1999
DOI
|
10 |
D. Kim and S. Kim, “Direct spectral phase function calculation for dispersive interferometric thickness profilometry,” Opt. Exp., vol. 12, no. 21, pp. 5117-5124, 2004
DOI
|
11 |
M. Takeda, Hideki Ina and Seiji Kobayashi, “Fouriertransform method of fringe-pattern analysis for computerbased topography and interferometry,” J. Opt. Soc. Am., vol. 72, no. 1, pp. 156 -160, 1982
DOI
|
12 |
J. Schwider and L. Zhou, “Dispersive interferometric profilometer,” Opt. Lett., vol. 19, no. 13, pp. 995-997, 1994
DOI
|
13 |
P. de Groot and L. Deck, “Three-dimensional imaging by sub-Nyquist sampling of white-light interferomgrams,” Opt. Lett., vol 18, no. 17, pp. 1462-1464, 1993
DOI
ScienceOn
|
14 |
K. Osak Y, “Multi channel phase shifted interferometry,” Opt. Lett., vol. 9, no. 2, pp. 59-61, 1984
DOI
|
15 |
L. Deck and P. de Groot, “Punctuated quadrature phase-shifting interferometry,” Opt. Lett., vol. 23, no. 1, pp. 19-21, 1998
DOI
|
16 |
J. Gass, A. Dakoff, and M. K. Kim, “Phase imaging without ambiguity by multiwavelength digital holography,” Opt. Lett., vol. 28, no. 13, pp. 1141-1143, 2003
DOI
ScienceOn
|
17 |
M. K. Kim, “Wavelength scanning digital interference holography for optical section imaging,” Opt. Lett., vol. 24, no. 23, pp. 1693-1695, 1999
DOI
|
18 |
D. Kim, S. Kim, H. Kong and Y. Lee, “Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter,” Opt. Lett., vol. 27, no. 21, pp. 1893-1895, 2002
DOI
|
19 |
S. Kuwamura and I. Yamaguchi, “Wavelength scanning profilometry for real-time surface shape profiling,” Appl. Opt., vol. 37, no. 19, pp. 4473-4482, 1997
DOI
|
20 |
M. Takeda, and H. Yamamoto, “Fourier-transform speckle profilometry: three dimenstional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces,” Appl. Opt., vol. 33, no. 34, pp. 7829-7837, 1994
DOI
|
21 |
P. Sandoz, J. Calatroni and G. Ttribillon, “Potential of a wavelength sampling approach for profilometry by phase shifting interferometry,” J. of Mod. Opt., vol. 46, no. 2, pp. 327-339, 1999
DOI
ScienceOn
|