• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.4
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• pp.221-228
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• 2007

In this paper, we propose a new symbolic simulation for scan chain diagnosis to solve the diagnosis resolution problem. The proposed scan chain fault simulation, called the SF-simulation, is able to analyze the effects caused by faulty scan cells in good scan chains. A new scan chain fault simulation is performed with a modified logic ATPG pattern. In this simulation, we consider the effect of errors caused by scan shifting in the faulty scan chain. Therefore, for scan chain diagnosis, we use the faulty information in good scan chains which are not contaminated by the faults while unloading scan out responses. The SF-simulation can tighten the size of the candidate list and achieve a high diagnosis resolution by analyzing fault effects of good scan chains, which are ignored by most previous works. Experimental results demonstrate the effectiveness of the proposed method.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.6 s.348
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• pp.30-37
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• 2006

This paper presents a modified scan cell architecture to reduce the power dissipation during testing. It not only eliminates switching activities in the combinational logic during scan shifting but also reduces switching activities in the scan chain during the time. Furthermore, it limits the transitions on capture cycles. It can be made for test-per-scan BIST and employed in both single scan style and multiple scan style. Experimental results demonstrate that the proposed structure achieves the same fault coverage with lower power consumption compared to other existing BIST schemes.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.5
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• pp.1-8
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• 2009

Since scan based testing is very efficient and widely used for testing large sequential circuits. However, since test patterns are serially injected through long scan chains, scan based testing requires very long test application time. Also, compared to the normal operations, scan shifting operations drastically increase power consumption. In order to solve these problems, this paper presents a new scan architecture for both test application time and test power reduction. The proposed scan architecture partitions scan chains into several segments and bypasses some segments which do not include any specified bit. Since bypassed segments are excluded from the scan shifting operation, the test application time and test power can be significantly reduced.

• Investigative Magnetic Resonance Imaging
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• v.19 no.4
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• pp.212-217
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• 2015

Purpose: For a single time-point hyperpolarized $^{13}C$ magnetic resonance spectroscopy imaging (MRSI) of animal models, scan-time window after injecting substrates is critical in terms of signal-to-noise ratio (SNR) of downstream metabolites. Pre-scans of time-resolved magnetic resonance spectroscopy (MRS) can be performed to determine the scan-time window. In this study, based on two-site exchange model, protocol-specific simulation approaches were developed for $^{13}C$ MRSI and the optimal scan-time window was determined to maximize the SNR of downstream metabolites. Materials and Methods: The arterial input function and conversion rate constant from injected substrates (pyruvate) to downstream metabolite (lactate) were precalibrated, based on pre-scans of time-resolved MRS. MRSI was simulated using two-site exchange model with considerations of scan parameters of MRSI. Optimal scan-time window for mapping lactate was chosen from simulated lactate intensity maps. The performance was validated by multiple in vivo experiments of BALB/C nude mice with MDA-MB-231 breast tumor cells. As a comparison, MRSI were performed with other scan-time windows simply chosen from the lactate signal intensities of pre-scan time-resolved MRS. Results: The optimal scan timing for our animal models was determined by simulation, and was found to be 15 s after injection of the pyruvate. Compared to the simple approach, we observed that the lactate peak signal to noise ratio (PSNR) was increased by 230%. Conclusion: Optimal scan timing to measure downstream metabolites using hyperpolarized $^{13}C$ MRSI can be determined by the proposed protocol-specific simulation approaches.

