• 치과방사선
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• 제22권1호
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• pp.128-136
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• 1992

This study was undertakened to investigate the change of image characteristics on dental films according to the process of using time of processing solution in automatic processor. Base + fog density, film density and subject contrast were measured with the digital densitometer, the pH of developing and fixing solution were measured with Digital pH / ION Meter. The following results were obtained: 1. Base + fog density was increased with the process of using time of the processing solution and was over the maximum permissible base + fog density 0.25 from the 3rd day. 2. Film density was increased with the process of using time of the processing solution. 3. Subject contrast was decreased with the process of using time of the processing solution. 4. The pH of the developing solution was decreased with the process of using time, the pH of the fixing solution was increased.

• Journal of the Optical Society of Korea
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• 제14권4호
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• pp.321-325
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• 2010

We analyze the current density - voltage (J - V) curve of a Cu(In,Ga)$Se_2$ (CIGS) thin-film solar cell measured at different irradiation power densities. For the solar-cell sample investigated in this study, the fill factor and power conversion efficiency decreased as the irradiation power density (IPD) increased in the range of 2 to 5 sun. Characteristic parameters of solar cell including the series resistance ($r_s$), the shunt resistance ($r_{sh}$), the photocurrent density ($J_L$), the saturation current density ($J_s$) of an ideal diode, and the coefficient ($C_s$) of the diode current due to electron-hole recombination via ionized traps at the p-n interface are determined from a theoretical fit to the experimental data of the J - V curve using a two-diode model. As IPD increased, both $r_s$ and $r_{sh}$ decreased, but $C_s$ increased.

• 한국재료학회지
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• 제29권12호
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• pp.764-773
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• 2019

The gas response characteristic toward C₂H₅OH has been demonstrated in terms of copper-vacancy concentration, hole density, and microstructural factors for undoped/Li(I)-doped CuO thin films prepared by sol-gel method. For the films, both concentrations of intrinsic copper vacancies and electronic holes decrease with increasing calcination temperature from 400 to 500 to 600 ℃. Li(I) doping into CuO leads to the reduction of copper-vacancy concentration and the enhancement of hole density. The increase of calcination temperature or Li(I) doping concentration in the film increases both optical band gap energy and Cu2p binding energy, which are characterized by UV-vis-NIR and X-ray photoelectron spectroscopy, respectively. The overall hole density of the film is determined by the offset effect of intrinsic and extrinsic hole densities, which depend on the calcination temperature and the Li(I) doping amount, respectively. The apparent resistance of the film is determined by the concentration of the structural defects such as copper vacancies, Li(I) dopants, and grain boundaries, as well as by the hole density. As a result, it is found that the gas response value of the film sensor is directly proportional to the apparent sensor resistance.

• 대한수학회지
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• 제47권5호
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• pp.967-983
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• 2010

Let M be an n-dimensional complete simply connected Riemannian manifold with sectional curvature bounded above by a nonpositive constant $-{\kappa}^2$. Using the cone total curvature TC($\Gamma$) of a graph $\Gamma$ which was introduced by Gulliver and Yamada [8], we prove that the density at any point of a soap film-like surface $\Sigma$ spanning a graph $\Gamma\;\subset\;M$ is less than or equal to $\frac{1}{2\pi}\{TC(\Gamma)-{\kappa}^2Area(p{\times}\Gamma)\}$. From this density estimate we obtain the regularity theorems for soap film-like surfaces spanning graphs with small total curvature. In particular, when n = 3, this density estimate implies that if $TC(\Gamma)$ < $3.649{\pi}\;+\;{\kappa}^2\inf\limits_{p{\in}F}Area(p{\times}{\Gamma})$, then the only possible singularities of a piecewise smooth (M, 0, $\delta$)-minimizing set $\Sigma$ are the Y-singularity cone. In a manifold with sectional curvature bounded above by $b^2$ and diameter bounded by $\pi$/b, we obtain similar results for any soap film-like surfaces spanning a graph with the corresponding bound on cone total curvature.

• 한국표면공학회지
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• 제44권4호
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• pp.137-143
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• 2011

The internal stress and magnetic properties (coercivity and squareness) of Ni-Fe nano thin film synthesized by electrodeposition method were studied as a function of acidic chloride bath conditions (composition and temperature) and current density. Fe deposition patterns were different depending on the temperature of the solution, the stress of film decreased with increasing the solution temperature, and the depending on the amount of Fe deposition showed a parabolic shape. The grain size of film was inversely proportional to stress of thin film. The internal stress of thin film and magnetic properties were deeply relevant, and the stress of thin film had a relationship with bath conditions and grain size of the thin film surface.

