• Title/Summary/Keyword: low power test

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A Study on the Hot Spot Temperature in 154kV Power Transformers

  • Kweon, Dong-Jin;Koo, Kyo-Sun;Woo, Jung-Wook;Kwak, Joo-Sik
    • Journal of Electrical Engineering and Technology
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    • v.7 no.3
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    • pp.312-319
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    • 2012
  • The life of a power transformer is dependent on the life of the cellulose paper, which influenced by the hot spot temperature. Thus, the determination of the cellulose paper's life requires identifying the hot spot temperature of the transformer. Currently, however, the power transformer uses a heat run test is used in the factory test to measure top liquid temperature rise and average winding temperature rise, which is specified in its specification. The hot spot temperature is calculated by the winding resistance detected during the heat run test. This paper measures the hot spot temperature in the single-phase, 154kV, 15/20MVA power transformer by the optical fiber sensors and compares the value with the hot spot temperature calculated by the conventional heat run test in the factory test. To measure the hot spot temperature, ten optical fiber sensors were installed on both the high and low voltage winding; and the temperature distribution during the heat run test, three thermocouples were installed. The hot spot temperature shown in the heat run test was $92.6^{\circ}C$ on the low voltage winding. However, the hot spot temperature as measured by the optical fiber sensor appeared between turn 2 and turn 3 on the upper side of the low voltage winding, recording $105.9^{\circ}C$. The hot spot temperature of the low voltage winding as measured by the optical fiber sensor was $13.3^{\circ}C$ higher than the hot spot temperature calculated by the heat run test. Therefore, the hot spot factor (H) in IEC 60076-2 appeared to be 2.0.

A Twin Symbol Encoding Technique Based on Run-Length for Efficient Test Data Compression

  • Park, Jae-Seok;Kang, Sung-Ho
    • ETRI Journal
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    • v.33 no.1
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    • pp.140-143
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    • 2011
  • Recent test data compression techniques raise concerns regarding power dissipation and compression efficiency. This letter proposes a new test data compression scheme, twin symbol encoding, that supports block division skills that can reduce hardware overhead. Our experimental results show that the proposed technique achieves both a high compression ratio and low-power dissipation. Therefore, the proposed scheme is an attractive solution for efficient test data compression.

The Optimization Study on the Test Method of Remanufactured Power Steering Oil Pump by Using FMEA (FMEA를 활용한 재제조 파워스티어링 오일펌프 시험법에 대한 최적화 연구)

  • Seo, Youngkyo;Jung, Dohyun;Yu, Sangseok;Rha, Wanyong
    • Transactions of the Korean Society of Automotive Engineers
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    • v.24 no.1
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    • pp.90-98
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    • 2016
  • Currently government certified test method for an automobile remanufactured products is insufficient. Thus many automotive parts in the remanufacturing market are lacking proper evaluation criteria and production of defective products are causing customer dissatisfaction. In this paper a power steering oil pump, which requires stringent manufacturing standards, is studied by the failure mode and effect analysis approach. The research suggested that the test criteria such as discharge flow characteristic test, tightness test, pulley run-out test, pressure switch operation test, low temperature test and rotation pressure durability test should be performed to evaluate the reliability of remanufactured power steering oil pumps. As a result of tests, the performance of remanufactured power steering oil pump satisfied the evaluation criteria of pressure switch operation test and low temperature test. However, the remanufactured power steering oil pump failed to satisfy the evaluation criteria on discharge performance test, tightness test and pulley run-out test. These performance evaluation tests proved the necessity of standard process for the remanufactured power steering oil pump.

Efficient Test Data Compression and Low Power Scan Testing for System-On-a-Chip(SOC) (SOC(System-On-a-Chip)에 있어서 효율적인 테스트 데이터 압축 및 저전력 스캔 테스트)

  • Park Byoung-Soo;Jung Jun-Mo
    • The Journal of the Korea Contents Association
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    • v.5 no.1
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    • pp.229-236
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    • 2005
  • Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

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Gated Clock-based Low-Power Technique based on RTL Synthesis (RTL 수준에서의 합성을 이용한 Gated Clock 기반의 Low-Power 기법)

  • Seo, Young-Ho;Park, Sung-Ho;Choi, Hyun-Joon;Kim, Dong-Wook
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.12 no.3
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    • pp.555-562
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    • 2008
  • In this paper we proposed a practical low-power design technique using clock-gating in RTL. An efficient low-power methodology is that a high-level designer analyzes a generic system and designs a controller for clock-gating. Also the desirable flow is to derive clock-gating in normal synthesis process by synthesis tool than to insert directly gate to clock line. If low-power is considered in coding process, clock is gated in coding process. If not considered, after analyzing entire operation. clock is Bated in periods of holding data. After analyzing operation for clock-gating, a controller was designed for it, and then a low-power circuit was generated by synthesis tool. From result, we identified that the consumed power of register decreased from 922mW to 543mW, that is the decrease rate is 42%. In case of synthesizing the test circuit using synthesizer of Power Theater, it decreased from 322mW to 208mW (36.5% decrease).