• ETRI Journal
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• v.30 no.3
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• pp.412-420
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• 2008

A new scan partition architecture to reduce both the average and peak power dissipation during scan testing is proposed for low-power embedded systems. In scan-based testing, due to the extremely high switching activity during the scan shift operation, the power consumption increases considerably. In addition, the reduced correlation between consecutive test patterns may increase the power consumed during the capture cycle. In the proposed architecture, only a subset of scan cells is loaded with test stimulus and captured with test responses by freezing the remaining scan cells according to the spectrum of unspecified bits in the test cubes. To optimize the proposed process, a novel graph-based heuristic to partition the scan chain into several segments and a technique to increase the number of don't cares in the given test set have been developed. Experimental results on large ISCAS89 benchmark circuits show that the proposed technique, compared to the traditional full scan scheme, can reduce both the average switching activities and the average peak switching activities by 92.37% and 41.21%, respectively.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.43 no.6 s.312
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• pp.105-112
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• 2006

To improve the performance of identification for radars in an ES(Electronic warfare Support) system, it is necessary to estimate scan characteristics as well as the basic identification parameters such as frequency, pulse repetition interval and pulse width of radars. This paper presents the method of estimating the scan period and the scan beam width of circular scanning radars. The proposed method estimates the scan period using the quality of the autocorrelation of a periodic signal. And, it estimates the scan beam width using the linear interpolation and the proposed method of estimating the scan period. Simulation results are presented to show the performance of the proposed method.

• Proceedings of the KIEE Conference
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• 1992.07b
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• pp.1250-1254
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• 1992

This paper describes the designed and fabricated thermal imaging system with the SPRITE(Signal PRocessing in The Element) detector, operating in the 3-12 micron band. This system consists of an afocal telescope, a scan unit containing the SPRITE detector, an electronic processor unit and a cooler. The optical scan system utilizing rotating polygon and oscillating mirror, is 2-dimensional serial/parallel scan type using five elements of the detector. And the electronic processor unit performs digital scan conversion to reform the parallel data stream into serial analog data compatable with conventional RS-170 video. The scan field of view is 40 ${\times}$ 26.7 and the MRTD(Minium Resolvable Temperature Difference) is 0.6 K at 7.5 cycles/mm. The acquired thermal image indicates that this system has a satisfactory performance.

• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.1565-1567
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• 2004

Various defects are found in FPD (Flat Panel Display) manufacturing process. So detecting these defects early and reprocessing them is an important factor that reduces the cost of production. In this paper, the bare glass inspection system for the FPD which is the early process inspection system in the FPD manufacturing process is designed and implemented using the high performance and accuracy CCD line scan camera. For the preprocessing of the high speed line image data, the Image Processing Part (IPP) is designed and implemented using high performance DSP (Digital signal Processor), FIFO (First in First out), FPGA (Field Programmable Gate Array) and the Data Management and System Control part are implemented using ARM (Advanced RISC Machine) processor to control many IPP and cameras and to provide remote users with processed data. For evaluating implemented system, experiment environment which has an area camera for reviewing and moving shelf is made.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.1
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• pp.49-56
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• 1994

This paper describes the design principles and methods of electronic processor for thermal imager with the SPRITE detector, operating in the 8-12 micron band. The thermal imager consists of a optical scanner containing the detector and an electrical signal processor. The optical scanner utilizing rotating polygon and oscillating mirror, is 2-dimensional serial/parallel scan type using 5 elements of the detector. And the electronic processor has pre-processing of 5 chnanel's thermal signal from the detector, and performs digital scan conversion to reform the parallel data stream into serial analog data compatible with conventional RS-170 video. Through the designed electronic processor, we have acquired a satisfactory thermal image. And the MRTD (Minimum Resolvable Temperature Difference) is 0.5$^{\circ}$K at 7.5 cycles/mm.

• Proceedings of the KOSOMBE Conference
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• v.1996 no.11
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• pp.157-160
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• 1996

In this paper, reconstruction algorithms of spiral scan imaging which has been used for ultra fast magnetic resonance imaging have been reviewed, and some simulation results using two different algorithms are reported. Since the trajectory of the spiral scan in k-space is the spiral, reconstruction of the spiral scan is not as straight forward as that used in Fourier imaging technique where the sampling points are usually on the rectangular grids. Originally the reconstruction of the spiral scan imaging was based on the convolution backprojection algorithm modified with a shift term, however, some other reconstruction techniques have also been tried by remapping sampling points from spiral trajectory to Cartesian grids. Some experimental aspects of MR spiral scan imaging will also be addressed.