• 전자공학회논문지C
• /
• 제34C권4호
• /
• pp.16-25
• /
• 1997

This paper shows a SDRAM opeating in 200MHz clock cycle which it use data interleave and pipelining for high speed operation. We proposed NdC (Negative DEaly circuit) to improve clock to access time(tAC) characteristics, also we proposed low power WL(wordline)driver circit and high efficiency VPP charge-pump circit. Our all circuits has been fabricated using 0.4um CMOS process, and the measured maximum speed is 200Mbytes/s in LvTTL interface.

• 전력전자학회:학술대회논문집
• /
• 전력전자학회 2000년도 전력전자학술대회 논문집
• /
• pp.543-547
• /
• 2000

Power factor and harmonics are increasingly important for high speed train auxiliary block. This paper presents experimental results of the power factor and harmonic performance of two parallel PWM circuits under various supply and load conditions. For reducing harmonics the harmonic content is eliminated by the phase shift between two converters switching phase. Experimental results show the usefulness of the proposed method and applicability to PWM converter in auxiliary block of high speed train.

• 전력전자학회:학술대회논문집
• /
• 전력전자학회 2000년도 전력전자학술대회 논문집
• /
• pp.274-277
• /
• 2000

Power factor and harmonics are increasingly important for high speed train auxiliary block. This paper presents experimental results of the power factor and harmonic performance of four parallel PWM converter circuits under various supply and load conditions. For reducing harmonics the harmonic content is eliminated by the phase shift between four converters switching phase. Experimental results show the usefulness of the proposed method and applicability to PWM converter in auxiliary block of high speed train.

• 전자공학회논문지C
• /
• 제35C권4호
• /
• pp.30-37
• /
• 1998

In this paper, we propose a test generation method for large scale sequential circuits based on circuit partitioning to increase the size of circuits that the implicit product machine traversal (IPMT) method can handle. Our method paratitions a circuit under test into subset circuits with only single output, and performs a partial scan design using the state transtition cost that represents a degree of the connectivity of the subset circuit. The IPMT method is applied to the partitioned partial scan circuits in test generation. Experimental results for ISCAS89 benchmark circuits with more thatn 50 flip-flops show that our method has generated test patterns with almost 100% fault coverage at high speed by use of 34%-73% scanned flip-flops.

• 대한전자공학회:학술대회논문집
• /
• 대한전자공학회 2002년도 ITC-CSCC -2
• /
• pp.1280-1283
• /
• 2002

This paper discusses issues in VLSI design and implementation of high performance datapath circuits. Of particular concern will he various types of multiplier and adder, which are fundamental to DSP operations. Performance comparison will be provided in terms of sampling speed, layout area, and in particular, power consumption, with techniques that may be applied to reduce power dissipation also suggested. As an example, a low power, high performance recursive filter achieved through bit-level pipelining technique is illustrated

• 대한전자공학회:학술대회논문집
• /
• 대한전자공학회 2000년도 ITC-CSCC -1
• /
• pp.195-198
• /
• 2000

It is possible to perform the digital fuzzy logical high-speed and high-precision computation by the use of redundantly-represented binary positive-digit number arithmetic operation. In this paper, as basic operation circuits in the fuzzy logic new voltage-mode 4-valued binary parallel processing operation circuits using positive redundantly-expressed binary-coded numbers is discussed.

• 전자공학회논문지B
• /
• 제33B권3호
• /
• pp.47-55
• /
• 1996

An optical transmitter, which is a key component of the optical transmission system, converts the electrical signal to optical signal and consists of a high-speed current-pulse driver for laser diode and low-speed feedback loops that stabilize optical power against aging, power supply voltage fluctuations, and ambient temperature changes. In this paper, the power-stabilizing part, which forms the bulk of the optical transmitter circuitry was designed in integrted circuits. Operational amplifiers and reference voltage generation circuits, which were identified as key building blocks for the power-stabilizing feedback loops, were designed and were subsequently verified through HSPICE simulations. The designed operational amplifier consists of a two-stage folded cascode amplifier and class AB output stage, whereas the reference voltage is obtained by bandgap reference circuits. Finally the power-stabilizing circuitry was laid out based on 3\mu$m CMOS design rules for fabrication.

• Progress in Superconductivity
• /
• 제9권2호
• /
• pp.157-161
• /
• 2008

Due to high speed operations and ultra low power consumptions RSFQ logic circuit is a very good candidate for future electronic device. The focus of the RSFQ circuit development has been on the advancement of analog-to-digital converters and microprocessors. Recent works on RSFQ ALU development showed the successful operation of an 1-bit block of ALU at 40 GHz. Recently, the study of an RSFQ analog-to-digital converter has been extended to the development of a single chip RF digital receiver. Compared to the voltage logic circuits, RSFQ circuits operate based on the pulse logic. This naturally leads the circuit structure of RSFQ circuit to be pipelined. Delay time on each pipelined stage determines the ultimate operating speed of the circuit. In simulations, a two junction Josephson transmission line's delay time was about 10 ps, a splitter's 14.5 ps, a switch's 13 ps, a half adder's 67 ps. Optimization of the 4-bit ALU circuit has been made with delay time consideration to operate comfortably at 10 GHz or above.

• 대한전자공학회:학술대회논문집
• /
• 대한전자공학회 2000년도 ITC-CSCC -1
• /
• pp.359-362
• /
• 2000

In this paper, we propose a test pattern generation algorithm on the basis of the identification of undetectable faults for Speed-Independent(SI) asynchronous control circuits. The proposed methodology generates tests from the specification of a target circuit, which describes the behavior of the circuit in the form of Signal Transition Graph (STG). The proposed identification method uses only topological information of a target circuit and reachability information of a fault-free circuit, which is generated in the form of Binary Decision Diagram(BDD) during pre-processing. Experimental results show that high fault coverage over single input stuck-at fault model is obtained for several synthesized SI circuits and the use of the identification process as a preprocessing decreases execution time of the proposed test generation with negligible costs.

• 한국정보통신학회논문지
• /
• 제2권2호
• /
• pp.267-273
• /
• 1998

본 논문에서는 charge pump 회로를 차동 전류 스위치 구조를 갖는 회로를 사용하여 설계하였다. charge pump 회로의 스위칭 속도를 향상시키기 위하여 CMOS 보다 스위칭 속도가 빠른 MESFET를 이용하여 회로를 설계하였다. 차동 전류 스위치 구조의 charge pump회로가 고주파수 대역에서 동작하는데 따른 회로의 성능 및 안정성 문제를 제시하고 분석하였다. 또한 charge pump 회로의 성능을 평가하기 위한 척도를 세부적으로 정의함으로써 charge pump의 성능을 표현하게 된다. 설계된 회로는 HSPICE 시뮬레이터를 사용하여 시뮬레이션 하였으며, 시뮬레이션 결과 본 논문에서 제시한 구조가 1GHz급의 charge pump 회로로 설계가 가능하다는 것을 알 수 있었다.