• Journal of Korean Society for Quality Management
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• v.24 no.2
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• pp.25-43
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• 1996

This paper presents the optimal and practical constant-stress accelerated life test plans for the lognormal lifetime distribution tinder assumptions of intermittent inspection and Type-I censoring. In an optimal plan, the low stress level and the proportions of test units allocated at each stress are determined under given inspection scheme and number of inspections such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels in order to compromise the practical deficiencies of the optimal plan. Computational experiments are conducted to choose an allocation plan and a inspection scheme of the practical plan and to compare with test plans over a range of parameter values.

• International Journal of Reliability and Applications
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• v.6 no.1
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• pp.31-39
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• 2005

An economic life test sampling plan for products with exponential lifetime distribution is developed. To reduce test time, a test plan with curtailed Type II censoring is considered. A cost model is constructed which involves three cost components; test cost, accept cost, and reject cost. Determination of optimal plan minimizing the expected average cost per lot is discussed with a constraint related to consumer's risk. Some numerical examples are provided.

• International Journal of Reliability and Applications
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• v.15 no.1
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• Journal of Korean Society for Quality Management
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• v.30 no.1
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• pp.74-96
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• 2002

The objectives of this study is to suggest the rectifying sampling inspection plan considering quality cost. Limiting quality level(LQL) plans(also called LTPD plans) and outgoing quality(OQ) plans are considered. The Hald's linear cost model is discussed with and without a beta prior for the distribution of the fraction of nonconforming items in a lot. It is assumed that the sampling inspection is error free. We consider the design of reliability acceptance sampling plan (RASP) for failure rate level qualification at selected confidence level. The lifetime distribution of products is assumed to be exponential. MIL-STD-690C and K C 6032 standards provide this procedures. But these procedures have some questions to apply in the field. The cost of test and confidence level(1-$\beta$ risk) are the problem between supplier and user. So, we suggest that the optimal life test sampling inspection plans using simple linear cost model considering product cost, capability of environment chamber, environmental test cost, and etc. Especially, we consider a reliability of lots that contain some nonconforming items. In this case we assumed that a nonconforming item fail after environmental life test. Finally, we develope the algorithm of the optimal sampling inspection plan based on minimum costs for rectifying inspection and RASP. And computer application programs are developed So, it is shown how the desired sampling plan can be easily found.

• Journal of Applied Reliability
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• v.7 no.2
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• pp.57-72
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• 2007

This paper suggests an approach for using ALTA 7 PRO to design accelerated life test plans. Conducting a accelerated life test requires finding life distributions at different stress levels and determining an appropriate life-stress relationship. Moreover, a test plan needs to be developed. In its optimal test plan, stress levels are determined and the proportions of test units are assigned at each stress level so that asymptotic variance of the maximum likelihood estimate of a (log) percentile of the life distribution at the design stress is minimized. Examples are presented for usage.

• Communications for Statistical Applications and Methods
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• v.5 no.1
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• pp.107-120
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• 1998

This research aims here to develop a certain extended double sampling plan, EDS, which is an extension of ordinary double sampling plan in the sense that the second-stage sampling effort and second-stage critical value are allowed to depend on the point at which the first-stage continuation region is traversed. For purpose of comparison, single sampling plan, optimal ordinary double sampling plan(ODS) and sequential probability ratio test are considered with the same overall error rates, respectively. It is observed that the EDS idea allows less sampling effort than the optimal ODS.

• Journal of Korean Institute of Industrial Engineers
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• v.17 no.1
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• pp.95-108
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• 1991

For the case where the lifetime at a constant stress level has exponential distribution, optimal accelerated life test plans are developed under the assumptions of intermittent inspection and Type I censoring. In a optimal plan, the low and high stress levels, the proportion of test units allocated and the inspection times at each stress are determined such that the asymptotic variance of the maximum likelihood estimator of logarithmic transformed mean at the use condition is minimized. In addition to the optimal plan in which numerical technique to solve the set of nonlinear equations must be employed to determine inspection times at each stress level, we also propose another plans which employ equally-spaced or equal probability inspection schemes at two overstress levels of corresponding optimal one. For both optimal and proposed plans, computational results indicate that the asymptotic variance of the estimated mean at the use stress is insensitive to number of inspections at overstress levels for the range of parameter values considered.

• Journal of Applied Reliability
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• v.18 no.2
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• pp.122-129
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• 2018

Purpose: This article develops an optimal reliability acceptance sampling plan for the case where the degradation quantity of the performance characteristic follows Weibull distribution. Method: For developing reliability acceptance sampling plans, the sample size and the acceptance constant are determined based on the accelerated characteristic of the test condition and the product. Results: The sample size and the acceptance constant are provided such that the constraints of the producer and the consumer risks are satisfied. Conclusion: Reliability acceptance sampling plans based on the accelerated degradation test method can be used for the quality control within a resonable amount of cost and time. In this article. an optimal reliability sampling plans are newly developed for this purpose.

• Journal of Korean Society for Quality Management
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• v.21 no.1
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• pp.108-120
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• 1993

In this article an economic life test sampling plan is considered for repairable products when the products in each lot have the same interfailure time distribution, but the mean time between failure (MTBF) of a lot varies from lot to lot according to a known prior distribution. A cost model is constructed which consists of test cost, accept cost, and reject cost. Determination of the optimal plan which minimizes the expected average cost per lot is discussed. Numerical examples are presented to illustrate the use of the proposed sampling plans and sensitivity analyses for parameters of the prior distribution are performed.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.271-280
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• 2015

In this paper, the maximum likelihood estimators for parameters are derived under three step-stress accelerated life tests for Type-I hybrid censored data. The exponential distribution and the cumulative exposure model are considered based on the assumption that a log quadratic relationship exits between stress and the mean lifetime ${\theta}$. The test plan to search optimal stress change times minimizing the asymptotic variance of maximum likelihood estimators are presented. A numerical example to illustrate the proposed inferential procedures and some simulation results to investigate the sensitivity of the optimal stress change times by the guessed parameters are given.