• 한국정보통신학회논문지
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• 제6권5호
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• pp.696-702
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• 2002

RF magnetron reactive sputtering 법으로 BST(Bal-xSrxTiO$_3$)(50/50) 박막을 제작하여, 박막의 결정화 특성 및 표면상태와 함께 박막의 두께에 따른 전기적 특성을 조사하였다. XRD와 AFM을 이용하여 BST 박막의 결정화 특성과 표면상태를 관찰한 결과, 80$0^{\circ}C$ 에서 2분간 후열처리한 박막은 완전한 perovskite 구조를 가지며 표면거칠기도 16.1$\AA$으로 양호한 값을 나타내었다. 박막의 두께가 80nm에서 240nm으로 증가함에 따라 10KHz에서 비유전률은 199에서 265로 증가하였고, 250㎸/cm의 전기장에서 누설 전류밀도는 $0.779 {\mu}m/{cm^2}에서 0.184 {\mu}A/{cm^2}$으로 감소하였다. 두께 240nm인 BST 박막의 경우, 5V에서의 전하축적 밀도와 누설전류밀도는 각각 50.5 $fC/{{\mu}m^2} 와 0.182 {\mu}A/{cm^2}$로, 이는 DRAM의 캐패시터 절연막 응용에 매우 유망한 물질임을 나타내는 결과이다.

• 한국재료학회지
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• 제29권3호
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• pp.175-182
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• 2019

This study examines paraelectric $Bi_{1.5}Zn_{1.0}Nb_{1.5}O_7$ (BZN), which has no hysteresis and high dielectric strength, for energy density capacitor applications. To increase the breakdown dielectric strength of the BZN film further, poly(vinylidene fluoride) BZN-PVDF composite film is fabricated by aerosol deposition. The volume ratio of each composition is calculated using dielectric constant of each composition, and we find that it was 12:88 vol% (BZN:PVDF). To modulate the structure and dielectric properties of the ferroelectric polymer PVDF, the composite film is heat-treated at $200^{\circ}C$ for 5 and 30 minutes following quenching. The amount of ${\alpha}-phase$ in the PVDF increases with an increasing annealing time, which in turn decreases the dielectric constant and dielectric loss. The breakdown dielectric strength of the BZN film increases by mixing PVDF. However, the breakdown field decreases with an increasing annealing time. The BZN-PVDF composite film has the energy density of $4.9J/cm^3$, which is larger than that of the pure BZN film of $3.6J/cm^3$.

• 유변학
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• 제10권4호
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• pp.256-258
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• 1998

선형저밀도폴리에틸렌(LLDPE)의 필름 제조시 가공성 및 필름의 투명성을 개선하기 위한 실험을 하였다. LLDPE에 전자선을 조사하여 분자구조를 변형시켜줌으로써 가공 특성 및 광학적 특성이 향상된 필름을 얻을 수 있었다. 전자선 조사량의 세기를 조절하여 일정량만 조사하고 자외선 안정제를 소량 처방하면 필름 가공시 젤이 생기지 않았고 투명성 및 가공성이 개선되었다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1992년도 하계학술대회 논문집 B
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• pp.820-824
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• 1992

An accurate method for extracting both Si film doping concentration and front or back silicon-to-oxide fixed charge density of fully depleted SOI devices is proposed. The method utilizes the current-to-voltage and capacitance-to-voltage characteristics of both SOI NMOSFET and PMOSFET which have the same doping concentration. The Si film doping concentration and the front or back silicon-to-oxide fixed charge density are extracted by mainpulating the respective threshold voltages of the SOI NMOSFET and PMOSFET according to the back surface condition (accumulation or inversion) and the capacitance-to-voltage characteristics of the SOI PMOSFET. Device simulations show that the proposed method has less than 10% errors for wide variations of the film doping concentration and the front or the back silicon-to-oxide fixed charge density.

• Journal of Electrical Engineering and Technology
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• 제11권2호
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• pp.455-462
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• 2016

The electron transport coefficients in not only pure atoms and molecules but also in the binary gas mixtures are necessary, especially on understanding quantitatively plasma phenomena and ionized gases. Electron transport coefficients (electron drift velocity, density-normalized longitudinal diffusion coefficient, and density-normalized effective ionization coefficient) in binary mixtures of TEOS gas with buffer gases such as Kr, Xe, He, and Ne gases, therefore, was analyzed and calculated by a two-term approximation of the Boltzmann equation in the E/N range (ratio of the electric field E to the neutral number density N) of 0.1 - 1000 Td (1 Td = 10⁻¹⁷ V.cm²). These binary gas mixtures can be considered to use as the silicon sources in many industrial applications depending on mixture ratio and particular application of gas, especially on plasma assisted thin-film deposition.