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An Analysis Region Virtualization Scheme for Built-in Redundancy Analysis Considering Faulty Spares  

Jeong, Woo-Sik (Yonsie University)
Kang, Woo-Heon (Yonsie University)
Kang, Sung-Ho (Yonsie University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.47, no.12, 2010 , pp. 24-30 More about this Journal
Abstract
In recent memories, repair is an unavoidable method to maintain its yield and quality. The probability of defect occurence on spare lines has been increased through the growth of the density of recent memories with 2 dimensional spare architecture. In this paper, a new analysis region virtualization scheme is proposed. the analysis region virtualization scheme can be applied with any BIRA (built-in redundancy analysis) algorithms without the loss of their repair rates. The analysis region virtualization scheme can be a viable solution for BIRA considering the faulty spare lines of the future high density memories.
Keywords
메모리;자체내장 수리 연산회로;테스트;분석 영역 가상화;불량 예비 셀;
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