Effects of Low Power Laser on Pain Response and Axonal Regeneration in Rat Models with Sciatic Nerve Crush Injury

  • Lee, Hong-Gyun;Kim, Yong-Eok;Min, Kyung-Ok;Yoo, Young-Dae;Kim, Kyung-Yoon;Kim, Gye-Yeop
    • Journal of International Academy of Physical Therapy Research
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    • v.3 no.1
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    • pp.345-355
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    • 2012
  • This study purposed to examine the effect of low power laser on pain response and axonal regeneration. In order to prepare peripheral nerve injury models, we crushed the sciatic nerve of Sprague-Dawley rats and treated them with low power laser for 21 days. The rats were divided into 4 groups: normal group(n=10); control group(n=10) without any treatment after the induction of sciatic nerve crush injury; experimental group I(n=10) treated with low power laser(0.21$mJ/mm^2$) after the induction of sciatic nerve crush injury; and experimental group II(n=10) treated with low power laser(5.25$mJ/mm^2$) after the induction of sciatic nerve crush injury. We measured spontaneous pain behavior(paw withdrawal latency test) and mechanical allodynia(von Frey filament test) for evaluating pain behavioral response, and measured the sciatic function index for evaluating the functional recovery of peripheral nerve before the induction of sciatic nerve crush injury and on day 1, 7, 14 and 21 after the induction. After the experiment was completed, changes in the H & E stain and toluidine blue stain were examined histopathologically, and changes in MAG(myelin associated glycoprotein) and c-fos were examined immunohistologically. According to the results of this study, when low power laser was applied to rat models with sciatic nerve crush injury for 21 days and the results were examined through pain behavior evaluation and neurobehavioral, histopathological and immunohistological analyses, low power laser was found to affect pain response and axonal regeneration in both experimental group I and experimental group II. Moreover, the effect on pain response and axonal regeneration was more positive in experimental group I to which output 0.21$mJ/mm^2$ was applied than in experimental group II to which 5.25$mJ/mm^2$ was applied.

Winding Temperature Measurement in a 154 kV Transformer Filled with Natural Ester Fluid

  • Kweon, Dongjin;Koo, Kyosun
    • Journal of Electrical Engineering and Technology
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    • v.8 no.1
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    • pp.156-162
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    • 2013
  • This paper measures the hot spot temperatures in a single-phase, 154 kV, 15/20 MVA power transformer filled with natural ester fluid using optical fiber sensors and compares them with those calculated by conventional heat run tests. A total of 14 optical fiber sensors were installed on the high-voltage and low-voltage windings to measure the hot spot temperatures. In addition, three thermocouples were installed in the transformer to measure the temperature distribution during the heat run tests. In the low-voltage winding, the hot spot temperature was $108.4^{\circ}C$, calculated by the conventional heat run test. However, the hot spot temperature measured using the optical fiber sensor was $129.4^{\circ}C$ between turns 2 and 3 on the upper side of the low-voltage winding. Therefore, the hot spot temperature of the low-voltage winding measured using the optical fiber sensor was $21.0^{\circ}C$ higher than that calculated by the conventional heat run test.

Compression-Friendly Low Power Test Application Based on Scan Slices Reusing

  • Wang, Weizheng;Wang, JinCheng;Cai, Shuo;Su, Wei;Xiang, Lingyun
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.4
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    • pp.463-469
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    • 2016
  • This paper presents a compression-friendly low power test scheme in EDT environment. The proposed approach exploits scan slices reusing to reduce the switching activity during shifting for test scheme based on linear decompressor. To avoid the impact on encoding efficiency from resulting control data, a counter is utilized to generate control signals. Experimental results obtained for some larger ISCAS'89 and ITC'99 benchmark circuits illustrate that the proposed test application scheme can improve significantly the encoding efficiency of linear decompressor.

Low Power Scan Testing and Test Data Compression for System-On-a-Chip (System-On-a-Chip(SOC)에 대한 효율적인 테스트 데이터 압축 및 저전력 스캔 테스트)

  • 정준모;정정화
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.39 no.12
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    • pp.1045-1054
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    • 2002
  • We present a new low power scan testing and test data compression mothod lot System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low Power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full - scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

Study of Selection Plan of Circuit breakers, Cables and Modeling of Korean Low Voltage Electrical Installation integration Test Site based on IEC 60364 (IEC 60364 기반의 한국형 저압전기설비 통합 실증단지 모델링 및 차단기와 케이블의 선정 방안 고찰)

  • Kim, Doo-Ung;Ryu, Kyu-Sang;Kim, Han-Soo;Shin, Dae-Sung;Ryu, Ki-Hwan;Kim, Chul-Hwan
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.29 no.9
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    • pp.59-64
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    • 2015
  • IEC is an international standards which are used in many countries with Europe as the center. IEC standard is introduced in Korea according to WTO/TBT agreements, however until now there are no buildings in Korea which are designed applying IEC standard. Therefore, KEA(Korea Electric Association) is scheduled to construct Korean low voltage electrical installation integration test site which is designed applying IEC standard. In this paper, before being under construction of Korean low voltage electrical installation integration test site, power substation is modeled based on real design parameters and method to select circuit breakers and cables is presented applying IEC standard in the modeled power substation. EMTP(ElctroMagnetic Transient Program) is used for simulation program. EMTP which is power system analysis program is easy to model power system and power substation.