• Title/Summary/Keyword: memories

Search Result 896, Processing Time 0.025 seconds

Sex Differences in the memories for emotional stimuli (정서적 자극에 대한 기억에 있어서의 남녀 차이에 관한 연구)

  • 박수애;안진경
    • Science of Emotion and Sensibility
    • /
    • v.6 no.3
    • /
    • pp.29-43
    • /
    • 2003
  • This study examined the difference in memories for emotional stimuli. After giving participants the memory task instruction that they should remember the given stimuli, the emotion-induced photographs and the neutral photographs were presented. To minimize the possibility to regulate the expressions of their mood which induced by emotional stimuli and to find out whether the antecedent-focused emotion regulation process would damaged the memory of emotional stimuli in men, participant's memory was measured directly after the presentation of each photograph by free reflection method. Also Sex differences in memories about emotional and neutral stimuli were measured and compared. Women memorized stimuli more than men, and as expected, women remembered more about the emotional stimuli than neutral ones. The analysis of sex difference about central and peripheral features indicated that women remembered central features of emotional stimulus more than those of neutral ones, but that men had no difference between central features of emotional stimuli and those of neutral ones. These results showed that men's damaged memories of emotional stimuli were caused by the antecedent-focused emotion regulation process.

  • PDF

Adult Readers' Responses to Picturebooks Portraying Play (놀이를 소재로 한 그림책에 대한 성인 독자의 반응)

  • Hyun, Eunja;Lee, Jiun
    • The Journal of the Korea Contents Association
    • /
    • v.21 no.4
    • /
    • pp.603-614
    • /
    • 2021
  • The purpose of this study is to explore whether reading picturebooks portraying children's play assists adult readers to recall their childhood play memories according to the narrative model of human development. In this study, adult readers recalled their play memories before and after reading a picturebook depicting children's play. Adult readers' responses to the picturebooks were also collected. The types of play from their memories were categorized and the responses were qualitatively analyzed through open coding. The results indicated that first, before reading picturebooks portraying children's play, the type of play that adult readers mostly recalled was games with rules which happened outdoor. Second, after reading a picturebook, adult readers recalled new play memories which contained more detailed elements of narratives. Third, most adult readers responded to picturebooks either emotionally or aesthetically. This study suggests the perspective on picturebooks as a literature and art genre for readers from birth to death. In addition, as an evocative object, a picturebooks could assist adult readers to recall and rediscover their childhood.

The Content Analysis of the Earliest Memories and Dreams of Psychiatric Disorders (정신질환자(精神疾患者)의 최초기억(最初記憶)과 꿈의 내용분석(內容分析))

  • Park, Byung-Tak
    • Journal of Yeungnam Medical Science
    • /
    • v.1 no.1
    • /
    • pp.67-87
    • /
    • 1984
  • The earliest memories and dreams have been investigated in many aspects; biological, psychological, statistical, and psychotherapeutic, in psychiatric field. The approach methods to these psychic contents are innumerable according to the schools, the collector's attitudes to these materials, the collecting methods and the variable factors of the reporter. In this study the author attempted to compare the distribution of the aggression and dependency themes in these psychic contents among groups of different sexes and clinical diagnoses. In this purpose the author devised new scales, the Aggression and the Dependency Scales for the earliest memories and dreams which are composed of 12-theme classes, according to 3 aspects of the ego attitudes and 4 degrees of the intensity of drives. The scales were tested on a series of the earliest memories and dreams from 100 male medical students by two raters. The interrater reliabilities, measured by kappa method, were all significant at better than the .001 level. The author collected the reports of the earliest memories and dreams from 293 schizophrenics (161 males and 132 females) and 301 neurotics (164 males and 137 females) who were either outpatients or inpatients of 5 general hospitals and 2 private neurospychiatric clinics and from 310 controls (169 males and 141 females) who were either students, housewives or employees in Taegu area during the periods from March to August, 1980 and from April to August, 1983. The author compared the contents of the earliest memories and dreams from these 3 clinical groups on the newly devised scales and the results could be summarized as follows: In general, the contents of the earliest memories showed more differences among diagnostically different groups, while the contents of dreams showed more differences among sexually different groups. The dependency themes were more frequent than the aggression thems in all groups. The aggression themes were more frequent in dreams than in the earliest memories. Of the earliest memory themes, the distribution of the aggression themes was different among clinical groups, i.e., most frequent in schizophrenics, next in neurotics, and least in controls. The distribution of the dependency themes was in reverse order. Attitudes of being attacked were more frequent in schizophrenics. Observing attitudes of dependency need were more frequent in neurotics while gratifying attitudes were more frequent in controls. Highest degrees of aggression and delpendency were more frequent in neurotics. In the distribution of the dream themes, there were some differences among male and female schizophrenics. Aggression themes, especially active and the highest degree of aggression, were more frequent in male sclizophrenics, while dependency themes, especially frustrated themes, were more frequent in female schizophrenics. Among 3 clinical groups, observing attitudes of dependency need were more frequent in female groups, while gratifying attitudes were more frequent in male groups.

