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The Efficient Memory BISR Architecture using Sign Bits  

Kang, Il-Kwon (Department of Electrical and Electronic Engineering, Yonsei University)
Kang, Sung-Ho (Department of Electrical and Electronic Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.44, no.12, 2007 , pp. 85-92 More about this Journal
Abstract
With the development of the memory design and process technology, the production of high-density memory has become a large scale industry. Since these memories require complicated designs and accurate manufacturing processes, It is possible to exist more defects. Therefore, in order to analyze the defects, repair them and fix the problems in the manufacturing process, memory repair using BISR(Built-In Self-Repair) circuit is recently focused. This paper presents an efficient memory BISR architecture that uses spare memories effectively. The proposed BISR architecture utilizes the additional storage space named 'sign bit' for the repair of memories. This shows the better performance compared with the previous works.
Keywords
memory repair; memory BISR; BIRA; self-repair;
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