  • PDF

An Efficient Built-in Self-Test Algorithm for Neighborhood Pattern- and Bit-Line-Sensitive Faults in High-Density Memories

  • Kang, Dong-Chual;Park, Sung-Min;Cho, Sang-Bock
    • ETRI Journal
    • /
    • v.26 no.6
    • /
    • pp.520-534
    • /
    • 2004
  • As the density of memories increases, unwanted interference between cells and the coupling noise between bit-lines become significant, requiring parallel testing. Testing high-density memories for a high degree of fault coverage requires either a relatively large number of test vectors or a significant amount of additional test circuitry. This paper proposes a new tiling method and an efficient built-in self-test (BIST) algorithm for neighborhood pattern-sensitive faults (NPSFs) and new neighborhood bit-line sensitive faults (NBLSFs). Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a four-cell layout is utilized. This four-cell layout needs smaller test vectors, provides easier hardware implementation, and is more appropriate for both NPSFs and NBLSFs detection. A CMOS column decoder and the parallel comparator proposed by P. Mazumder are modified to implement the test procedure. Consequently, these reduce the number of transistors used for a BIST circuit. Also, we present algorithm properties such as the capability to detect stuck-at faults, transition faults, conventional pattern-sensitive faults, and neighborhood bit-line sensitive faults.

  • PDF

The Efficient Memory BISR Architecture using Sign Bits (Sign Bit을 사용한 고효율의 메모리 자체 수리 회로 구조)

  • Kang, Il-Kwon;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.44 no.12
    • /
    • pp.85-92
    • /
    • 2007
  • With the development of the memory design and process technology, the production of high-density memory has become a large scale industry. Since these memories require complicated designs and accurate manufacturing processes, It is possible to exist more defects. Therefore, in order to analyze the defects, repair them and fix the problems in the manufacturing process, memory repair using BISR(Built-In Self-Repair) circuit is recently focused. This paper presents an efficient memory BISR architecture that uses spare memories effectively. The proposed BISR architecture utilizes the additional storage space named 'sign bit' for the repair of memories. This shows the better performance compared with the previous works.

Ultrasound Synthetic Aperture Beamformer Architecture Based on the Simultaneous Multi-scanning Approach (동시 다중 주사 방식의 초음파 합성구경 빔포머 구조)

  • Lee, Yu-Hwa;Kim, Seung-Soo;Ahn, Young-Bok;Song, Tai-Kyong
    • Journal of Biomedical Engineering Research
    • /
    • v.28 no.6
    • /
    • pp.803-810
    • /
    • 2007
  • Although synthetic aperture focusing techniques can improve the spatial resolution of ultrasound imaging, they have not been employed in a commercial product because they require a real-time N-channel beamformer with a tremendously increased hardware complexity for simultaneous beamforming along M multiple lines. In this paper, a hardware-efficient beamformer architecture for synthetic aperture focusing is presented. In contrast to the straightforward design using NM delay calculators, the proposed method utilizes only M delay calculators by sharing the same values among the focusing delays which should be calculated at the same time between the N channels for all imaging points along the M scan lines. In general, synthetic aperture beamforming requires M 2-port memories. In the proposed beamformer, the input data for each channel is first upsampled with a 4-fold interpolator and each polyphase component of the interpolator output is stored into a 2-port memory separately, requiring 4M 2-port memories for each channel. By properly limiting the area formed with the synthetic aperture focusing, the input memory buffer can be implemented with only 4 2-port memories and one short multi-port memory.

An Analysis Region Virtualization Scheme for Built-in Redundancy Analysis Considering Faulty Spares (불량 예비셀을 고려한 자체 내장 수리연산을 위한 분석 영역 가상화 방법)

  • Jeong, Woo-Sik;Kang, Woo-Heon;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.47 no.12
    • /
    • pp.24-30
    • /
    • 2010
  • In recent memories, repair is an unavoidable method to maintain its yield and quality. The probability of defect occurence on spare lines has been increased through the growth of the density of recent memories with 2 dimensional spare architecture. In this paper, a new analysis region virtualization scheme is proposed. the analysis region virtualization scheme can be applied with any BIRA (built-in redundancy analysis) algorithms without the loss of their repair rates. The analysis region virtualization scheme can be a viable solution for BIRA considering the faulty spare lines of the future high density memories.

A design of BIST/BICS circuits for detection of fault and defect and their locations in VLSI memories (고집적 메모리의 고장 및 결함 위치검출 가능한 BIST/BICS 회로의 설계)

  • 김대익;배성환;전병실
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.22 no.10
    • /
    • pp.2123-2135
    • /
    • 1997
  • In this paepr, we consider resistive shorts on drain-source, drain-gate, and gate-source as well as opens in MOSFETs included in typical memory cell of VLSI SRAM. Behavior of memeory is observed by analyzing voltage at storage nodes of memeory and IDDQ(quiescent power supply current) through PSPICE simulation. Using this behavioral analysis, an effective testing algorithm of complexity O(N) which can be applied to both functional testing and IDDQ testing simultaeously is proposed. Built-In Self Test(BIST) circuit which detects faults in memories and Built-In Current Sensor(BICS) which monitors the power supply bus for abnormalities in quescent current are developed and imprlemented to improve the quality and efficiency of testing. Implemented BIST and BICS circuits can detect locations of faults and defects in order to repair faulty memories.

  • PDF

Integration Process and Reliability for $SrBi_2$ $Ta_2O_9$-based Ferroelectric Memories

  • Yang, B.;Lee, S.S.;Kang, Y.M.;Noh, K.H.;Hong, S.K.;Oh, S.H.;Kang, E.Y.;Lee, S.W.;Kim, J.G.;Shu, C.W.;Seong, J.W.;Lee, C.G.;Kang, N.S.;Park, Y.J.
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.1 no.3
    • /
    • pp.141-157
    • /
    • 2001
  • Highly reliable packaged 64kbit ferroelectric memories with $0.8{\;}\mu\textrm{m}$ CMOS ensuring ten-year retention and imprint at 125^{\circ}C$ have been successfully developed. These superior reliabilities have resulted from steady integration schemes free from the degradation, due to layer stress and attacks of process impurities. The resent results of research and development for ferroelectric memories at Hynix Semiconductor Inc. are summarized in this invited paper.

  • PDF

Automatic BIST Circuit Generator for Embedded Memories (내장 메모리 테스트를 위한 BIST 회로 자동생성기)

  • Yang, Sunwoong;Chang, Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.38 no.10
    • /
    • pp.746-753
    • /
    • 2001
  • GenBIST implemented in this paper is an automatic CAD tool, which can automatically generate circuitry in VerilogHDL code based on user defined information for the memory testing. While most commercial and conventional CAD tools adopt a method in which they make memory-testing algorithms as a library to generate circuitry, our tool can generate circuitry according to the user-defined algorithm, which makes application of various algorithms easier. In addition, memory BIST circuitry can be shared with other memories by supporting embedded memories in our tool. Also, extra pins for the memory testing are not requited when boundary scan technique is combined.

  • PDF